{"id":"https://openalex.org/W4385222191","doi":"https://doi.org/10.1109/drc58590.2023.10187070","title":"Ni/TiO<sub>2</sub>/ $\\beta$-Ga<sub>2</sub>O<sub>3</sub> Heterojunction Diodes with NiO Guard Ring Simultaneously Increasing Breakdown Voltage and Reducing Turn-on Voltage","display_name":"Ni/TiO<sub>2</sub>/ $\\beta$-Ga<sub>2</sub>O<sub>3</sub> Heterojunction Diodes with NiO Guard Ring Simultaneously Increasing Breakdown Voltage and Reducing Turn-on Voltage","publication_year":2023,"publication_date":"2023-06-25","ids":{"openalex":"https://openalex.org/W4385222191","doi":"https://doi.org/10.1109/drc58590.2023.10187070"},"language":"en","primary_location":{"id":"doi:10.1109/drc58590.2023.10187070","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/drc58590.2023.10187070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Device Research Conference (DRC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005278637","display_name":"Jeremiah C. Williams","orcid":"https://orcid.org/0000-0002-4984-5544"},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I4388482655","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","ror":"https://ror.org/054yf8v46","country_code":null,"type":"funder","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeremiah Williams","raw_affiliation_strings":["Air Force Research Laboratory Sensors Directorate,OH,USA,45433"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory Sensors Directorate,OH,USA,45433","institution_ids":["https://openalex.org/I1280414376","https://openalex.org/I4210090800","https://openalex.org/I4388482655"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070270057","display_name":"Nolan S. Hendricks","orcid":"https://orcid.org/0000-0001-9127-4661"},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I4388482655","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","ror":"https://ror.org/054yf8v46","country_code":null,"type":"funder","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nolan Hendricks","raw_affiliation_strings":["Air Force Research Laboratory Sensors Directorate,OH,USA,45433"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory Sensors Directorate,OH,USA,45433","institution_ids":["https://openalex.org/I1280414376","https://openalex.org/I4210090800","https://openalex.org/I4388482655"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066021678","display_name":"Weisong Wang","orcid":"https://orcid.org/0000-0003-0288-8050"},"institutions":[{"id":"https://openalex.org/I19648265","display_name":"Wright State University","ror":"https://ror.org/04qk6pt94","country_code":"US","type":"education","lineage":["https://openalex.org/I19648265"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Weisong Wang","raw_affiliation_strings":["Wright State University,Electrical Engineering Department,Celina,OH,45822"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wright State University,Electrical Engineering Department,Celina,OH,45822","institution_ids":["https://openalex.org/I19648265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048997906","display_name":"Aaron M. Adams","orcid":null},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I4210136264","display_name":"Ardent Sound (United States)","ror":"https://ror.org/039chvj52","country_code":"US","type":"company","lineage":["https://openalex.org/I4210136264"]},{"id":"https://openalex.org/I4388482655","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","ror":"https://ror.org/054yf8v46","country_code":null,"type":"funder","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aaron Adams","raw_affiliation_strings":["Air Force Research Laboratory Sensors Directorate,OH,USA,45433","Ardent Technologies, Dayton, OH"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory Sensors Directorate,OH,USA,45433","institution_ids":["https://openalex.org/I1280414376","https://openalex.org/I4210090800","https://openalex.org/I4388482655"]},{"raw_affiliation_string":"Ardent Technologies, Dayton, OH","institution_ids":["https://openalex.org/I4210136264"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054536429","display_name":"Joshua J. Piel","orcid":null},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I4388482655","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","ror":"https://ror.org/054yf8v46","country_code":null,"type":"funder","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joshua Piel","raw_affiliation_strings":["Air Force Research Laboratory Sensors Directorate,OH,USA,45433"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory Sensors Directorate,OH,USA,45433","institution_ids":["https://openalex.org/I1280414376","https://openalex.org/I4210090800","https://openalex.org/I4388482655"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113970219","display_name":"Daniel Dryden","orcid":null},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I4388482655","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","ror":"https://ror.org/054yf8v46","country_code":null,"type":"funder","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daniel Dryden","raw_affiliation_strings":["Air Force Research Laboratory Sensors Directorate,OH,USA,45433"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory Sensors