{"id":"https://openalex.org/W3013848269","doi":"https://doi.org/10.1109/drc46940.2019.9046463","title":"Demonstration and Endurance Improvement of p-channel Hafnia-based Ferroelectric Field Effect Transistors","display_name":"Demonstration and Endurance Improvement of p-channel Hafnia-based Ferroelectric Field Effect Transistors","publication_year":2019,"publication_date":"2019-06-01","ids":{"openalex":"https://openalex.org/W3013848269","doi":"https://doi.org/10.1109/drc46940.2019.9046463","mag":"3013848269"},"language":"en","primary_location":{"id":"doi:10.1109/drc46940.2019.9046463","is_oa":false,"landing_page_url":"https://doi.org/10.1109/drc46940.2019.9046463","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Device Research Conference (DRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://tud.qucosa.de/id/qucosa%3A77564","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012800499","display_name":"Felix Winkler","orcid":"https://orcid.org/0000-0003-3404-1970"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Felix Winkler","raw_affiliation_strings":["Technische Universität Dresden, Institute of Semiconductors and Microsystems, IHM,Dresden,Germany","Technische Universit\u00e4t Dresden, Institute of Semiconductors and Microsystems, IHM, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Technische Universität Dresden, Institute of Semiconductors and Microsystems, IHM,Dresden,Germany","institution_ids":["https://openalex.org/I78650965"]},{"raw_affiliation_string":"Technische Universit\u00e4t Dresden, Institute of Semiconductors and Microsystems, IHM, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068149790","display_name":"Milan Pe\u0161i\u0107","orcid":"https://orcid.org/0000-0002-1788-8945"},"institutions":[{"id":"https://openalex.org/I193427800","display_name":"Applied Materials (United States)","ror":"https://ror.org/04h1q4c89","country_code":"US","type":"company","lineage":["https://openalex.org/I193427800"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Milan Pe\u0161i\u0107","raw_affiliation_strings":["Now with Applied Materials,Santa Clara,CA,USA","Now with Applied Materials, Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Now with Applied Materials,Santa Clara,CA,USA","institution_ids":["https://openalex.org/I193427800"]},{"raw_affiliation_string":"Now with Applied Materials, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I193427800"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108142801","display_name":"Claudia Richter","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122489","display_name":"NaMLab (Germany)","ror":"https://ror.org/028070c57","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210122489","https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Claudia Richter","raw_affiliation_strings":["Namlab gGmbH,Noethnitzer Str. 64, Dresden,Germany,01187","Namlab gGmbH, Noethnitzer Str. 64, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Namlab gGmbH,Noethnitzer Str. 64, Dresden,Germany,01187","institution_ids":["https://openalex.org/I4210122489"]},{"raw_affiliation_string":"Namlab gGmbH, Noethnitzer Str. 64, Dresden, Germany","institution_ids":["https://openalex.org/I4210122489"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078160379","display_name":"Michael Hoffmann","orcid":"https://orcid.org/0000-0001-6493-3457"},"institutions":[{"id":"https://openalex.org/I4210122489","display_name":"NaMLab (Germany)","ror":"https://ror.org/028070c57","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210122489","https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Hoffmann","raw_affiliation_strings":["Namlab gGmbH,Noethnitzer Str. 64, Dresden,Germany,01187","Namlab gGmbH, Noethnitzer Str. 64, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Namlab gGmbH,Noethnitzer Str. 64, Dresden,Germany,01187","institution_ids":["https://openalex.org/I4210122489"]},{"raw_affiliation_string":"Namlab gGmbH, Noethnitzer Str. 64, Dresden, Germany","institution_ids":["https://openalex.org/I4210122489"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003850300","display_name":"Thomas Mikolajick","orcid":"https://orcid.org/0000-0003-3814-0378"},"institutions":[{"id":"https://openalex.org/I4210122489","display_name":"NaMLab (Germany)","ror":"https://ror.org/028070c57","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210122489","https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Mikolajick","raw_affiliation_strings":["Namlab gGmbH,Noethnitzer Str. 64, Dresden,Germany,01187","Namlab gGmbH, Noethnitzer Str. 64, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Namlab gGmbH,Noethnitzer Str. 64, Dresden,Germany,01187","institution_ids":["https://openalex.org/I4210122489"]},{"raw_affiliation_string":"Namlab gGmbH, Noethnitzer Str. 64, Dresden, Germany","institution_ids":["https://openalex.org/I4210122489"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005358589","display_name":"Johann W. Bartha","orcid":"https://orcid.org/0000-0001-8695-2827"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Johann W. Bartha","raw_affiliation_strings":["Technische Universität Dresden, Institute of Semiconductors and Microsystems, IHM,Dresden,Germany","Technische Universit\u00e4t Dresden, Institute of Semiconductors and Microsystems, IHM, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Technische Universität Dresden, Institute of Semiconductors and Microsystems, IHM,Dresden,Germany","institution_ids":["https://openalex.org/I78650965"]},{"raw_affiliation_string":"Technische Universit\u00e4t Dresden, Institute of Semiconductors and Microsystems, IHM, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5012800499"],"corresponding_institution_ids":["https://openalex.org/I78650965"],"apc_list":null,"apc_paid":null,"fwci":0.7261,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.7314625,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"51","last_page":"52"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12046","display_name":"MXene and MAX Phase