{"id":"https://openalex.org/W2147670587","doi":"https://doi.org/10.1109/dftvs.2003.1250121","title":"View from the bottom: nanometer technology AC parametric failures - why, where, and how to detect","display_name":"View from the bottom: nanometer technology AC parametric failures - why, where, and how to detect","publication_year":2004,"publication_date":"2004-03-02","ids":{"openalex":"https://openalex.org/W2147670587","doi":"https://doi.org/10.1109/dftvs.2003.1250121","mag":"2147670587"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2003.1250121","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250121","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111892655","display_name":"C.F. Hawkins","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]},{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]},{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES","US"],"is_corresponding":false,"raw_author_name":"C. Hawkins","raw_affiliation_strings":["University of Balearic Islands, Spain","University of New Mexico, Intel Corporation, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Balearic Islands, Spain","institution_ids":["https://openalex.org/I50441567"]},{"raw_affiliation_string":"University of New Mexico, Intel Corporation, USA","institution_ids":["https://openalex.org/I1343180700","https://openalex.org/I169521973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103040522","display_name":"A. Keshavarzi","orcid":"https://orcid.org/0000-0001-6938-1161"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]},{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]},{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES","US"],"is_corresponding":false,"raw_author_name":"A. Keshavarzi","raw_affiliation_strings":["University of Balearic Islands, Spain","University of New Mexico, Intel Corporation, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Balearic Islands, Spain","institution_ids":["https://openalex.org/I50441567"]},{"raw_affiliation_string":"University of New Mexico, Intel Corporation, USA","institution_ids":["https://openalex.org/I1343180700","https://openalex.org/I169521973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077705720","display_name":"J. Segura","orcid":"https://orcid.org/0000-0001-9742-2936"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]},{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]},{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES","US"],"is_corresponding":false,"raw_author_name":"J. Segura","raw_affiliation_strings":["University of Balearic Islands, Spain","University of New Mexico, Intel Corporation, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Balearic Islands, Spain","institution_ids":["https://openalex.org/I50441567"]},{"raw_affiliation_string":"University of New Mexico, Intel Corporation, USA","institution_ids":["https://openalex.org/I1343180700","https://openalex.org/I169521973"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"267","last_page":"276"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.718859076499939},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6071667075157166},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5106669068336487},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.46125471591949463},{"id":"https://openalex.org/keywords/worry","display_name":"Worry","score":0.45222029089927673},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4497983157634735},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.4265786409378052},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3278225362300873},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1925811767578125},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11334767937660217},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09689828753471375}],"concepts":[{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.718859076499939},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6071667075157166},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5106669068336487},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.46125471591949463},{"id":"https://openalex.org/C2779978724","wikidata":"https://www.wikidata.org/wiki/Q1436482","display_name":"Worry","level":3,"score":0.45222029089927673},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4497983157634735},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.4265786409378052},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3278225362300873},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1925811767578125},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11334767937660217},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09689828753471375},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C118552586","wikidata":"https://www.wikidata.org/wiki/Q7867","display_name":"Psychiatry","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C558461103","wikidata":"https://www.wikidata.org/wiki/Q154430","display_name":"Anxiety","level":2,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dftvs.2003.1250121","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250121","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/15","score":0.5899999737739563,"display_name":"Life in Land"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320323737","display_name":"Ministerio de Ciencia y Tecnolog\u00eda","ror":"https://ror.org/034900433"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W164528542","https://openalex.org/W1488870485","https://openalex.org/W1491093261","https://openalex.org/W1590379908","https://openalex.org/W1704018133","https://openalex.org/W1712958038","https://openalex.org/W1880721252","https://openalex.org/W1955440229","https://openalex.org/W1958753241","https://openalex.org/W1959988141","https://openalex.org/W1990297261","https://openalex.org/W1991507700","https://openalex.org/W1994356874","https://openalex.org/W2107566947","https://openalex.org/W2118567051","https://openalex.org/W2121190650","https://openalex.org/W2129212061","https://openalex.org/W2133355890","https://openalex.org/W2135517221","https://openalex.org/W2143901474","https://openalex.org/W2158043128","https://openalex.org/W2160841000","https://openalex.org/W2166777727","https://openalex.org/W2167138208","https://openalex.org/W2168209902","https://openalex.org/W2532934857","https://openalex.org/W3109740545","https://openalex.org/W4212961314","https://openalex.org/W4245604880","https://openalex.org/W6681203205"],"related_works":["https://openalex.org/W2533368584","https://openalex.org/W3143626098","https://openalex.org/W2777027891","https://openalex.org/W3111932749","https://openalex.org/W1540755181","https://openalex.org/W2128849446","https://openalex.org/W2070886976","https://openalex.org/W2071390961","https://openalex.org/W2132532260","https://openalex.org/W2383026120"],"abstract_inverted_index":{"Subtle":[0],"failure":[1],"mechanisms":[2],"that":[3,41],"arise":[4],"from":[5,23,128,133,149],"statistical":[6,69,165],"distributions":[7],"of":[8,33,81,90,122,147,157],"the":[9,24,31,39,79,88,95,110],"circuit":[10],"parameters":[11],"have":[12],"been":[13],"with":[14,62,151],"its":[15],"for":[16],"many":[17],"technology":[18],"generations.":[19],"However,":[20],"since":[21,55],"going":[22],"180":[25],"nm":[26],"node":[27],"to":[28,38,59,73,103,106],"smaller":[29],"nodes,":[30],"presence":[32],"these":[34],"defects":[35],"has":[36],"increased":[37],"point":[40],"they":[42,56,66],"are":[43,51,57,118,144],"no":[44],"longer":[45],"considered":[46],"an":[47],"occasional":[48],"nuisance.":[49],"They":[50],"a":[52,119,145,164,169],"primary":[53],"worry":[54],"difficult":[58],"design":[60,63],"out":[61],"rules,":[64],"and":[65,70,93,116,132,139,163],"require":[67],"special":[68,161],"environmental":[71],"settings":[72],"expose":[74],"failure.":[75],"This":[76,167],"paper":[77],"describes":[78],"origins":[80],"parametric":[82,152],"failures":[83,102],"(PFs),":[84],"presents":[85],"data":[86],"showing":[87],"magnitude":[89],"their":[91],"variance,":[92],"discusses":[94],"conditions":[96],"under":[97],"which":[98],"we":[99],"can":[100],"expect":[101,126],"occur":[104],"or":[105],"be":[107],"detected":[108],"during":[109],"test":[111,172],"process.":[112],"Detection":[113],"is":[114,168],"challenging,":[115],"PFs":[117,127,148,159],"major":[120],"source":[121],"field":[123],"return.":[124],"We":[125],"intrinsic":[129],"ICs":[130,150],"(defect-free)":[131],"extrinsic":[134,158],"(defect)":[135],"ICs.":[136],"Resistive":[137],"vias":[138],"metal":[140],"cracks":[141],"in":[142],"general":[143],"cause":[146],"related":[153],"defects.":[154],"The":[155],"detection":[156],"requires":[160],"care":[162],"analysis.":[166],"relatively":[170],"new":[171],"paradigm.":[173]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}