{"id":"https://openalex.org/W4385192361","doi":"https://doi.org/10.1109/drc58590.2023.10186952","title":"Ga<sub>2</sub>O<sub>3</sub> Heterojunction PN Diodes with Suppressed Background Carrier Concentration for Improved Breakdown Voltage","display_name":"Ga<sub>2</sub>O<sub>3</sub> Heterojunction PN Diodes with Suppressed Background Carrier Concentration for Improved Breakdown Voltage","publication_year":2023,"publication_date":"2023-06-25","ids":{"openalex":"https://openalex.org/W4385192361","doi":"https://doi.org/10.1109/drc58590.2023.10186952"},"language":"en","primary_location":{"id":"doi:10.1109/drc58590.2023.10186952","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/drc58590.2023.10186952","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Device Research Conference (DRC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073256049","display_name":"Pengfei Dong","orcid":"https://orcid.org/0000-0002-0954-8094"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengfei Dong","raw_affiliation_strings":["School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062668398","display_name":"Chenlu Wang","orcid":"https://orcid.org/0000-0003-0232-3447"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenlu Wang","raw_affiliation_strings":["School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059827497","display_name":"Qinglong Yan","orcid":"https://orcid.org/0000-0002-3928-5176"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qinglong Yan","raw_affiliation_strings":["School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100763510","display_name":"Yingming Wang","orcid":"https://orcid.org/0000-0002-6004-8175"},"institutions":[{"id":"https://openalex.org/I2800372957","display_name":"China Electronics Technology Group Corporation","ror":"https://ror.org/0098hst83","country_code":"CN","type":"company","lineage":["https://openalex.org/I2800372957"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingming Wang","raw_affiliation_strings":["The 46th Research Institute, China Electronics Technology Group Corporation,Key Laboratory of Advanced Semiconductor Materials of CETC,Tianjin 300220,China,61005"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The 46th Research Institute, China Electronics Technology Group Corporation,Key Laboratory of Advanced Semiconductor Materials of CETC,Tianjin 300220,China,61005","institution_ids":["https://openalex.org/I2800372957"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100370461","display_name":"Jian Wang","orcid":"https://orcid.org/0000-0002-5368-8027"},"institutions":[{"id":"https://openalex.org/I2800372957","display_name":"China Electronics Technology Group Corporation","ror":"https://ror.org/0098hst83","country_code":"CN","type":"company","lineage":["https://openalex.org/I2800372957"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Wang","raw_affiliation_strings":["The 46th Research Institute, China Electronics Technology Group Corporation,Key Laboratory of Advanced Semiconductor Materials of CETC,Tianjin 300220,China,61005"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The 46th Research Institute, China Electronics Technology Group Corporation,Key Laboratory of Advanced Semiconductor Materials of CETC,Tianjin 300220,China,61005","institution_ids":["https://openalex.org/I2800372957"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053186067","display_name":"Sami Alghamdi","orcid":"https://orcid.org/0000-0003-0465-6675"},"institutions":[{"id":"https://openalex.org/I185163786","display_name":"King Abdulaziz University","ror":"https://ror.org/02ma4wv74","country_code":"SA","type":"education","lineage":["https://openalex.org/I185163786"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Sami Alghamdi","raw_affiliation_strings":["King Abdulaziz University,Electrical and Computer Engineering department,Jeddah,Saudi Arabia,21589"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"King Abdulaziz University,Electrical and Computer Engineering department,Jeddah,Saudi Arabia,21589","institution_ids":["https://openalex.org/I185163786"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100328504","display_name":"Zhihong Liu","orcid":"https://orcid.org/0000-0002-5724-9945"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhihong Liu","raw_affiliation_strings":["School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100638045","display_name":"Jincheng Zhang","orcid":"https://orcid.org/0000-0001-7332-6704"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jincheng Zhang","raw_affiliation_strings":["School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077506146","display_name":"Hong Zhou","orcid":"https://orcid.org/0000-0002-0741-7568"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong Zhou","raw_affiliation_strings":["School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100750974","display_name":"Yue Hao","orcid":"https://orcid.org/0000-0002-8081-2919"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yue Hao","raw_affiliation_strings":["School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Xidian University,State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology,Xi&#x0027;an,China,710071","institution_ids":["https://openalex.org/I149594827"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11853147,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9846000075340271,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9419000148773193,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.6598873138427734},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5138893127441406},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.35688191652297974},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3294212222099304},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2898283004760742},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0809299647808075}],"concepts":[{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.6598873138427734},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5138893127441406},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.35688191652297974},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3294212222099304},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2898283004760742},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0809299647808075}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/drc58590.2023.10186952","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/drc58590.2023.10186952","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Device Research Conference (DRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2406809365","https://openalex.org/W2772808935","https://openalex.org/W4206003670"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036","https://openalex.org/W2271181815"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"show":[4],"that":[5],"by":[6],"suppressing":[7],"the":[8,12,36],"background":[9,70],"carrier":[10,71],"concentration,":[11],"breakdown":[13],"voltage":[14,91],"(BV)":[15],"of":[16,56],"Ga2O3heterojunction":[17],"PN":[18,66],"diode":[19],"(HJ-PND)":[20],"can":[21,41],"be":[22,42,63],"essentially":[23],"enhanced.":[24],"Meanwhile,":[25],"through":[26],"combing":[27],"with":[28,68],"high-level":[29,77],"hole":[30,78],"injection":[31,79],"induced":[32],"conductivity":[33],"modulation":[34],"effect,":[35],"specific":[37],"on-resistance":[38],"(Ron,":[39],"sp)":[40],"significantly":[43],"reduced.":[44],"Even":[45],"without":[46],"a":[47,52],"carefully":[48],"designed":[49],"edge":[50],"termination,":[51],"high":[53,90,93],"power":[54,94],"figure":[55],"merit":[57],"(P-$\\text{FOM}=\\text{BV}^{2}/\\mathrm{R}_{\\text{on},\\text{sp}})$of$(3.75\\":[58],"\\text{kV})^{2}/(2.5\\":[59],"\\mathrm{m}\\Omega\\cdot":[60],"\\text{cm}^{2})=5.6\\":[61],"\\text{GW}/\\text{cm}^{2}$can":[62],"achieved.":[64],"Ga2O3HJ":[65],"diodes":[67],"suppressed":[69],"concentration":[72],"for":[73,80,88],"BV":[74],"enhancement":[75],"and":[76,92],"Ron,":[81],"sp":[82],"reduction":[83],"verify":[84],"their":[85],"great":[86],"promise":[87],"future":[89],"applications.":[95]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}