{"id":"https://openalex.org/W3042163287","doi":"https://doi.org/10.1109/drc50226.2020.9135172","title":"Polarization-induced Strain-coupled TMD FETs (PS FETs) for Non-Volatile Memory Applications","display_name":"Polarization-induced Strain-coupled TMD FETs (PS FETs) for Non-Volatile Memory Applications","publication_year":2020,"publication_date":"2020-06-01","ids":{"openalex":"https://openalex.org/W3042163287","doi":"https://doi.org/10.1109/drc50226.2020.9135172","mag":"3042163287"},"language":"en","primary_location":{"id":"doi:10.1109/drc50226.2020.9135172","is_oa":false,"landing_page_url":"https://doi.org/10.1109/drc50226.2020.9135172","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 Device Research Conference (DRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069775931","display_name":"Niharika Thakuria","orcid":"https://orcid.org/0000-0002-7327-4104"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Niharika Thakuria","raw_affiliation_strings":["Purdue University, West Lafayette, IN"],"affiliations":[{"raw_affiliation_string":"Purdue University, West Lafayette, IN","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024359858","display_name":"Atanu Saha","orcid":"https://orcid.org/0000-0002-1506-1303"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Atanu K. Saha","raw_affiliation_strings":["Purdue University, West Lafayette, IN"],"affiliations":[{"raw_affiliation_string":"Purdue University, West Lafayette, IN","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043655176","display_name":"Sandeep Krishna Thirumala","orcid":"https://orcid.org/0000-0001-9448-324X"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sandeep K. Thirumala","raw_affiliation_strings":["Purdue University, West Lafayette, IN"],"affiliations":[{"raw_affiliation_string":"Purdue University, West Lafayette, IN","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103069002","display_name":"Daniel S. Schulman","orcid":"https://orcid.org/0000-0002-0751-0578"},"institutions":[{"id":"https://openalex.org/I4210158342","display_name":"Intel (United Kingdom)","ror":"https://ror.org/058cxws58","country_code":"GB","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210158342"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Daniel Schulman","raw_affiliation_strings":["Intel Corp"],"affiliations":[{"raw_affiliation_string":"Intel Corp","institution_ids":["https://openalex.org/I4210158342"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011415435","display_name":"Saptarshi Das","orcid":"https://orcid.org/0000-0002-0188-945X"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saptarshi Das","raw_affiliation_strings":["Penn State University, PA, USA"],"affiliations":[{"raw_affiliation_string":"Penn State University, PA, USA","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044276472","display_name":"Sumeet Kumar Gupta","orcid":"https://orcid.org/0000-0001-5609-9722"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sumeet K. Gupta","raw_affiliation_strings":["Purdue University, West Lafayette, IN"],"affiliations":[{"raw_affiliation_string":"Purdue University, West Lafayette, IN","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5069775931"],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":0.3199,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.4904706,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10275","display_name":"2D Materials and Applications","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10275","display_name":"2D Materials and Applications","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10247","display_name":"Perovskite Materials and Applications","score":0.9840999841690063,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9818000197410583,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferroelectricity","display_name":"Ferroelectricity","score":0.7252316474914551},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7161794304847717},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6285597085952759},{"id":"https://openalex.org/keywords/piezoelectricity","display_name":"Piezoelectricity","score":0.5709877014160156},{"id":"https://openalex.org/keywords/polarization","display_name":"Polarization (electrochemistry)","score":0.5559883117675781},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.5190735459327698},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.4455142319202423},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4363091289997101},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2626303434371948},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.23012924194335938},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.17895197868347168},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1374862790107727},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.0971868634223938},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08571204543113708},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.08400920033454895}],"concepts":[{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.7252316474914551},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7161794304847717},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6285597085952759},{"id":"https://openalex.org/C100082104","wikidata":"https://www.wikidata.org/wiki/Q183759","display_name":"Piezoelectricity","level":2,"score":0.5709877014160156},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.5559883117675781},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.5190735459327698},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.4455142319202423},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4363091289997101},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2626303434371948},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.23012924194335938},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.17895197868347168},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1374862790107727},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0971868634223938},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08571204543113708},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.08400920033454895},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/drc50226.2020.9135172","is_oa":false,"landing_page_url":"https://doi.org/10.1109/drc50226.2020.9135172","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 Device Research Conference (DRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7699999809265137,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W3093403384"],"related_works":["https://openalex.org/W2795319754","https://openalex.org/W120386264","https://openalex.org/W2248971758","https://openalex.org/W2332612935","https://openalex.org/W2166508075","https://openalex.org/W4376612721","https://openalex.org/W1963822728","https://openalex.org/W2034643761","https://openalex.org/W2265722765","https://openalex.org/W4226089858"],"abstract_inverted_index":{"Among":[0],"several":[1],"non-volatile":[2,91],"memories":[3,8],"(NVMs),":[4],"ferroelectric":[5],"(FE)":[6],"based":[7,32],"show":[9],"distinct":[10],"advantages":[11],"due":[12],"to":[13],"electric":[14],"field":[15],"(":[16],"E":[17],")-driven":[18],"low-power":[19],"write":[20,95],"[1]":[21],"-":[22],"[2]":[23],".":[24],"However,":[25],"there":[26],"are":[27],"other":[28],"concerns":[29],"in":[30,37,43,56],"FE":[31],"NVMs":[33],"(such":[34],"destructive":[35],"read":[36,113],"FERAMs":[38],"[3]":[39],",":[40],"gate":[41],"leakage":[42],"FEFETs":[44,57],"with":[45,101],"floating":[46],"inter-layer":[47],"metal":[48],"(ILM)":[49],"[5]":[50],"and":[51,53,96],"traps":[52],"depolarization":[54],"fields":[55],"without":[58],"ILM":[59],"[4]":[60],").":[61],"To":[62],"overcome":[63],"such":[64],"issues":[65],"while":[66],"retaining":[67],"the":[68],"useful":[69],"features":[70,88],"of":[71,99,106],"FE,":[72],"we":[73],"propose":[74],"a":[75],"Polarization-induced":[76],"Strain":[77],"coupled":[78],"TMD":[79],"FET":[80],"(PS":[81],"FET)":[82],"[":[83,114],"Fig.":[84,115],"1(a)":[85],"]":[86],"that":[87],"(a)":[89],"polarization-based":[90],"bit-storage":[92],"(b)":[93],"E-driven":[94],"(c)":[97],"coupling":[98],"piezoelectricity":[100],"dynamic":[102],"bandgap":[103],"(EG)":[104],"tuning":[105],"2D":[107],"Transition":[108],"Metal":[109],"Dichalcogenides":[110],"(TMDs)":[111],"for":[112],"1(b)":[116],"].":[117]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}