{"id":"https://openalex.org/W2888946737","doi":"https://doi.org/10.1109/drc.2018.8442146","title":"Nanoscale Scanning Probe Thermometry of TaOe-based selector devices","display_name":"Nanoscale Scanning Probe Thermometry of TaOe-based selector devices","publication_year":2018,"publication_date":"2018-06-01","ids":{"openalex":"https://openalex.org/W2888946737","doi":"https://doi.org/10.1109/drc.2018.8442146","mag":"2888946737"},"language":"en","primary_location":{"id":"doi:10.1109/drc.2018.8442146","is_oa":false,"landing_page_url":"https://doi.org/10.1109/drc.2018.8442146","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 76th Device Research Conference (DRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062184648","display_name":"Dasheng Li","orcid":"https://orcid.org/0000-0002-9155-9699"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Dasheng Li","raw_affiliation_strings":["Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, USA"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020605946","display_name":"Georg Ramer","orcid":"https://orcid.org/0000-0001-8307-5435"},"institutions":[{"id":"https://openalex.org/I4210094722","display_name":"Center for Nanoscale Science and Technology","ror":"https://ror.org/00tbs6p91","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210094722"]},{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Georg Ramer","raw_affiliation_strings":["Center for Nanoscale Science and Technology, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"Center for Nanoscale Science and Technology, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210094722","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022010652","display_name":"Phoebe Yeoh","orcid":"https://orcid.org/0000-0002-6042-4820"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Phoebe Yeoh","raw_affiliation_strings":["Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, USA"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075444766","display_name":"Brian D. Hoskins","orcid":"https://orcid.org/0000-0002-9418-9291"},"institutions":[{"id":"https://openalex.org/I4210094722","display_name":"Center for Nanoscale Science and Technology","ror":"https://ror.org/00tbs6p91","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210094722"]},{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Brian Hoskins","raw_affiliation_strings":["Center for Nanoscale Science and Technology, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"Center for Nanoscale Science and Technology, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210094722","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103249498","display_name":"Yuanzhi Ma","orcid":"https://orcid.org/0000-0002-9901-7659"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuanzhi Ma","raw_affiliation_strings":["Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, USA"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050099355","display_name":"James A. Bain","orcid":"https://orcid.org/0000-0002-5355-5048"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James A. Bain","raw_affiliation_strings":["Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, USA"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071798287","display_name":"Andrea Centrone","orcid":"https://orcid.org/0000-0002-2919-3366"},"institutions":[{"id":"https://openalex.org/I4210094722","display_name":"Center for Nanoscale Science and Technology","ror":"https://ror.org/00tbs6p91","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210094722"]},{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrea Centrone","raw_affiliation_strings":["Center for Nanoscale Science and Technology, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"Center for Nanoscale Science and Technology, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I4210094722","https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072234152","display_name":"Marek Skowro\u0144ski","orcid":"https://orcid.org/0000-0002-2087-0068"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Marek Skowronski","raw_affiliation_strings":["Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, USA"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, 5000 Forbes Ave, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5062184648"],"corresponding_institution_ids":["https://openalex.org/I74973139"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.08186234,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"9","issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11948","display_name":"Machine Learning in Materials Science","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/joule-heating","display_name":"Joule heating","score":0.7565850615501404},{"id":"https://openalex.org/keywords/scanning-thermal-microscopy","display_name":"Scanning thermal microscopy","score":0.7328077554702759},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.6933575868606567},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6388841271400452},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5145787596702576},{"id":"https://openalex.org/keywords/nanoscopic-scale","display_name":"Nanoscopic