{"id":"https://openalex.org/W2169213530","doi":"https://doi.org/10.1109/dsn.2002.1028924","title":"Modeling the effect of technology trends on the soft error rate of combinational logic","display_name":"Modeling the effect of technology trends on the soft error rate of combinational logic","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2169213530","doi":"https://doi.org/10.1109/dsn.2002.1028924","mag":"2169213530"},"language":"en","primary_location":{"id":"doi:10.1109/dsn.2002.1028924","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsn.2002.1028924","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings International Conference on Dependable Systems and Networks","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084331444","display_name":"Premkishore Shivakumar","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"P. Shivakumar","raw_affiliation_strings":["Department of Computer Sciences, University of Texas, Austin, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Sciences, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011135406","display_name":"Michael Kistler","orcid":"https://orcid.org/0000-0002-1273-9473"},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]},{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Kistler","raw_affiliation_strings":["Department of Computer Sciences, University of Texas, Austin, Austin, TX, USA","IBM Austin Research Laboratory, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Sciences, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"IBM Austin Research Laboratory, Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063354509","display_name":"Stephen W. Keckler","orcid":"https://orcid.org/0000-0001-6701-6099"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.W. Keckler","raw_affiliation_strings":["Department of Computer Sciences, University of Texas, Austin, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Sciences, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067337700","display_name":"Doug Burger","orcid":"https://orcid.org/0009-0006-6588-6596"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Burger","raw_affiliation_strings":["Department of Computer Sciences, University of Texas, Austin, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Sciences, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048612724","display_name":"Lorenzo Alvisi","orcid":"https://orcid.org/0000-0002-9857-5528"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. Alvisi","raw_affiliation_strings":["Department of Computer Sciences, University of Texas, Austin, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Sciences, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5084331444"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":92.7829,"has_fulltext":false,"cited_by_count":1440,"citation_normalized_percentile":{"value":0.99988445,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"389","last_page":"398"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7222900390625},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6548968553543091},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6429510712623596},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.5655977725982666},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.556384265422821},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.4986298084259033},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.48696646094322205},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4851985275745392},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4829963445663452},{"id":"https://openalex.org/keywords/logic-level","display_name":"Logic level","score":0.4713648855686188},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.46423831582069397},{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.45170509815216064},{"id":"https://openalex.org/keywords/pass-transistor-logic","display_name":"Pass transistor logic","score":0.446128249168396},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3166050910949707},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.29407358169555664},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20095905661582947},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1944034993648529},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.19165366888046265}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7222900390625},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6548968553543091},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6429510712623596},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.5655977725982666},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.556384265422821},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.4986298084259033},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.48696646094322205},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4851985275745392},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4829963445663452},{"id":"https://openalex.org/C146569638","wikidata":"https://www.wikidata.org/wiki/Q173378","display_name":"Logic level","level":3,"score":0.4713648855686188},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.46423831582069397},{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.45170509815216064},{"id":"https://openalex.org/C198521697","wikidata":"https://www.wikidata.org/wiki/Q7142438","display_name":"Pass