{"id":"https://openalex.org/W2909281424","doi":"https://doi.org/10.1109/dicta.2018.8615803","title":"Approach for Process Control in Additive Manufacturing Through Layer-Wise Analysis with 3-Dimensional Pointcloud Information","display_name":"Approach for Process Control in Additive Manufacturing Through Layer-Wise Analysis with 3-Dimensional Pointcloud Information","publication_year":2018,"publication_date":"2018-12-01","ids":{"openalex":"https://openalex.org/W2909281424","doi":"https://doi.org/10.1109/dicta.2018.8615803","mag":"2909281424"},"language":"en","primary_location":{"id":"doi:10.1109/dicta.2018.8615803","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dicta.2018.8615803","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Digital Image Computing: Techniques and Applications (DICTA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034061292","display_name":"Marc Prei\u00dfler","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Marc Preissler","raw_affiliation_strings":["Technische Universitat Ilmenau, Ilmenau, Th\u00c3\u00bcringen, DE","Technische Universitat Ilmenau, Ilmenau, Th\u00fcringen, DE"],"affiliations":[{"raw_affiliation_string":"Technische Universitat Ilmenau, Ilmenau, Th\u00c3\u00bcringen, DE","institution_ids":[]},{"raw_affiliation_string":"Technische Universitat Ilmenau, Ilmenau, Th\u00fcringen, DE","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100374188","display_name":"Chen Zhang","orcid":"https://orcid.org/0000-0003-4181-6113"},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Chen Zhang","raw_affiliation_strings":["Faculty of Mechanical Engineering, Universit\u00e4t Ilmenau, Ilmenau, Germany"],"affiliations":[{"raw_affiliation_string":"Faculty of Mechanical Engineering, Universit\u00e4t Ilmenau, Ilmenau, Germany","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042928376","display_name":"Maik Rosenberger","orcid":"https://orcid.org/0009-0002-4577-7369"},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Maik Rosenberger","raw_affiliation_strings":["Faculty of Mechanical Engineering, Universit\u00e4t Ilmenau, Ilmenau, Germany"],"affiliations":[{"raw_affiliation_string":"Faculty of Mechanical Engineering, Universit\u00e4t Ilmenau, Ilmenau, Germany","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003178241","display_name":"Gunther Notni","orcid":"https://orcid.org/0000-0001-7532-1560"},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Gunther Notni","raw_affiliation_strings":["Faculty of Mechanical Engineering, Universit\u00e4t Ilmenau, Ilmenau, Germany"],"affiliations":[{"raw_affiliation_string":"Faculty of Mechanical Engineering, Universit\u00e4t Ilmenau, Ilmenau, Germany","institution_ids":["https://openalex.org/I119449181"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5034061292"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5223,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.72168752,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/slicing","display_name":"Slicing","score":0.6785990595817566},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6195124387741089},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.568875253200531},{"id":"https://openalex.org/keywords/manufacturing-execution-system","display_name":"Manufacturing execution system","score":0.4972429573535919},{"id":"https://openalex.org/keywords/computer-integrated-manufacturing","display_name":"Computer-integrated manufacturing","score":0.4874560832977295},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.4661121964454651},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.45325997471809387},{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.4189443588256836},{"id":"https://openalex.org/keywords/computer-aided-manufacturing","display_name":"Computer-aided manufacturing","score":0.41407260298728943},{"id":"https://openalex.org/keywords/numerical-control","display_name":"Numerical control","score":0.4126884937286377},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.4063272476196289},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.3544688820838928},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2413540482521057},{"id":"https://openalex.org/keywords/cad","display_name":"CAD","score":0.22369158267974854},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.17541417479515076},{"id":"https://openalex.org/keywords/machining","display_name":"Machining","score":0.12713640928268433},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.10301575064659119}],"concepts":[{"id":"https://openalex.org/C2776190703","wikidata":"https://www.wikidata.org/wiki/Q488148","display_name":"Slicing","level":2,"score":0.6785990595817566},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6195124387741089},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.568875253200531},{"id":"https://openalex.org/C7923174","wikidata":"https://www.wikidata.org/wiki/Q1404943","display_name":"Manufacturing