Materials","score":0.9821000099182129,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9434999823570251,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferroelectricity","display_name":"Ferroelectricity","score":0.7911737561225891},{"id":"https://openalex.org/keywords/hafnia","display_name":"Hafnia","score":0.7550737261772156},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7316126227378845},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6448113322257996},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.5177575945854187},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.5013070106506348},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.47467684745788574},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.4578096270561218},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4441049098968506},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.41297489404678345},{"id":"https://openalex.org/keywords/insulator","display_name":"Insulator (electricity)","score":0.4111339747905731},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.37391579151153564},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3587844967842102},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3081628084182739},{"id":"https://openalex.org/keywords/cubic-zirconia","display_name":"Cubic zirconia","score":0.23625096678733826},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2147425413131714},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1406928300857544},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12130844593048096},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.11631661653518677},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08831587433815002},{"id":"https://openalex.org/keywords/ceramic","display_name":"Ceramic","score":0.08495312929153442}],"concepts":[{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.7911737561225891},{"id":"https://openalex.org/C2776778127","wikidata":"https://www.wikidata.org/wiki/Q140736","display_name":"Hafnia","level":4,"score":0.7550737261772156},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7316126227378845},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6448113322257996},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.5177575945854187},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.5013070106506348},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.47467684745788574},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.4578096270561218},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4441049098968506},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.41297489404678345},{"id":"https://openalex.org/C212702","wikidata":"https://www.wikidata.org/wiki/Q178150","display_name":"Insulator (electricity)","level":2,"score":0.4111339747905731},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.37391579151153564},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3587844967842102},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3081628084182739},{"id":"https://openalex.org/C123609680","wikidata":"https://www.wikidata.org/wiki/Q225666","display_name":"Cubic zirconia","level":3,"score":0.23625096678733826},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2147425413131714},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1406928300857544},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12130844593048096},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.11631661653518677},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08831587433815002},{"id":"https://openalex.org/C134132462","wikidata":"https://www.wikidata.org/wiki/Q45621","display_name":"Ceramic","level":2,"score":0.08495312929153442},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/drc46940.2019.9046463","is_oa":false,"landing_page_url":"https://doi.org/10.1109/drc46940.2019.9046463","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 Device Research Conference (DRC)","raw_type":"proceedings-article"},{"id":"pmh:oai:qucosa:de:qucosa:77564","is_oa":true,"landing_page_url":"https://tud.qucosa.de/id/qucosa%3A77564","pdf_url":null,"source":{"id":"https://openalex.org/S4377196312","display_name":"Qucosa (Saxon State and University Library Dresden)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I3132420320","host_organization_name":"SLUB Dresden","host_organization_lineage":["https://openalex.org/I3132420320"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"doc-type:Text"}],"best_oa_location":{"id":"pmh:oai:qucosa:de:qucosa:77564","is_oa":true,"landing_page_url":"https://tud.qucosa.de/id/qucosa%3A77564","pdf_url":null,"source":{"id":"https://openalex.org/S4377196312","display_name":"Qucosa (Saxon State and University Library Dresden)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I3132420320","host_organization_name":"SLUB Dresden","host_organization_lineage":["https://openalex.org/I3132420320"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"doc-type:Text"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8999999761581421}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1981729695","https://openalex.org/W2239925152","https://openalex.org/W2089106517","https://openalex.org/W2156096153","https://openalex.org/W2140786792","https://openalex.org/W334034697","https://openalex.org/W226386208","https://openalex.org/W1999169355","https://openalex.org/W2265722765","https://openalex.org/W4226089858"],"abstract_inverted_index":{"So":[0],"far,":[1],"only":[2],"CMOS":[3],"compatible":[4],"and":[5,25,55,63,79],"scalable":[6],"hafnia-zirconia":[7],"(HZO)":[8],"based":[9],"ferroelectric":[10,20],"(FE)":[11],"n-FeFETs":[12],"have":[13],"been":[14],"reported.":[15],"To":[16],"enable":[17],"the":[18,43,73,82,86],"full":[19],"hierarchy":[21],"[1]":[22],"both":[23],"p-":[24],"n-type":[26],"devices":[27,66],"should":[28],"be":[29,69],"available.":[30],"Here":[31],"we":[32,47],"report":[33],"a":[34,37],"p-FeFET":[35],"with":[36,54],"large":[38],"memory":[39],"window":[40],"(MW)":[41],"for":[42],"first":[44],"time.":[45],"Moreover,":[46],"propose":[48],"different":[49],"integration":[50],"schemes":[51],"comprising":[52],"structures":[53],"without":[56],"internal":[57],"gate":[58],"resulting":[59],"in":[60],"metal-FE-insulator-Si":[61],"(MFIS)":[62],"metal-FE-metal-insulator-Si":[64],"(MFMIS)":[65],"which":[67],"could":[68],"used":[70],"to":[71],"tackle":[72],"problem":[74],"of":[75,85],"interface":[76],"(IF)":[77],"degradation":[78],"possibly":[80],"decrease":[81],"power":[83],"consumption":[84],"devices.":[87]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":5}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}