{"id":"https://openalex.org/W3149676088","doi":"https://doi.org/10.1109/dsd.2007.4341531","title":"Testability Analysis Based on the Identification of Testable Blocks with Predefined Properties","display_name":"Testability Analysis Based on the Identification of Testable Blocks with Predefined Properties","publication_year":2007,"publication_date":"2007-08-01","ids":{"openalex":"https://openalex.org/W3149676088","doi":"https://doi.org/10.1109/dsd.2007.4341531","mag":"3149676088"},"language":"en","primary_location":{"id":"doi:10.1109/dsd.2007.4341531","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsd.2007.4341531","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086238389","display_name":"Jaroslav \u0160karvada","orcid":null},"institutions":[{"id":"https://openalex.org/I60587646","display_name":"Brno University of Technology","ror":"https://ror.org/03613d656","country_code":"CZ","type":"education","lineage":["https://openalex.org/I60587646"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Jaroslav Skarvada","raw_affiliation_strings":["Faculty of Information Technology, Brno University of Technology, Brno, Czech Republic"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Information Technology, Brno University of Technology, Brno, Czech Republic","institution_ids":["https://openalex.org/I60587646"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054218766","display_name":"Tomas Herrman","orcid":null},"institutions":[{"id":"https://openalex.org/I60587646","display_name":"Brno University of Technology","ror":"https://ror.org/03613d656","country_code":"CZ","type":"education","lineage":["https://openalex.org/I60587646"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Tomas Herrman","raw_affiliation_strings":["Faculty of Information Technology, Brno University of Technology, Brno, Czech Republic"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Information Technology, Brno University of Technology, Brno, Czech Republic","institution_ids":["https://openalex.org/I60587646"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040514508","display_name":"Zden\u011bk Kot\u00e1sek","orcid":null},"institutions":[{"id":"https://openalex.org/I60587646","display_name":"Brno University of Technology","ror":"https://ror.org/03613d656","country_code":"CZ","type":"education","lineage":["https://openalex.org/I60587646"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Zdenek Kotasek","raw_affiliation_strings":["Faculty of Information Technology, Brno University of Technology, Brno, Czech Republic"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Information Technology, Brno University of Technology, Brno, Czech Republic","institution_ids":["https://openalex.org/I60587646"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.34761404,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"611","last_page":"618"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.811894416809082},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7162250280380249},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6985746622085571},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5606132745742798},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5311022400856018},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.4879867434501648},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.47432512044906616},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1889270842075348},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1535387933254242}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.811894416809082},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7162250280380249},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6985746622085571},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5606132745742798},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5311022400856018},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.4879867434501648},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.47432512044906616},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1889270842075348},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1535387933254242},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dsd.2007.4341531","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsd.2007.4341531","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7799999713897705,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1492580319","https://openalex.org/W1496730449","https://openalex.org/W1543643719","https://openalex.org/W1642078416","https://openalex.org/W1670369273","https://openalex.org/W2078888330","https://openalex.org/W2104773674","https://openalex.org/W2113114619","https://openalex.org/W2132665983","https://openalex.org/W2159553019"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W3037788266","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2164349885"],"abstract_inverted_index":{"In":[0,17],"the":[1,3,10,18,20,43,47,61],"paper,":[2],"methodology":[4,19,62],"of":[5,12,42,59],"testability":[6],"analysis":[7],"based":[8],"on":[9,63],"concept":[11],"testable":[13],"blocks":[14],"is":[15,26,51],"presented.":[16,77],"power":[21,34],"consumption":[22],"during":[23],"test":[24],"application":[25],"also":[27],"taken":[28],"into":[29,46],"account.":[30],"For":[31],"this":[32],"purpose,":[33],"estimation":[35],"tool":[36],"was":[37],"developed":[38,44],"and":[39,66],"implemented.":[40],"Integration":[41],"software":[45],"professional":[48],"design":[49],"flow":[50],"described.":[52],"Experimental":[53],"results":[54],"gained":[55],"as":[56],"a":[57],"consequence":[58],"applying":[60],"both":[64],"benchmark":[65],"practical":[67],"designs":[68],"are":[69,76],"demonstrated.":[70],"The":[71],"intensions":[72],"for":[73],"future":[74],"research":[75]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}