{"id":"https://openalex.org/W2126494669","doi":"https://doi.org/10.1109/dftvs.2003.1250136","title":"Regressive testing for system-on-chip with unknown-good-yield","display_name":"Regressive testing for system-on-chip with unknown-good-yield","publication_year":2004,"publication_date":"2004-03-01","ids":{"openalex":"https://openalex.org/W2126494669","doi":"https://doi.org/10.1109/dftvs.2003.1250136","mag":"2126494669"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2003.1250136","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250136","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084284151","display_name":"N.-J. Park","orcid":null},"institutions":[{"id":"https://openalex.org/I115475287","display_name":"Oklahoma State University","ror":"https://ror.org/01g9vbr38","country_code":"US","type":"education","lineage":["https://openalex.org/I115475287"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"N.-J. Park","raw_affiliation_strings":["Dept. of Computer Science, Oklahoma State University, Stillwater, OK, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science, Oklahoma State University, Stillwater, OK, USA","institution_ids":["https://openalex.org/I115475287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082805056","display_name":"B. Jin","orcid":null},"institutions":[{"id":"https://openalex.org/I115475287","display_name":"Oklahoma State University","ror":"https://ror.org/01g9vbr38","country_code":"US","type":"education","lineage":["https://openalex.org/I115475287"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Jin","raw_affiliation_strings":["Dept. of Computer Science, Oklahoma State University, Stillwater, OK, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science, Oklahoma State University, Stillwater, OK, USA","institution_ids":["https://openalex.org/I115475287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051336430","display_name":"K. M. George","orcid":"https://orcid.org/0000-0002-7391-2444"},"institutions":[{"id":"https://openalex.org/I115475287","display_name":"Oklahoma State University","ror":"https://ror.org/01g9vbr38","country_code":"US","type":"education","lineage":["https://openalex.org/I115475287"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.M. George","raw_affiliation_strings":["Dept. of Computer Science, Oklahoma State University, Stillwater, OK, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science, Oklahoma State University, Stillwater, OK, USA","institution_ids":["https://openalex.org/I115475287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112970883","display_name":"N. Park","orcid":"https://orcid.org/0009-0000-0825-402X"},"institutions":[{"id":"https://openalex.org/I115475287","display_name":"Oklahoma State University","ror":"https://ror.org/01g9vbr38","country_code":"US","type":"education","lineage":["https://openalex.org/I115475287"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Park","raw_affiliation_strings":["Dept. of Computer Science, Oklahoma State University, Stillwater, OK, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science, Oklahoma State University, Stillwater, OK, USA","institution_ids":["https://openalex.org/I115475287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102967917","display_name":"Minsu Choi","orcid":"https://orcid.org/0000-0002-9104-0563"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Choi","raw_affiliation_strings":["Dept of ECE, University of Missouri-Rolla, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"Dept of ECE, University of Missouri-Rolla, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5084284151"],"corresponding_institution_ids":["https://openalex.org/I115475287"],"apc_list":null,"apc_paid":null,"fwci":0.2633,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.57627561,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"393","last_page":"400"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5500631332397461},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5229430794715881},{"id":"https://openalex.org/keywords/a-priori-and-a-posteriori","display_name":"A priori and a posteriori","score":0.5069263577461243},{"id":"https://openalex.org/keywords/orthogonal-array-testing","display_name":"Orthogonal array testing","score":0.47945085167884827},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4750371277332306},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.46264374256134033},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.44848549365997314},{"id":"https://openalex.org/keywords/time-to-market","display_name":"Time to market","score":0.44799959659576416},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23320189118385315},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.13077062368392944}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5500631332397461},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5229430794715881},{"id":"https://openalex.org/C75553542","wikidata":"https://www.wikidata.org/wiki/Q178161","display_name":"A priori and a posteriori","level":2,"score":0.5069263577461243},{"id":"https://openalex.org/C158324730","wikidata":"https://www.wikidata.org/wiki/Q54862604","display_name":"Orthogonal