{"id":"https://openalex.org/W4385192305","doi":"https://doi.org/10.1109/drc58590.2023.10187004","title":"Single-Event Burnout by Cf-252 Irradiation in Vertical $\\beta$-Ga<sub>2</sub>O<sub>3</sub> Diodes with Pt and PtO<sub>x</sub> Schottky Contacts and High Permittivity Dielectric Field Plate","display_name":"Single-Event Burnout by Cf-252 Irradiation in Vertical $\\beta$-Ga<sub>2</sub>O<sub>3</sub> Diodes with Pt and PtO<sub>x</sub> Schottky Contacts and High Permittivity Dielectric Field Plate","publication_year":2023,"publication_date":"2023-06-25","ids":{"openalex":"https://openalex.org/W4385192305","doi":"https://doi.org/10.1109/drc58590.2023.10187004"},"language":"en","primary_location":{"id":"doi:10.1109/drc58590.2023.10187004","is_oa":false,"landing_page_url":"https://doi.org/10.1109/drc58590.2023.10187004","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Device Research Conference (DRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065284989","display_name":"S. Islam","orcid":"https://orcid.org/0000-0003-2648-2549"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sajal Islam","raw_affiliation_strings":["Vanderbilt University,Nashville,TN,USA,37235"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN,USA,37235","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048714095","display_name":"A. S. Senarath","orcid":"https://orcid.org/0000-0002-6821-318X"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aditha S. Senarath","raw_affiliation_strings":["Vanderbilt University,Nashville,TN,USA,37235"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN,USA,37235","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039907462","display_name":"Arijit Sengupta","orcid":"https://orcid.org/0000-0002-3851-3843"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arijit Sengupta","raw_affiliation_strings":["Vanderbilt University,Nashville,TN,USA,37235"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN,USA,37235","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009879848","display_name":"En Xia Zhang","orcid":"https://orcid.org/0000-0002-8021-2411"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"En Xia Zhang","raw_affiliation_strings":["Vanderbilt University,Nashville,TN,USA,37235"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN,USA,37235","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006376684","display_name":"Dennis R. Ball","orcid":"https://orcid.org/0000-0003-0411-1835"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dennis R. Ball","raw_affiliation_strings":["Vanderbilt University,Nashville,TN,USA,37235"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN,USA,37235","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049822123","display_name":"Daniel M. Fleetwood","orcid":"https://orcid.org/0000-0003-4257-7142"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daniel M. Fleetwood","raw_affiliation_strings":["Vanderbilt University,Nashville,TN,USA,37235"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN,USA,37235","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035965053","display_name":"Ronald D. Schrimpf","orcid":"https://orcid.org/0000-0001-7419-2701"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ronald D. Schrimpf","raw_affiliation_strings":["Vanderbilt University,Nashville,TN,USA,37235"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN,USA,37235","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023288523","display_name":"Esmat Farzana","orcid":"https://orcid.org/0000-0003-4176-3015"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Esmat Farzana","raw_affiliation_strings":["University of California, Santa Barbara,Santa Barbara,CA,USA,93117"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Santa Barbara,Santa Barbara,CA,USA,93117","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037798074","display_name":"Arkka Bhattacharyya","orcid":"https://orcid.org/0000-0002-7209-5681"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arkka Bhattacharyya","raw_affiliation_strings":["University of California, Santa Barbara,Santa Barbara,CA,USA,93117"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Santa Barbara,Santa Barbara,CA,USA,93117","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070270057","display_name":"Nolan S. Hendricks","orcid":"https://orcid.org/0000-0001-9127-4661"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nolan S. Hendricks","raw_affiliation_strings":["University of California, Santa Barbara,Santa Barbara,CA,USA,93117"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Santa Barbara,Santa Barbara,CA,USA,93117","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066555038","display_name":"James S. Speck","orcid":"https://orcid.org/0000-0002-8045-4090"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James S. Speck","raw_affiliation_strings":["University of California, Santa Barbara,Santa Barbara,CA,USA,93117"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Santa Barbara,Santa Barbara,CA,USA,93117","institution_ids":["https://openalex.org/I154570441"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5967,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.5875933,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.4506840109825134},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.37856948375701904},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.21623995900154114}],"concepts":[{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.4506840109825134},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.37856948375701904},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.21623995900154114}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/drc58590.2023.10187004","is_oa":false,"landing_page_url":"https://doi.org/10.1109/drc58590.2023.10187004","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Device Research Conference (DRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036","https://openalex.org/W3148032049","https://openalex.org/W2271181815"],"abstract_inverted_index":{"<tex":[0,41,69,143,156,200,244],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[1,5,9,42,46,50,70,74,78,103,112,130,140,144,148,152,157,177,183,201,217,227,245,249,253],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\beta$</tex>":[2,43,71,145,246],"-Ga":[3,44,72,146,247],"<inf":[4,8,45,49,73,77,102,111,129,139,147,151,176,182,216,226,248,252],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>":[6,47,75,113,131,141,149,184,228,250],"O":[7,48,76,150,251],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">3</inf>":[10,51,79,153,254],"is":[11,60],"an":[12],"ultrawide-bandgap":[13],"material":[14],"(4.6\u20134.9":[15],"eV)":[16],"with":[17,87,109,127,137,155,170,180,213],"a":[18,232,238],"theoretical":[19],"breakdown":[20,93,235],"field":[21,114],"of":[22,40,68,199],"about":[23],"8":[24],"MV/cm":[25],"[1].":[26],"Very":[27],"few":[28],"experimental":[29],"results":[30],"have":[31],"been":[32],"reported":[33],"so":[34],"far":[35],"on":[36],"the":[37,91,134,214,221,243],"radiation":[38,240],"response":[39,241],".":[52,206],"In":[53],"this":[54],"work,":[55],"ion-induced":[56],"single-event":[57],"burnout":[58],"(SEB)":[59],"experimentally":[61],"observed":[62],"in":[63,231],"two":[64],"structurally":[65],"different":[66],"types":[67],"Schottky":[80,105,209],"diodes.":[81,255],"SEB":[82,119],"occurred":[83],"by":[84],"Cf-252":[85,171],"irradiation":[86],"voltages":[88],"well":[89],"below":[90],"electrical":[92,234],"for":[94,242],"both":[95],"device":[96],"structures.":[97],"However,":[98],"devices":[99,123,154,173],"having":[100,124,174,193],"PtO":[101,175,215],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">x</inf>":[104,178,218],"barrier":[106,210],"contacts":[107],"(SBCs)":[108],"TiO":[110,181,225],"plates":[115],"(FPs)":[116],"showed":[117],"higher":[118,233],"thresholds":[120],"compared":[121],"to":[122,189],"Pt":[125,135],"SBCs":[126,179],"ZrO":[128,138],"FPs.":[132],"While":[133],"SBC":[136,219],"FP":[142,229],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\sim":[158,202],"8.5\\":[159],"\\mu":[160,204],"\\mathrm{m}$</tex>":[161,205],"drift":[162,196],"layer":[163,197],"failed":[164],"at":[165],"\u2212310":[166],"V":[167,191],"reverse":[168],"bias":[169],"irradiation,":[172],"FPs":[185],"functioned":[186],"properly":[187],"up":[188],"\u2212400":[190],"despite":[192],"significantly":[194],"less":[195],"thickness":[198],"4\\":[203],"The":[207],"increased":[208],"height":[211],"(SBH)":[212],"and/or":[220],"extreme-k":[222],"permittivity":[223],"dielectric":[224],"resulted":[230],"voltage":[236],"and":[237],"better":[239]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}