{"id":"https://openalex.org/W3150709697","doi":"https://doi.org/10.1109/dsd.2007.4341530","title":"Fault Diagnosis in Integrated Circuits with BIST","display_name":"Fault Diagnosis in Integrated Circuits with BIST","publication_year":2007,"publication_date":"2007-08-01","ids":{"openalex":"https://openalex.org/W3150709697","doi":"https://doi.org/10.1109/dsd.2007.4341530","mag":"3150709697"},"language":"en","primary_location":{"id":"doi:10.1109/dsd.2007.4341530","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsd.2007.4341530","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010536057","display_name":"Raimund Ubar","orcid":"https://orcid.org/0000-0001-8186-4385"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Raimund Ubar","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, China"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072185940","display_name":"Sergei Kostin","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sergei Kostin","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, China"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010286547","display_name":"Jaan Raik","orcid":"https://orcid.org/0000-0001-8113-020X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jaan Raik","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, China"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028671667","display_name":"Teet Evartson","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Teet Evartson","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, China"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062813889","display_name":"Harri Lensen","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Harri Lensen","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, China"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5010536057"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0537,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.80773191,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"604","last_page":"610"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6865500211715698},{"id":"https://openalex.org/keywords/pruning","display_name":"Pruning","score":0.6120359301567078},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6022343039512634},{"id":"https://openalex.org/keywords/bisection-method","display_name":"Bisection method","score":0.5765354633331299},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5746789574623108},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5625090599060059},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5557686686515808},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.5169386267662048},{"id":"https://openalex.org/keywords/pseudorandom-number-generator","display_name":"Pseudorandom number generator","score":0.4364200830459595},{"id":"https://openalex.org/keywords/fibonacci-number","display_name":"Fibonacci number","score":0.42784908413887024},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3851564824581146},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2821708917617798},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1314365565776825}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6865500211715698},{"id":"https://openalex.org/C108010975","wikidata":"https://www.wikidata.org/wiki/Q500094","display_name":"Pruning","level":2,"score":0.6120359301567078},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6022343039512634},{"id":"https://openalex.org/C157544257","wikidata":"https://www.wikidata.org/wiki/Q866300","display_name":"Bisection method","level":2,"score":0.5765354633331299},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5746789574623108},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5625090599060059},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5557686686515808},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.5169386267662048},{"id":"https://openalex.org/C140642157","wikidata":"https://www.wikidata.org/wiki/Q1623338","display_name":"Pseudorandom number generator","level":2,"score":0.4364200830459595},{"id":"https://openalex.org/C173734053","wikidata":"https://www.wikidata.org/wiki/Q47577","display_name":"Fibonacci number","level":2,"score":0.42784908413887024},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3851564824581146},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2821708917617798},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1314365565776825},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dsd.2007.4341530","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsd.2007.4341530","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1968199120","https://openalex.org/W2000489433","https://openalex.org/W2080407951","https://openalex.org/W2116598791","https://openalex.org/W2128745012","https://openalex.org/W2144756088","https://openalex.org/W2149397116","https://openalex.org/W2171039536","https://openalex.org/W2171426318","https://openalex.org/W4243780792","https://openalex.org/W4245226930","https://openalex.org/W4255322115","https://openalex.org/W4298949291","https://openalex.org/W6632662896","https://openalex.org/W6681363566","https://openalex.org/W6684237731"],"related_works":["https://openalex.org/W2523211787","https://openalex.org/W1600807921","https://openalex.org/W4288754393","https://openalex.org/W2989159162","https://openalex.org/W2129499974","https://openalex.org/W2071456813","https://openalex.org/W2786267147","https://openalex.org/W1540713932","https://openalex.org/W2119351822","https://openalex.org/W1529264663"],"abstract_inverted_index":{"This":[0,86],"paper":[1],"presents":[2],"an":[3],"optimized":[4],"fault":[5,105],"diagnosing":[6],"procedure":[7,34,54],"applicable":[8],"in":[9,25,71],"built-in":[10],"self-test":[11],"environments.":[12],"Instead":[13],"of":[14,23,39,52,92,119],"the":[15,36,49,53,58,63,72,90,117,120,125],"known":[16,104],"approach":[17,65],"based":[18],"on":[19],"a":[20,31],"simple":[21],"bisection":[22,33],"patterns":[24,41,78],"pseudorandom":[26],"test":[27,40],"sequences,":[28],"we":[29],"propose":[30],"novel":[32],"where":[35],"diagnostic":[37,95],"weight":[38],"is":[42,48,100],"taken":[43],"into":[44],"account.":[45],"Another":[46],"novelty":[47],"sequential":[50],"nature":[51],"which":[55,66],"allows":[56,87],"pruning":[57],"search":[59],"space.":[60],"Opposite":[61],"to":[62,81,88,124],"classical":[64,108],"targets":[67],"all":[68,76],"failing":[69,77],"patterns,":[70],"proposed":[73,98,121],"method":[74,99,122],"not":[75],"are":[79],"needed":[80],"be":[82],"fixed":[83],"for":[84],"diagnosis.":[85],"tradeoff":[89],"speed":[91],"diagnosis":[93,106],"with":[94,102],"resolution.":[96],"The":[97],"compared":[101,123],"three":[103],"methods:":[107],"binary":[109],"search,":[110],"doubling":[111],"and":[112],"jumping.":[113],"Experimental":[114],"results":[115],"demonstrate":[116],"advantages":[118],"previous":[126],"ones.":[127]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}