{"id":"https://openalex.org/W2889474716","doi":"https://doi.org/10.1109/drc.2018.8442235","title":"A FeFET Based Processing-In-Memory Architecture for Solving Distributed Least-Square Optimizations","display_name":"A FeFET Based Processing-In-Memory Architecture for Solving Distributed Least-Square Optimizations","publication_year":2018,"publication_date":"2018-06-01","ids":{"openalex":"https://openalex.org/W2889474716","doi":"https://doi.org/10.1109/drc.2018.8442235","mag":"2889474716"},"language":"en","primary_location":{"id":"doi:10.1109/drc.2018.8442235","is_oa":false,"landing_page_url":"https://doi.org/10.1109/drc.2018.8442235","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 76th Device Research Conference (DRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009310657","display_name":"Insik Yoon","orcid":"https://orcid.org/0000-0003-4545-4404"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Insik Yoon","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078008152","display_name":"Muya Chang","orcid":"https://orcid.org/0000-0002-3035-1106"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Muya Chang","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075633314","display_name":"Kai Ni","orcid":"https://orcid.org/0000-0002-3628-3431"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kai Ni","raw_affiliation_strings":["University of Notre Dame, Notre Dame, IN, USA"],"affiliations":[{"raw_affiliation_string":"University of Notre Dame, Notre Dame, IN, USA","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024336276","display_name":"Matthew Jerry","orcid":"https://orcid.org/0000-0001-7220-1854"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew Jerry","raw_affiliation_strings":["University of Notre Dame, Notre Dame, IN, USA"],"affiliations":[{"raw_affiliation_string":"University of Notre Dame, Notre Dame, IN, USA","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078143248","display_name":"Samantak Gangopadhyay","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Samantak Gangopadhyay","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019613067","display_name":"Gus Henry Smith","orcid":"https://orcid.org/0000-0001-9754-233X"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gus Smith","raw_affiliation_strings":["Pennsylvania State University, State College, PA, USA"],"affiliations":[{"raw_affiliation_string":"Pennsylvania State University, State College, PA, USA","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034456714","display_name":"Tomer Hamam","orcid":"https://orcid.org/0000-0001-8703-7401"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tomer Hamam","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030308164","display_name":"V. Narayanan","orcid":null},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vijayakrishan Narayanan","raw_affiliation_strings":["Pennsylvania State University, State College, PA, USA"],"affiliations":[{"raw_affiliation_string":"Pennsylvania State University, State College, PA, USA","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041443633","display_name":"Justin Romberg","orcid":"https://orcid.org/0000-0002-6616-197X"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Justin Romberg","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113824454","display_name":"Shih\u2010Lien Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shih-Lien Lu","raw_affiliation_strings":["TSMC, Taiwan"],"affiliations":[{"raw_affiliation_string":"TSMC, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036105393","display_name":"Suman Datta","orcid":"https://orcid.org/0000-0001-6044-5173"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Suman Datta","raw_affiliation_strings":["University of Notre Dame, Notre Dame, IN, USA"],"affiliations":[{"raw_affiliation_string":"University of Notre Dame, Notre Dame, IN, USA","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091408102","display_name":"Arijit Raychowdhury","orcid":"https://orcid.org/0000-0001-8391-0576"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arijit Raychowdhury","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":12,"corresponding_author_ids":["https://openalex.org/A5009310657"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.2575,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.57087153,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/neuromorphic-engineering","display_name":"Neuromorphic engineering","score":0.7073079943656921},{"id":"https://openalex.org/keywords/ferroelectricity","display_name":"Ferroelectricity","score":0.6986024379730225},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.5491986274719238},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.540849506855011},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48793742060661316},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.34760719537734985},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3355260491371155},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2711176872253418},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2063615620136261},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18381857872009277},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.15921726822853088},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1522434651851654},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.07796582579612732}],"concepts":[{"id":"https://openalex.org/C151927369","wikidata":"https://www.wikidata.org/wiki/Q1981312","display_name":"Neuromorphic engineering","level":3,"score":0.7073079943656921},{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.6986024379730225},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.5491986274719238},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.540849506855011},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48793742060661316},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34760719537734985},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3355260491371155},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2711176872253418},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2063615620136261},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18381857872009277},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.15921726822853088},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1522434651851654},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.07796582579612732}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/drc.2018.8442235","is_oa":false,"landing_page_url":"https://doi.org/10.1109/drc.2018.8442235","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 76th Device Research Conference (DRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.4699999988079071,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2612563073"],"related_works":["https://openalex.org/W2986579802","https://openalex.org/W3108691306","https://openalex.org/W4389237622","https://openalex.org/W2166309310","https://openalex.org/W4385753159","https://openalex.org/W3013437739","https://openalex.org/W2166508075","https://openalex.org/W4376612721","https://openalex.org/W2109445684","https://openalex.org/W2081082331"],"abstract_inverted_index":{"HfO":[0,27,50],"<sub":[1,28,51],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[2,29,52],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[3,30,53],"based":[4,24],"ferroelectric":[5,25,49,73],"FET":[6],"(FeFET)":[7],"has":[8],"recently":[9],"received":[10],"great":[11],"interest":[12],"for":[13,37,63],"its":[14,84],"application":[15,85],"in":[16,90,131],"nonvolatile":[17],"memory":[18],"(NVM)":[19],"[1].":[20,65],"Unlike":[21],"conventional":[22],"perovskite":[23],"materials,":[26],"is":[31],"CMOS":[32,56],"compatible":[33],"and":[34,116],"retains":[35],"ferroelectricity":[36],"thin":[38],"film":[39],"with":[40,114],"thickness":[41],"around":[42],"10":[43],"nm.":[44],"Therefore,":[45],"successful":[46],"integration":[47],"of":[48,71,128],"into":[54],"advanced":[55],"technology":[57,60],"makes":[58],"this":[59,106,119],"highly":[61],"promising":[62],"NVM":[64],"Moreover,":[66],"by":[67],"tuning":[68],"the":[69],"portion":[70],"switched":[72],"domain,":[74],"a":[75,110,125],"FeFET":[76],"can":[77,120],"exhibit":[78],"multiple":[79],"intermediate":[80],"states,":[81],"which":[82],"enables":[83],"as":[86],"an":[87],"analog":[88],"conductance":[89],"mixed-signal":[91],"in-memory":[92],"computing.":[93],"Currently,":[94],"such":[95],"architectures":[96],"have":[97],"been":[98],"applied":[99],"to":[100,123],"neuromorphic":[101],"computing":[102],"[2],":[103],"[3].":[104],"In":[105],"paper,":[107],"we":[108],"present":[109],"processing-in-memory":[111],"(PIM)":[112],"architecture":[113],"FeFETs":[115],"demonstrate":[117],"how":[118],"be":[121],"used":[122],"solve":[124],"new":[126],"class":[127],"optimization":[129],"problems,":[130],"particular,":[132],"distributed":[133],"least":[134],"square":[135],"minimization.":[136]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}