{"id":"https://openalex.org/W2123615075","doi":"https://doi.org/10.1109/dftvs.2003.1250134","title":"Efficiency of transient bit-flips detection by software means: a complete study","display_name":"Efficiency of transient bit-flips detection by software means: a complete study","publication_year":2004,"publication_date":"2004-03-01","ids":{"openalex":"https://openalex.org/W2123615075","doi":"https://doi.org/10.1109/dftvs.2003.1250134","mag":"2123615075"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2003.1250134","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250134","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006678765","display_name":"Basarab Nicolescu","orcid":"https://orcid.org/0000-0002-2613-9903"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"B. Nicolescu","raw_affiliation_strings":["Circuit Qualification research group, TIMA Laboratory, Grenoble, France","TIMA Lab., Grenoble, France"],"affiliations":[{"raw_affiliation_string":"Circuit Qualification research group, TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA Lab., Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111579489","display_name":"P. Peronnard","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Peronnard","raw_affiliation_strings":["Circuit Qualification research group, TIMA Laboratory, Grenoble, France","TIMA Lab., Grenoble, France"],"affiliations":[{"raw_affiliation_string":"Circuit Qualification research group, TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA Lab., Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112232081","display_name":"R. Velazco","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"R. Velazco","raw_affiliation_strings":["Circuit Qualification research group, TIMA Laboratory, Grenoble, France","TIMA Lab., Grenoble, France"],"affiliations":[{"raw_affiliation_string":"Circuit Qualification research group, TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA Lab., Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110071705","display_name":"Y. Savaria","orcid":null},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Y. Savaria","raw_affiliation_strings":["Ecole Polytechnique de Montr\u00e8al, Montreal, QUE, Canada","Ecole Polytechnique de Montr\u00e9al,"],"affiliations":[{"raw_affiliation_string":"Ecole Polytechnique de Montr\u00e8al, Montreal, QUE, Canada","institution_ids":["https://openalex.org/I45683168"]},{"raw_affiliation_string":"Ecole Polytechnique de Montr\u00e9al,","institution_ids":["https://openalex.org/I45683168"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5006678765"],"corresponding_institution_ids":["https://openalex.org/I4210087012"],"apc_list":null,"apc_paid":null,"fwci":0.6739,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.7336109,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"377","last_page":"384"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.7615565061569214},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.6991215944290161},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6885107755661011},{"id":"https://openalex.org/keywords/digital-signal-processor","display_name":"Digital signal processor","score":0.6332988739013672},{"id":"https://openalex.org/keywords/8-bit","display_name":"8-bit","score":0.6049448847770691},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.5852312445640564},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5777908563613892},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5511181950569153},{"id":"https://openalex.org/keywords/16-bit","display_name":"16-bit","score":0.5459247827529907},{"id":"https://openalex.org/keywords/32-bit","display_name":"32-bit","score":0.5226064324378967},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.515445351600647},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4925747513771057},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.447699636220932},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.42753350734710693},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.42332953214645386},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3906056880950928},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36928242444992065},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19840869307518005},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08850473165512085},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08137473464012146}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.7615565061569214},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.6991215944290161},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6885107755661011},{"id":"https://openalex.org/C161611012","wikidata":"https://www.wikidata.org/wiki/Q106370","display_name":"Digital signal processor","level":3,"score":0.6332988739013672},{"id":"https://openalex.org/C187919765","wikidata":"https://www.wikidata.org/wiki/Q270159","display_name":"8-bit","level":2,"score":0.6049448847770691},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.5852312445640564},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5777908563613892},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5511181950569153},{"id":"https://openalex.org/C33652231","wikidata":"https://www.wikidata.org/wiki/Q194368","display_name":"16-bit","level":2,"score":0.5459247827529907},{"id":"https://openalex.org/C75695347","wikidata":"https://www.wikidata.org/wiki/Q225147","display_name":"32-bit","level":2,"score":0.5226064324378967},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.515445351600647},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4925747513771057},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.447699636220932},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.42753350734710693},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.42332953214645386},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3906056880950928},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36928242444992065},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19840869307518005},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08850473165512085},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08137473464012146},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/dftvs.2003.1250134","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250134","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00008193v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00008193","pdf_url":null,"source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"18th-IEEE-International-Symposium-on-Defect-and-Fault-Tolerance-in-VLSI-Systems, 2003, France. pp.377-384, ⟨10.1109/DFTVS.2003.1250134⟩","raw_type":"Conference papers"},{"id":"pmh:oai:publications.polymtl.ca:25616","is_oa":false,"landing_page_url":"https://publications.polymtl.ca/25616/","pdf_url":null,"source":{"id":"https://openalex.org/S4306401013","display_name":"PolyPublie (\u00c9cole Polytechnique de Montr\u00e9al)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I45683168","host_organization_name":"Polytechnique Montr\u00e9al","host_organization_lineage":["https://openalex.org/I45683168"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Communication de conf\u00e9rence"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1540206583","https://openalex.org/W1779869888","https://openalex.org/W2011379307","https://openalex.org/W2083613288","https://openalex.org/W2127697761","https://openalex.org/W2129360963","https://openalex.org/W2133201251","https://openalex.org/W2145930995","https://openalex.org/W2149394641","https://openalex.org/W2162203608","https://openalex.org/W2538215706","https://openalex.org/W2543233901","https://openalex.org/W3035757797","https://openalex.org/W4253910316","https://openalex.org/W4255421333","https://openalex.org/W4298230907","https://openalex.org/W6678038256","https://openalex.org/W6728672645","https://openalex.org/W6728719029"],"related_works":["https://openalex.org/W1526136018","https://openalex.org/W3022308231","https://openalex.org/W2107415779","https://openalex.org/W2046700619","https://openalex.org/W975020229","https://openalex.org/W2389022694","https://openalex.org/W68288496","https://openalex.org/W2121136872","https://openalex.org/W622629732","https://openalex.org/W134950222"],"abstract_inverted_index":{"This-paper":[0],"characterizes":[1],"the":[2,15,48,51],"effectiveness":[3],"of":[4,50],"an":[5,41],"error":[6],"detection":[7],"technique":[8],"that":[9],"addresses":[10],"transient":[11],"faults":[12],"induced":[13],"by":[14],"environment":[16],"(radiation,":[17],"EMC)":[18],"in":[19],"processor-based":[20],"architectures.":[21],"Experimental":[22],"results":[23],"obtained":[24],"from":[25],"fault":[26],"injection":[27],"sessions":[28],"performed":[29],"on":[30],"two":[31],"platforms":[32],"built":[33],"around":[34],"a":[35],"32-bit":[36],"digital":[37],"signal":[38],"processor":[39],"and":[40],"8-bit":[42],"microcontroller,":[43],"provide":[44],"objective":[45],"figures":[46],"about":[47],"efficiency":[49],"proposed":[52],"approach.":[53]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-03-28T08:17:26.163206","created_date":"2025-10-10T00:00:00"}