Directorate,OH,USA,45433","institution_ids":["https://openalex.org/I1280414376","https://openalex.org/I4210090800","https://openalex.org/I4388482655"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087924796","display_name":"Kyle J. Liddy","orcid":"https://orcid.org/0000-0003-4412-7073"},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I4388482655","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","ror":"https://ror.org/054yf8v46","country_code":null,"type":"funder","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kyle Liddy","raw_affiliation_strings":["Air Force Research Laboratory Sensors Directorate,OH,USA,45433"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory Sensors Directorate,OH,USA,45433","institution_ids":["https://openalex.org/I1280414376","https://openalex.org/I4210090800","https://openalex.org/I4388482655"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077274644","display_name":"Nicholas P. Sepelak","orcid":"https://orcid.org/0000-0002-8686-0444"},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},{"id":"https://openalex.org/I153156064","display_name":"KBR (United States)","ror":"https://ror.org/01g1xae87","country_code":"US","type":"company","lineage":["https://openalex.org/I153156064"]},{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I4388482655","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","ror":"https://ror.org/054yf8v46","country_code":null,"type":"funder","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nicholas Sepelak","raw_affiliation_strings":["Air Force Research Laboratory Sensors Directorate,OH,USA,45433","KBR Inc., Beavercreek, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory Sensors Directorate,OH,USA,45433","institution_ids":["https://openalex.org/I1280414376","https://openalex.org/I4210090800","https://openalex.org/I4388482655"]},{"raw_affiliation_string":"KBR Inc., Beavercreek, OH, USA","institution_ids":["https://openalex.org/I153156064"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041937129","display_name":"Bradley Morell","orcid":null},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bradley Morell","raw_affiliation_strings":["Cornell University,Material Science Department,Ithaca,NY,USA,14853"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cornell University,Material Science Department,Ithaca,NY,USA,14853","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085874259","display_name":"Adam Miesle","orcid":null},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},{"id":"https://openalex.org/I153156064","display_name":"KBR (United States)","ror":"https://ror.org/01g1xae87","country_code":"US","type":"company","lineage":["https://openalex.org/I153156064"]},{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I4388482655","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","ror":"https://ror.org/054yf8v46","country_code":null,"type":"funder","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Adam Miesle","raw_affiliation_strings":["Air Force Research Laboratory Sensors Directorate,OH,USA,45433","KBR Inc., Beavercreek, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory Sensors Directorate,OH,USA,45433","institution_ids":["https://openalex.org/I1280414376","https://openalex.org/I4210090800","https://openalex.org/I4388482655"]},{"raw_affiliation_string":"KBR Inc., Beavercreek, OH, USA","institution_ids":["https://openalex.org/I153156064"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007508845","display_name":"Ahmad E. Islam","orcid":"https://orcid.org/0000-0002-4233-1233"},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I4388482655","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","ror":"https://ror.org/054yf8v46","country_code":null,"type":"funder","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ahmad Islam","raw_affiliation_strings":["Air Force Research Laboratory Sensors Directorate,OH,USA,45433"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory Sensors Directorate,OH,USA,45433","institution_ids":["https://openalex.org/I1280414376","https://openalex.org/I4210090800","https://openalex.org/I4388482655"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100678862","display_name":"Andrew J. Green","orcid":"https://orcid.org/0000-0003-2421-5607"},"institutions":[{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I4388482655","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","ror":"https://ror.org/054yf8v46","country_code":null,"type":"funder","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew Green","raw_affiliation_strings":["Air Force Research Laboratory Sensors Directorate,OH,USA,45433"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Research Laboratory Sensors Directorate,OH,USA,45433","institution_ids":["https://openalex.org/I1280414376","https://openalex.org/I4210090800","https://openalex.org/I4388482655"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.4867,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.85314685,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"13","issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10078","display_name":"Advanced Photocatalysis Techniques","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.5671651363372803},{"id":"https://openalex.org/keywords/non-blocking-i/o","display_name":"Non-blocking