{"id":"https://openalex.org/W2162461638","doi":"https://doi.org/10.1109/dftvs.2003.1250145","title":"Redundancy, repair, and test features of a 90nm embedded SRAM generator","display_name":"Redundancy, repair, and test features of a 90nm embedded SRAM generator","publication_year":2004,"publication_date":"2004-03-02","ids":{"openalex":"https://openalex.org/W2162461638","doi":"https://doi.org/10.1109/dftvs.2003.1250145","mag":"2162461638"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2003.1250145","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250145","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110751786","display_name":"Robert Aitken","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"R. Aitken","raw_affiliation_strings":["Artisan Components, Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Artisan Components, Sunnyvale, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048332345","display_name":"N. Dogra","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"N. Dogra","raw_affiliation_strings":["Artisan Components, Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Artisan Components, Sunnyvale, CA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059396749","display_name":"D. R. Gandhi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Gandhi","raw_affiliation_strings":["Artisan Components, Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Artisan Components, Sunnyvale, CA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086042756","display_name":"Stephen Becker","orcid":"https://orcid.org/0000-0002-1932-8159"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Becker","raw_affiliation_strings":["Artisan Components, Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Artisan Components, Sunnyvale, CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5110751786"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5798,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.83439906,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"467","last_page":"474"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7874316573143005},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7149150371551514},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6886714696884155},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6850789189338684},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6326572299003601},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.5548040270805359},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4782765805721283},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4356088936328888},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.33598631620407104},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.31630739569664},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1957099735736847},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09266456961631775}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7874316573143005},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7149150371551514},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6886714696884155},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6850789189338684},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6326572299003601},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.5548040270805359},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4782765805721283},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4356088936328888},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.33598631620407104},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.31630739569664},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1957099735736847},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09266456961631775},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dftvs.2003.1250145","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250145","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.47999998927116394,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W289624287","https://openalex.org/W1580083564","https://openalex.org/W1856950047","https://openalex.org/W1871734022","https://openalex.org/W1922918362","https://openalex.org/W2021708499","https://openalex.org/W2038799143","https://openalex.org/W2089034049","https://openalex.org/W2106935654","https://openalex.org/W2149902802","https://openalex.org/W2151824694","https://openalex.org/W2170576324","https://openalex.org/W4256124496","https://openalex.org/W6813948591"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2164349885","https://openalex.org/W2118697956"],"abstract_inverted_index":{"Today's":[0],"system":[1],"on":[2],"chip":[3],"(SoC)":[4],"designs":[5],"can":[6],"use":[7],"hundreds":[8],"of":[9,13,26,46,58],"embedded":[10,60],"memories.":[11,66],"Most":[12],"these":[14],"are":[15,49,54],"created":[16],"by":[17],"automated":[18],"generators,":[19],"which":[20],"must":[21],"produce":[22],"a":[23],"wide":[24],"variety":[25],"configurations":[27],"while":[28],"retaining":[29],"essential":[30],"capabilities":[31],"in":[32,43,55],"area,":[33],"performance,":[34],"power":[35],"and":[36,40],"testability.":[37],"Redundancy,":[38],"repair,":[39],"test":[41],"issues":[42],"the":[44,56],"context":[45,57],"memory":[47],"generators":[48],"more":[50],"complex":[51],"than":[52],"they":[53],"individual":[59],"memories,":[61],"or":[62],"even":[63],"internally":[64],"developed":[65]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}