{"id":"https://openalex.org/W2145799018","doi":"https://doi.org/10.1109/dftvs.2002.1173514","title":"Fortuitous detection and its impact on test set sizes using stuck-at and transition faults","display_name":"Fortuitous detection and its impact on test set sizes using stuck-at and transition faults","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2145799018","doi":"https://doi.org/10.1109/dftvs.2002.1173514","mag":"2145799018"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2002.1173514","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2002.1173514","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044465911","display_name":"Jennifer Dworak","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"J. Dworak","raw_affiliation_strings":["Texas A&M University College Station, College Station, TX, US","Texas A&M University, College Station, Texas, USA"],"affiliations":[{"raw_affiliation_string":"Texas A&M University College Station, College Station, TX, US","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Texas A&M University, College Station, Texas, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068051302","display_name":"James Wingfield","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Wingfield","raw_affiliation_strings":["Texas A&M Univ., College Station, TX, USA"],"affiliations":[{"raw_affiliation_string":"Texas A&M Univ., College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007893860","display_name":"B. Cobb","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Cobb","raw_affiliation_strings":["Texas A&M University, College Station, Texas, USA"],"affiliations":[{"raw_affiliation_string":"Texas A&M University, College Station, Texas, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084275098","display_name":"Sooryong Lee","orcid":"https://orcid.org/0000-0002-2141-6924"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sooryong Lee","raw_affiliation_strings":["Texas A&M University, College Station, Texas"],"affiliations":[{"raw_affiliation_string":"Texas A&M University, College Station, Texas","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369642","display_name":"Li-C. Wang","orcid":"https://orcid.org/0000-0003-4851-8004"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"L.-C. Wang","raw_affiliation_strings":["Department of ECE","Department of ECE, Santa Barbara, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE","institution_ids":[]},{"raw_affiliation_string":"Department of ECE, Santa Barbara, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023642611","display_name":"M.R. Mercer","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.R. Mercer","raw_affiliation_strings":["Texas A&M University, College Station, Texas, USA"],"affiliations":[{"raw_affiliation_string":"Texas A&M University, College Station, Texas, USA","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5044465911"],"corresponding_institution_ids":["https://openalex.org/I91045830"],"apc_list":null,"apc_paid":null,"fwci":1.7608,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.85708719,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"177","last_page":"185"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7410129308700562},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6031776666641235},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5551570653915405},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5395109057426453},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5292111039161682},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5239149332046509},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5163792371749878},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.509344220161438},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33215320110321045},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22123417258262634},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1824132800102234},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0730944573879242}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7410129308700562},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6031776666641235},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5551570653915405},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5395109057426453},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5292111039161682},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5239149332046509},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5163792371749878},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.509344220161438},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33215320110321045},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22123417258262634},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1824132800102234},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0730944573879242},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dftvs.2002.1173514","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2002.1173514","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1690611602","https://openalex.org/W2014484422","https://openalex.org/W2080267935","https://openalex.org/W2096007426","https://openalex.org/W2098335643","https://openalex.org/W2107479796","https://openalex.org/W2117031250","https://openalex.org/W2133505378","https://openalex.org/W2134394354","https://openalex.org/W2143740397","https://openalex.org/W2146594632","https://openalex.org/W2148843359","https://openalex.org/W2152063058","https://openalex.org/W2161068399","https://openalex.org/W2171908682","https://openalex.org/W4243061192","https://openalex.org/W4254994603","https://openalex.org/W6637294129","https://openalex.org/W6676259946"],"related_works":["https://openalex.org/W2341817401","https://openalex.org/W2090601222","https://openalex.org/W2021253405","https://openalex.org/W2052164173","https://openalex.org/W1995521279","https://openalex.org/W2146761392","https://openalex.org/W2096066993","https://openalex.org/W2134239377","https://openalex.org/W2386366670","https://openalex.org/W2140300392"],"abstract_inverted_index":{"During":[0],"manufacture":[1],"testing,":[2],"the":[3,16,25,28,51,54],"maximum":[4],"number":[5],"of":[6,19,30,53,83],"test":[7,35,57,72],"patterns":[8],"that":[9,27,60,70],"can":[10],"be":[11],"applied":[12],"is":[13],"limited":[14],"by":[15],"available":[17],"amount":[18],"tester":[20],"memory.":[21],"This":[22],"paper":[23],"investigates":[24],"effect":[26],"probability":[29],"fortuitous":[31],"detection":[32],"has":[33],"on":[34],"pattern":[36,58,73],"length":[37,59],"when":[38,62],"stuck-at":[39],"and":[40,67],"transition":[41,63],"faults":[42,64,85],"are":[43,65,76],"targeted":[44],"in":[45,56],"four":[46],"benchmark":[47],"circuits.":[48,89],"We":[49],"show":[50],"magnitude":[52],"increase":[55],"occurs":[61],"targeted,":[66],"this":[68],"indicates":[69],"current":[71],"generation":[74],"methods":[75],"not":[77],"adequate":[78],"to":[79],"make":[80],"multiple":[81],"detections":[82],"timing":[84],"practical":[86],"for":[87],"most":[88]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}