I/O","score":0.5232590436935425},{"id":"https://openalex.org/keywords/heterojunction","display_name":"Heterojunction","score":0.48975348472595215},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.45736464858055115},{"id":"https://openalex.org/keywords/schottky-diode","display_name":"Schottky diode","score":0.4502970576286316},{"id":"https://openalex.org/keywords/schottky-barrier","display_name":"Schottky barrier","score":0.44809746742248535},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.38497719168663025},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3731619715690613},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.36790966987609863},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30900073051452637},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2119857668876648},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08903282880783081}],"concepts":[{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.5671651363372803},{"id":"https://openalex.org/C74575197","wikidata":"https://www.wikidata.org/wiki/Q9941","display_name":"Non-blocking I/O","level":3,"score":0.5232590436935425},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.48975348472595215},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.45736464858055115},{"id":"https://openalex.org/C205200001","wikidata":"https://www.wikidata.org/wiki/Q176066","display_name":"Schottky diode","level":3,"score":0.4502970576286316},{"id":"https://openalex.org/C16115445","wikidata":"https://www.wikidata.org/wiki/Q2391942","display_name":"Schottky barrier","level":3,"score":0.44809746742248535},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.38497719168663025},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3731619715690613},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.36790966987609863},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30900073051452637},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2119857668876648},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08903282880783081},{"id":"https://openalex.org/C161790260","wikidata":"https://www.wikidata.org/wiki/Q82264","display_name":"Catalysis","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/drc58590.2023.10187070","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/drc58590.2023.10187070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Device Research Conference (DRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5299999713897705}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W3099782277","https://openalex.org/W3163500622","https://openalex.org/W4284881561"],"related_works":["https://openalex.org/W2153976432","https://openalex.org/W2147656057","https://openalex.org/W1540585561","https://openalex.org/W2086756978","https://openalex.org/W1981646027","https://openalex.org/W2917180890","https://openalex.org/W2614156624","https://openalex.org/W2124223348","https://openalex.org/W2911343812","https://openalex.org/W3120723223"],"abstract_inverted_index":{"Beta":[0],"Gallium":[1],"Oxide":[2],"($\\beta$-Ga2O3)":[3],"is":[4,69,139],"an":[5],"ultra-wide":[6],"bandgap":[7],"semiconductor":[8],"(\u223c4.8":[9],"eV)":[10],"with":[11,39,160],"numerous":[12],"merits":[13],"positioning":[14],"it":[15],"to":[16,123,169],"surpass":[17],"the":[18,76,105,110,142,147,175],"material":[19],"limits":[20],"other":[21],"semiconductors":[22],"for":[23,94],"power":[24,63],"electronic":[25],"applications,":[26],"namely":[27],"a":[28,58,161,170],"high":[29,48,80],"predicted":[30],"critical":[31],"field":[32,73,177],"strength":[33],"of":[34,178],"8":[35],"MV/cm,":[36],"controllable":[37],"doping":[38],"multiple":[40],"shallow":[41],"donor":[42],"species,":[43],"and":[44,79,100,127,180],"melt-grown":[45],"substrates":[46],"facilitating":[47],"quality,":[49],"lattice":[50],"matched":[51],"epitaxial":[52],"growth.":[53],"Vertical":[54],"Schottky":[55],"diodes":[56,97,159],"are":[57],"fundamental":[59],"application":[60],"for$\\beta$-Ga2O3to":[61],"demonstrate":[62],"handling":[64],"capabilities;":[65],"however,":[66],"breakdown":[67,128,176],"behavior":[68],"limited":[70],"by":[71,141],"electric":[72],"crowding":[74],"at":[75],"contact":[77],"edge":[78,101],"tunneling":[81],"current":[82,138],"under":[83],"large":[84],"reverse":[85],"bias.":[86],"P-type":[87],"nickel":[88],"oxide":[89],"(NiO)":[90],"has":[91,120],"been":[92,121],"investigated":[93],"p-n":[95,106],"heterojunction":[96],"(HJD)":[98],"[1],":[99],"termination":[102],"[2],":[103],"but":[104,146],"barrier":[107,144],"significantly":[108],"raises":[109],"turn-on":[111],"voltage":[112,129],"(Von),":[113],"increasing":[114],"forward":[115],"conduction":[116],"losses.":[117],"The":[118],"TiO2/Ga2O3heterojunction":[119],"shown":[122],"improve":[124],"off-state":[125],"losses":[126,135],"(Vbk)":[130],"without":[131],"adding":[132],"significant":[133],"on-state":[134],"[3].":[136],"Leakage":[137],"reduced":[140],"additional":[143],"width,":[145],"negative":[148],"conduction-band":[149],"offset":[150],"between":[151],"TiO2and$\\beta$-Ga2O3maintains":[152],"low":[153],"Von.":[154],"This":[155],"work":[156],"explores":[157],"Ni/TiO2/$\\beta$-Ga2O3heterojunction":[158],"p-NiO":[162],"guard":[163],"ring":[164],"(GR),":[165],"which":[166],"reduces":[167],"Voncompared":[168],"co-fabricated":[171],"SBD":[172],"while":[173],"exceeding":[174],"SiC":[179],"GaN.":[181]},"counts_by_year":[{"year":2024,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}