scale","score":0.48996248841285706},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.4879398047924042},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.47171658277511597},{"id":"https://openalex.org/keywords/scanning-probe-microscopy","display_name":"Scanning probe microscopy","score":0.459652841091156},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4332851469516754},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39277756214141846},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.3522202968597412},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34362584352493286},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24403950572013855},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16465452313423157},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09789547324180603}],"concepts":[{"id":"https://openalex.org/C117926987","wikidata":"https://www.wikidata.org/wiki/Q210009","display_name":"Joule heating","level":2,"score":0.7565850615501404},{"id":"https://openalex.org/C2776907800","wikidata":"https://www.wikidata.org/wiki/Q9357421","display_name":"Scanning thermal microscopy","level":3,"score":0.7328077554702759},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.6933575868606567},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6388841271400452},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5145787596702576},{"id":"https://openalex.org/C45206210","wikidata":"https://www.wikidata.org/wiki/Q2415817","display_name":"Nanoscopic scale","level":2,"score":0.48996248841285706},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.4879398047924042},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.47171658277511597},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.459652841091156},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4332851469516754},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39277756214141846},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3522202968597412},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34362584352493286},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24403950572013855},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16465452313423157},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09789547324180603},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/drc.2018.8442146","is_oa":false,"landing_page_url":"https://doi.org/10.1109/drc.2018.8442146","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 76th Device Research Conference (DRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1483703457","https://openalex.org/W2599797425"],"related_works":["https://openalex.org/W1994241387","https://openalex.org/W2798982538","https://openalex.org/W2043834238","https://openalex.org/W2117533110","https://openalex.org/W2145473745","https://openalex.org/W2752641282","https://openalex.org/W2291664615","https://openalex.org/W2797943982","https://openalex.org/W2393084480","https://openalex.org/W1991428352"],"abstract_inverted_index":{"Crosspoint":[0],"memory":[1],"arrays":[2],"suffer":[3],"from":[4],"the":[5,36,40,46,86,97,100,103,109,135,140],"sneak":[6],"path":[7],"problem,":[8],"which":[9],"may":[10],"cause":[11],"read":[12],"failures":[13],"and":[14,64,102,117],"increase":[15],"power":[16],"consumption":[17],"[1].":[18],"The":[19],"high":[20,126],"nonlinearity":[21],"of":[22,48,99,112,158],"threshold":[23,49,159],"switching":[24,160],"devices":[25],"makes":[26],"them":[27],"an":[28],"ideal":[29],"candidate":[30],"for":[31,153],"selector":[32,145],"device":[33,87],"to":[34,81,132,139],"suppress":[35],"leakage":[37],"current":[38,83],"in":[39,51,58,143],"one":[41],"selector/one":[42],"resistor":[43],"architecture.":[44],"However,":[45],"mechanism":[47],"switching,":[50],"particular":[52],"Negative":[53],"Differential":[54],"Resistance":[55],"(NDR)":[56],"behavior":[57],"oxide":[59],"materials":[60],"such":[61],"as":[62],"TaOx":[63],"NlrO;":[65],"is":[66,73,92],"still":[67],"under":[68],"debate.":[69],"A":[70],"leading":[71],"hypothesis":[72],"Joule-heating-induced":[74],"thermal":[75,114],"runaway":[76],"[2]":[77],"producing":[78],"NDR":[79,141],"due":[80],"spontaneous":[82],"localization":[84],"within":[85,105],"region.":[88],"So":[89],"far,":[90],"there":[91],"no":[93],"experimental":[94,148],"data":[95],"on":[96],"size":[98],"constriction":[101],"temperature":[104,136],"it.":[106],"We":[107],"demonstrate":[108],"first":[110],"use":[111],"scanning":[113,118],"microscopy":[115,122],"(SThM)":[116],"joule":[119],"heating":[120],"expansion":[121],"(SJEM),":[123],"two":[124],"AFM-based":[125],"spatial":[127],"resolution":[128],"in-situ":[129],"characterization":[130],"methods":[131],"directly":[133],"measure":[134],"distribution":[137],"up":[138],"region":[142],"TaOx-based":[144],"devices.":[146,161],"These":[147],"results":[149],"are":[150],"essential":[151],"information":[152],"developing":[154],"accurate":[155],"numerical":[156],"modeling":[157]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}