execution system","level":3,"score":0.4972429573535919},{"id":"https://openalex.org/C53688548","wikidata":"https://www.wikidata.org/wiki/Q1122190","display_name":"Computer-integrated manufacturing","level":2,"score":0.4874560832977295},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.4661121964454651},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.45325997471809387},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.4189443588256836},{"id":"https://openalex.org/C180539650","wikidata":"https://www.wikidata.org/wiki/Q660192","display_name":"Computer-aided manufacturing","level":3,"score":0.41407260298728943},{"id":"https://openalex.org/C175457265","wikidata":"https://www.wikidata.org/wiki/Q190247","display_name":"Numerical control","level":3,"score":0.4126884937286377},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.4063272476196289},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.3544688820838928},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2413540482521057},{"id":"https://openalex.org/C194789388","wikidata":"https://www.wikidata.org/wiki/Q17855283","display_name":"CAD","level":2,"score":0.22369158267974854},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.17541417479515076},{"id":"https://openalex.org/C523214423","wikidata":"https://www.wikidata.org/wiki/Q192047","display_name":"Machining","level":2,"score":0.12713640928268433},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.10301575064659119},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dicta.2018.8615803","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dicta.2018.8615803","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Digital Image Computing: Techniques and Applications (DICTA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2046434485","https://openalex.org/W2061768597","https://openalex.org/W2167667767","https://openalex.org/W2260824098","https://openalex.org/W2288175082","https://openalex.org/W2522795694","https://openalex.org/W2522964491","https://openalex.org/W2564280279","https://openalex.org/W2566407469","https://openalex.org/W2733225429","https://openalex.org/W6727328129","https://openalex.org/W6741385811"],"related_works":["https://openalex.org/W2154320603","https://openalex.org/W3211866385","https://openalex.org/W2152072926","https://openalex.org/W2118036488","https://openalex.org/W2026244994","https://openalex.org/W3149429649","https://openalex.org/W2807405351","https://openalex.org/W2027498518","https://openalex.org/W615507710","https://openalex.org/W2011761787"],"abstract_inverted_index":{"This":[0,53],"work":[1],"presents":[2],"a":[3,56,133,153,174,180,187],"suitable":[4],"solution":[5],"for":[6,25,111,120,132,193],"capturing":[7],"process":[8,36],"data":[9],"of":[10,32,47,103,135,168],"an":[11,33],"additive":[12,34,48,113,122],"manufacturing":[13,27,35,41,49,114,123,149],"process.":[14],"Process":[15],"control":[16],"is":[17,51,85,94,100,108,127,184,191],"necessary":[18,110],"to":[19,173],"increase":[20],"the":[21,45,74,82,88,101,104,118,121,136,147,156,162,166,169],"productivity":[22],"and":[23,43,81,116,151,165,186],"acceptance":[24],"these":[26],"techniques.":[28],"Wrong":[29],"adjusted":[30],"parameters":[31],"may":[37],"cause":[38],"in":[39,129],"inaccurate":[40],"results":[42],"therefore":[44],"potential":[46],"methods":[50],"underestimated.":[52],"approach":[54,131],"uses":[55],"modified":[57],"Fused":[58],"Filament":[59],"Fabrication":[60],"system":[61,69,190],"with":[62,87,155],"integrated":[63],"image":[64],"sensors.":[65],"The":[66,97,125,142],"stereoscopic":[67],"camera":[68],"captures":[70],"3d":[71,158],"information":[72],"about":[73],"object":[75,138,145],"after":[76],"every":[77,112],"finished":[78],"manufactured":[79],"layers":[80],"originated":[83],"pointcloud":[84],"compared":[86],"previously":[89],"generated":[90],"path":[91,98],"planning,":[92],"which":[93,107],"called":[95],"G-code.":[96],"planning":[99],"result":[102],"slicing":[105],"process,":[106,115],"absolutely":[109],"describes":[117],"movements":[119],"machine.":[124],"G-code":[126,163],"used":[128,192],"this":[130,178],"reconstruction":[134],"complete":[137],"layer":[139],"by":[140],"layer.":[141],"virtual":[143],"reconstructed":[144],"represents":[146],"ideal":[148],"form":[150],"provides":[152],"comparing":[154],"captured":[157],"information.":[159],"Challenges":[160],"are":[161],"interpreting":[164],"transformation":[167,182],"Cartesian":[170],"coordinate":[171],"systems":[172],"reference":[175,188],"system.":[176],"For":[177],"purpose":[179],"special":[181],"target":[183],"developed":[185],"measurement":[189],"evaluation.":[194]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2026-01-13T01:12:25.745995","created_date":"2025-10-10T00:00:00"}