{"id":"https://openalex.org/W2129009228","doi":"https://doi.org/10.1109/dftvs.2002.1173506","title":"New methods for evaluating the impact of single event transients in VDSM ICs","display_name":"New methods for evaluating the impact of single event transients in VDSM ICs","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2129009228","doi":"https://doi.org/10.1109/dftvs.2002.1173506","mag":"2129009228"},"language":"en","primary_location":{"id":"doi:10.1109/dftvs.2002.1173506","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2002.1173506","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings.","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010087541","display_name":"Dan Alexandrescu","orcid":"https://orcid.org/0000-0002-8294-7534"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"D. Alexandrescu","raw_affiliation_strings":["IRoC Technologies, USA","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)"],"affiliations":[{"raw_affiliation_string":"IRoC Technologies, USA","institution_ids":[]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053835664","display_name":"Lorena Anghel","orcid":"https://orcid.org/0000-0001-9569-0072"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L. Anghel","raw_affiliation_strings":["TIMA Laboratory, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)"],"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039513293","display_name":"M. Nicolaidis","orcid":"https://orcid.org/0000-0003-1091-9339"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Nicolaidis","raw_affiliation_strings":["IRoC Technologies, USA","IROC TECHNOLOGIES - iROc Technologies (WTC Po Box 1510 Grenoble - France)","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)"],"affiliations":[{"raw_affiliation_string":"IRoC Technologies, USA","institution_ids":[]},{"raw_affiliation_string":"IROC TECHNOLOGIES - iROc Technologies (WTC Po Box 1510 Grenoble - France)","institution_ids":[]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5010087541"],"corresponding_institution_ids":["https://openalex.org/I4210087012"],"apc_list":null,"apc_paid":null,"fwci":10.9444,"has_fulltext":false,"cited_by_count":68,"citation_normalized_percentile":{"value":0.98811366,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.8496058583259583},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.727558434009552},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6994338631629944},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.651635468006134},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.6102443337440491},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6019880175590515},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5218314528465271},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.4931630492210388},{"id":"https://openalex.org/keywords/discrete-event-simulation","display_name":"Discrete event simulation","score":0.47895103693008423},{"id":"https://openalex.org/keywords/logic-simulation","display_name":"Logic simulation","score":0.47869423031806946},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.43650850653648376},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.427558958530426},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.425751656293869},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3773450553417206},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3390413820743561},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.206165611743927},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18927279114723206},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.18882319331169128},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.16115272045135498},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.14002543687820435},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08295923471450806}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.8496058583259583},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.727558434009552},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6994338631629944},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.651635468006134},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.6102443337440491},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6019880175590515},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5218314528465271},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.4931630492210388},{"id":"https://openalex.org/C147203929","wikidata":"https://www.wikidata.org/wiki/Q574814","display_name":"Discrete event simulation","level":2,"score":0.47895103693008423},{"id":"https://openalex.org/C64859876","wikidata":"https://www.wikidata.org/wiki/Q173673","display_name":"Logic simulation","level":3,"score":0.47869423031806946},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.43650850653648376},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.427558958530426},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.425751656293869},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3773450553417206},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3390413820743561},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.206165611743927},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18927279114723206},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.18882319331169128},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.16115272045135498},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.14002543687820435},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08295923471450806},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dftvs.2002.1173506","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dftvs.2002.1173506","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00013736v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00013736","pdf_url":null,"source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Proceedings-17th-IEEE-International-Symposium-on-Defect-and-Fault-Tolerance-in-VLSI-Systems.-DFT-2002, 2002, Vancouver, BC, Canada. pp.99-107, ⟨10.1109/DFTVS.2002.1173506⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2013185880","https://openalex.org/W2111279338","https://openalex.org/W2118423280","https://openalex.org/W2121395914","https://openalex.org/W2144371588","https://openalex.org/W2169213530","https://openalex.org/W4229525459","https://openalex.org/W4229966209"],"related_works":["https://openalex.org/W2075328278","https://openalex.org/W2130922779","https://openalex.org/W4234532445","https://openalex.org/W2082366402","https://openalex.org/W3007887309","https://openalex.org/W2120242933","https://openalex.org/W2085176210","https://openalex.org/W2055295790","https://openalex.org/W2379444853","https://openalex.org/W2083209667"],"abstract_inverted_index":{"This":[0],"work":[1],"considers":[2],"a":[3,16,28,35,74,98],"SET":[4],"(single":[5],"event":[6,47],"transient)":[7],"fault":[8,37,100],"simulation":[9,38,94,101],"technique":[10],"to":[11,55,97],"evaluate":[12],"the":[13,21,65,93],"probability":[14],"that":[15,64],"transient":[17,41,78],"pulse,":[18],"born":[19],"in":[20,27,80],"combinational":[22],"logic,":[23],"may":[24],"be":[25],"latched":[26],"storage":[29],"cell.":[30],"Fault":[31],"injection":[32],"procedures":[33],"and":[34,72],"fast":[36],"algorithm":[39,67],"for":[40],"faults":[42,79],"were":[43],"implemented":[44,54],"around":[45],"an":[46],"driven":[48],"simulator.":[49],"A":[50],"statistical":[51],"analysis":[52],"was":[53],"organize":[56],"data":[57],"sampled":[58],"from":[59],"simulations.":[60],"The":[61],"benchmarks":[62],"show":[63],"proposed":[66],"is":[68],"capable":[69],"of":[70,77],"injecting":[71],"simulating":[73],"large":[75],"number":[76],"complex":[81],"designs.":[82],"Also":[83],"specific":[84],"optimizations":[85],"have":[86],"been":[87],"carried":[88],"out,":[89],"thus":[90],"greatly":[91],"reducing":[92],"time":[95],"compared":[96],"sequential":[99],"approach.":[102]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":5}],"updated_date":"2026-03-28T08:17:26.163206","created_date":"2025-10-10T00:00:00"}