array testing","level":5,"score":0.47945085167884827},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4750371277332306},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.46264374256134033},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.44848549365997314},{"id":"https://openalex.org/C2779229675","wikidata":"https://www.wikidata.org/wiki/Q445235","display_name":"Time to market","level":2,"score":0.44799959659576416},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23320189118385315},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.13077062368392944},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dftvs.2003.1250136","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250136","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.46000000834465027,"id":"https://metadata.un.org/sdg/15","display_name":"Life in Land"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1490131343","https://openalex.org/W1535549764","https://openalex.org/W1585307141","https://openalex.org/W1826453968","https://openalex.org/W1974648312","https://openalex.org/W1988192422","https://openalex.org/W1992897439","https://openalex.org/W2034183584","https://openalex.org/W2061034951","https://openalex.org/W2065734112","https://openalex.org/W2069687969","https://openalex.org/W2079493703","https://openalex.org/W2084787043","https://openalex.org/W2101025877","https://openalex.org/W2102559735","https://openalex.org/W2104428548","https://openalex.org/W2107262883","https://openalex.org/W2122036290","https://openalex.org/W2128861023","https://openalex.org/W2130106145","https://openalex.org/W2133222590","https://openalex.org/W2135456873","https://openalex.org/W2140179946","https://openalex.org/W2151103616","https://openalex.org/W2157453228","https://openalex.org/W2159226721","https://openalex.org/W2163427909","https://openalex.org/W2170549846","https://openalex.org/W2324992469","https://openalex.org/W2797464048","https://openalex.org/W4210823707","https://openalex.org/W4211119507","https://openalex.org/W6648378535","https://openalex.org/W6678414861","https://openalex.org/W6679936675","https://openalex.org/W6845883598","https://openalex.org/W7043087404"],"related_works":["https://openalex.org/W4388311650","https://openalex.org/W5922282","https://openalex.org/W1974056099","https://openalex.org/W4245343541","https://openalex.org/W2386077341","https://openalex.org/W563589758","https://openalex.org/W62490179","https://openalex.org/W2954004777","https://openalex.org/W2949638731","https://openalex.org/W2951102138"],"abstract_inverted_index":{"This":[0,14],"paper":[1,34,171],"presents":[2],"a":[3,66,105,134],"testing":[4,64,117,161,167,231],"method":[5,122,137,174,201],"for":[6,69,123],"electronic":[7,85],"devices":[8,86],"with":[9,41,55,91,206,228],"no":[10,56],"a-priori":[11],"yield":[12,72,205],"information.":[13],"problem":[15,26],"is":[16,30,50,65,104,214],"referred":[17,163],"to":[18,107,119,129,149,164,179,191,202,208,216],"as":[19,35,88,120,165,180],"the":[20,71,74,77,108,151,155,189,198,204,218,223],"unknown-good-yield":[21],"(UKGY)":[22],"problem.":[23],"The":[24,159],"UKGY":[25,186],"of":[27,48,73,110,154,157,222],"systems-on-chip":[28],"(SoC)":[29],"discussed":[31],"in":[32,38,81,132,169,226],"this":[33,130,170],"SoCs":[36,89],"are":[37],"general":[39],"built":[40,90],"embedded":[42],"intellectual":[43],"property":[44],"(IP)":[45],"cores,":[46],"each":[47],"which":[49,133],"procured":[51],"from":[52,185],"IP":[53],"providers":[54],"information":[57],"on":[58,141],"known-good-yield":[59],"(KGY).":[60],"In":[61],"general,":[62],"partial":[63],"practical":[67],"choice":[68],"assuring":[70],"product":[75],"under":[76],"stringent":[78],"time-to-market":[79],"requirement":[80],"today's":[82],"high":[83,111],"density/complexity":[84],"such":[87],"deep":[92],"submicron":[93],"or":[94],"nano":[95],"technology.":[96],"Therefore,":[97],"an":[98,145],"efficient":[99],"and":[100,144,193,196,220],"effective":[101],"sampling":[102,136],"technique":[103,148],"key":[106],"success":[109],"confidence":[112,152,209],"testing.":[113],"An":[114],"experimental":[115,146],"characterization-based":[116],"(referred":[118,178],"ET)":[121],"SoC":[124],"has":[125],"been":[126],"proposed":[127,160,224],"prior":[128],"work,":[131],"stratified":[135],"was":[138],"employed":[139],"based":[140],"environmental-based":[142],"characterization":[143],"design":[147],"enhance":[150],"level":[153],"estimation":[156],"yield.":[158],"method,":[162],"regressive":[166],"(RegT),":[168],"exploits":[172],"another":[173],"by":[175],"using":[176],"parameters":[177],"assistant":[181],"variables":[182],"(AV))":[183],"free":[184],"that":[187],"determines":[188],"criteria":[190],"sample":[192],"test":[194],"SoCs,":[195],"employs":[197],"regression":[199],"analysis":[200],"evaluate":[203],"regard":[207],"interval.":[210],"A":[211],"numerical":[212],"simulation":[213],"conducted":[215],"demonstrate":[217],"efficiency":[219],"effectiveness":[221],"RegT":[225],"comparison":[227],"generic":[229],"random":[230],"method.":[232]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}