transistor logic","level":4,"score":0.446128249168396},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3166050910949707},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.29407358169555664},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20095905661582947},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1944034993648529},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.19165366888046265},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/dsn.2002.1028924","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsn.2002.1028924","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings International Conference on Dependable Systems and Networks","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.118.5976","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.118.5976","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.utexas.edu/~skeckler/pubs/IBM_CAS02_ser.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.13.6833","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.13.6833","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.utexas.edu/users/cart/publications/dsn02_dist.ps","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.18.9885","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.18.9885","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://researchweb.watson.ibm.com/arl/projects/papers/serlogic.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5400000214576721,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W63944998","https://openalex.org/W1497430048","https://openalex.org/W1864485850","https://openalex.org/W1935014183","https://openalex.org/W1960026154","https://openalex.org/W1975157752","https://openalex.org/W1979668030","https://openalex.org/W2015521278","https://openalex.org/W2044444099","https://openalex.org/W2045499025","https://openalex.org/W2080930200","https://openalex.org/W2102480715","https://openalex.org/W2113592030","https://openalex.org/W2113626924","https://openalex.org/W2121395914","https://openalex.org/W2138351227","https://openalex.org/W2139416948","https://openalex.org/W2142358791","https://openalex.org/W2144371588","https://openalex.org/W2148954455","https://openalex.org/W2151845324","https://openalex.org/W2153448314","https://openalex.org/W2155859962","https://openalex.org/W2163671548","https://openalex.org/W2171825402","https://openalex.org/W2213956287","https://openalex.org/W3045060485","https://openalex.org/W4230988763","https://openalex.org/W4237420654","https://openalex.org/W4248445118","https://openalex.org/W6602613798","https://openalex.org/W6629596415","https://openalex.org/W6640961583"],"related_works":["https://openalex.org/W2531550288","https://openalex.org/W2149041233","https://openalex.org/W2171347834","https://openalex.org/W2152533674","https://openalex.org/W2985303806","https://openalex.org/W1973099952","https://openalex.org/W2166506797","https://openalex.org/W3080459857","https://openalex.org/W2089292011","https://openalex.org/W2006855068"],"abstract_inverted_index":{"This":[0],"paper":[1],"examines":[2],"the":[3,12,35,49,70,106,131,148],"effect":[4],"of":[5,14,51,110,117,135,150],"technology":[6],"scaling":[7],"and":[8,20,25,42,58,80,92,123],"microarchitectural":[9],"trends":[10],"on":[11],"rate":[13],"soft":[15,36,63,151],"errors":[16,64,152],"in":[17,65,76,153],"CMOS":[18],"memory":[19,137],"logic":[21,81,111,154],"circuits.":[22],"We":[23,68],"describe":[24],"validate":[26],"an":[27],"end-to-end":[28],"model":[29,47,103],"that":[30,105,125,142],"enables":[31],"us":[32],"to":[33,73,89,97,121,130],"compute":[34],"error":[37],"rates":[38],"(SER)":[39],"for":[40,83,156],"existing":[41],"future":[43,157],"microprocessor-style":[44],"designs.":[45,158],"The":[46],"captures":[48],"effects":[50],"two":[52],"important":[53],"masking":[54,57],"phenomena,":[55],"electrical":[56],"latching-window":[59],"masking,":[60],"which":[61],"inhibit":[62],"combinational":[66],"logic.":[67],"quantify":[69],"SER":[71,107,132],"due":[72],"high-energy":[74],"neutrons":[75],"SRAM":[77],"cells,":[78],"latches,":[79],"circuits":[82,112,155],"feature":[84],"sizes":[85],"from":[86,95,119],"600":[87],"nm":[88,91],"50":[90],"clock":[93],"periods":[94],"16":[96],"6":[98],"fan-out-of-4":[99],"inverter":[100],"delays.":[101],"Our":[102,139],"predicts":[104],"per":[108,133],"chip":[109,134],"will":[113,127],"increase":[114],"nine":[115],"orders":[116],"magnitude":[118],"1992":[120],"2011":[122],"at":[124],"point":[126],"be":[128],"comparable":[129],"unprotected":[136],"elements.":[138],"result":[140],"emphasizes":[141],"computer":[143],"system":[144],"designers":[145],"must":[146],"address":[147],"risks":[149]},"counts_by_year":[{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":15},{"year":2023,"cited_by_count":14},{"year":2022,"cited_by_count":16},{"year":2021,"cited_by_count":34},{"year":2020,"cited_by_count":22},{"year":2019,"cited_by_count":36},{"year":2018,"cited_by_count":40},{"year":2017,"cited_by_count":54},{"year":2016,"cited_by_count":72},{"year":2015,"cited_by_count":81},{"year":2014,"cited_by_count":73},{"year":2013,"cited_by_count":78},{"year":2012,"cited_by_count":83}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}