{"id":"https://openalex.org/W1494978458","doi":"https://doi.org/10.1109/dftvs.2003.1250100","title":"On the test and diagnosis of the perfect shuffle","display_name":"On the test and diagnosis of the perfect shuffle","publication_year":2004,"publication_date":"2004-03-01","ids":{"openalex":"https://openalex.org/W1494978458","doi":"https://doi.org/10.1109/dftvs.2003.1250100","mag":"1494978458"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2003.1250100","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250100","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041455210","display_name":"L. Schiano","orcid":null},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"L. Schiano","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001979328","display_name":"Fabrizio Lombardi","orcid":"https://orcid.org/0000-0003-3152-3245"},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Lombardi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5041455210"],"corresponding_institution_ids":["https://openalex.org/I12912129"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05232937,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"c30","issue":null,"first_page":"97","last_page":"104"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/aliasing","display_name":"Aliasing","score":0.8012089729309082},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5914580225944519},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5891447067260742},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5439552664756775},{"id":"https://openalex.org/keywords/constant","display_name":"Constant (computer programming)","score":0.5375850200653076},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5271280407905579},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4938824772834778},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.4753541648387909},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.468485951423645},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4292903542518616},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.4246475398540497},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4192427098751068},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.39032265543937683},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.37328487634658813},{"id":"https://openalex.org/keywords/combinatorics","display_name":"Combinatorics","score":0.33796384930610657},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.28672245144844055},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12278363108634949},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10695499181747437},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1012326180934906},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.08693200349807739}],"concepts":[{"id":"https://openalex.org/C4069607","wikidata":"https://www.wikidata.org/wiki/Q868732","display_name":"Aliasing","level":3,"score":0.8012089729309082},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5914580225944519},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5891447067260742},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5439552664756775},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.5375850200653076},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5271280407905579},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4938824772834778},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.4753541648387909},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.468485951423645},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4292903542518616},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.4246475398540497},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4192427098751068},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.39032265543937683},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.37328487634658813},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.33796384930610657},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.28672245144844055},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12278363108634949},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10695499181747437},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1012326180934906},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.08693200349807739},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C136536468","wikidata":"https://www.wikidata.org/wiki/Q1225894","display_name":"Undersampling","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dftvs.2003.1250100","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2003.1250100","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 16th IEEE Symposium on Computer Arithmetic","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W128123307","https://openalex.org/W1524961204","https://openalex.org/W1599372549","https://openalex.org/W1967963284","https://openalex.org/W1979477906","https://openalex.org/W2001550762","https://openalex.org/W2008575427","https://openalex.org/W2050973642","https://openalex.org/W2102126685","https://openalex.org/W2107973691","https://openalex.org/W2112221264","https://openalex.org/W2117040048","https://openalex.org/W2122959746","https://openalex.org/W2130485678","https://openalex.org/W2132750992","https://openalex.org/W2144853876","https://openalex.org/W2145515320","https://openalex.org/W2157211828","https://openalex.org/W2502957693","https://openalex.org/W2752885492","https://openalex.org/W4240484895","https://openalex.org/W4285719527","https://openalex.org/W6605234255","https://openalex.org/W6635782553","https://openalex.org/W6663191752","https://openalex.org/W7046116536"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2164349885","https://openalex.org/W1768820276"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,27,38,81,107,112,182],"new":[4],"structural":[5],"approach":[6,31],"is":[7,78,86,102,139,157],"proposed":[8],"for":[9,54,168],"the":[10,24,43,46,50,69,97,100,175,179],"full":[11],"diagnosis":[12,169],"(with":[13],"no":[14,55,119],"aliasing":[15,56,120],"and":[16,20,57,121,150],"confounding)":[17],"of":[18,26,49,68,84,99,115,131,162,178],"shorts":[19],"stuck-at":[21,75],"faults":[22],"in":[23,45,96,181],"interconnect":[25],"perfect":[28,113,148,183],"shuffle.":[29,51,184],"This":[30,104],"utilizes":[32],"graph":[33],"coloring":[34],"techniques":[35],"to":[36,134],"generate":[37],"test":[39,89,108],"set":[40,109],"based":[41],"on":[42],"adjacencies":[44],"largest":[47,70],"necklace":[48],"The":[52,129],"conditions":[53],"confounding":[58,122],"as":[59,61,66],"well":[60],"fault":[62,171],"detection":[63],"are":[64,151],"presented":[65],"function":[67],"short":[71],"fault.":[72],"For":[73],"detecting":[74],"faults,":[76],"it":[77],"shown":[79,158],"that":[80,159],"constant":[82,160],"number":[83],"tests":[85],"required.":[87],"A":[88],"generation":[90],"algorithm":[91,105],"with":[92,118],"quadratic":[93],"execution":[94],"complexity":[95],"size":[98,116],"shuffle":[101,114],"proposed.":[103],"generates":[106],"which":[110,173],"diagnoses":[111],"N":[117],"using":[123],"O(log/sub":[124],"2/(log/sub":[125],"2/":[126],"(N)))":[127],"tests.":[128],"application":[130],"these":[132],"results":[133],"multistage":[135],"interconnection":[136],"networks":[137],"(MINs)":[138],"also":[140],"presented:":[141],"MINs":[142,163],"can":[143,164],"be":[144,165],"constructed":[145],"by":[146,153],"cascading":[147],"shuffles":[149],"characterized":[152],"switching":[154],"operation.":[155],"It":[156],"testability":[161],"still":[166],"achieved":[167],"under":[170],"models":[172],"preserve":[174],"loop":[176],"properties":[177],"necklaces":[180]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}