{"id":"https://openalex.org/W4416726889","doi":"https://doi.org/10.1109/dft66274.2025.11257506","title":"Does Fault Tolerance Safeguard DNNs Against Bitfiip Attacks? A Case Study","display_name":"Does Fault Tolerance Safeguard DNNs Against Bitfiip Attacks? A Case Study","publication_year":2025,"publication_date":"2025-10-21","ids":{"openalex":"https://openalex.org/W4416726889","doi":"https://doi.org/10.1109/dft66274.2025.11257506"},"language":null,"primary_location":{"id":"doi:10.1109/dft66274.2025.11257506","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft66274.2025.11257506","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002269174","display_name":"Mohammad Hasan Ahmadilivani","orcid":"https://orcid.org/0000-0002-4162-6646"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Mohammad Hasan Ahmadilivani","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068757239","display_name":"Yuto Kobayashi","orcid":null},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Yuto Kobayashi","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010286547","display_name":"Jaan Raik","orcid":"https://orcid.org/0000-0001-8113-020X"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Jaan Raik","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063193249","display_name":"Masoud Daneshtalab","orcid":"https://orcid.org/0000-0001-6289-1521"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Masoud Daneshtalab","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059391257","display_name":"Maksim Jenihhin","orcid":"https://orcid.org/0000-0001-8165-9592"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Maksim Jenihhin","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I111112146"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.43808714,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.6215999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.6215999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.18050000071525574,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.16060000658035278,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/safeguard","display_name":"Safeguard","score":0.7748000025749207},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.7402999997138977},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7232000231742859},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.6484000086784363},{"id":"https://openalex.org/keywords/intrusion-tolerance","display_name":"Intrusion tolerance","score":0.6459000110626221},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.44359999895095825}],"concepts":[{"id":"https://openalex.org/C2780771206","wikidata":"https://www.wikidata.org/wiki/Q3271761","display_name":"Safeguard","level":2,"score":0.7748000025749207},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.7402999997138977},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7232000231742859},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.6484000086784363},{"id":"https://openalex.org/C196903269","wikidata":"https://www.wikidata.org/wiki/Q6059063","display_name":"Intrusion tolerance","level":3,"score":0.6459000110626221},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5896999835968018},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.49709999561309814},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.44359999895095825},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.41110000014305115},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.38370001316070557},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.3407999873161316},{"id":"https://openalex.org/C2781133158","wikidata":"https://www.wikidata.org/wiki/Q1088669","display_name":"Survivability","level":2,"score":0.2818000018596649},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.26809999346733093},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.2547000050544739},{"id":"https://openalex.org/C33762810","wikidata":"https://www.wikidata.org/wiki/Q461671","display_name":"Data integrity","level":2,"score":0.25450000166893005}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft66274.2025.11257506","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft66274.2025.11257506","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2138815251","https://openalex.org/W2798273231","https://openalex.org/W2903175372","https://openalex.org/W2981860227","https://openalex.org/W3187862527","https://openalex.org/W3201365832","https://openalex.org/W3215777689","https://openalex.org/W4200376271","https://openalex.org/W4319596548","https://openalex.org/W4383501724","https://openalex.org/W4384026315","https://openalex.org/W4390145134","https://openalex.org/W4390872667","https://openalex.org/W4401329586"],"related_works":[],"abstract_inverted_index":{"As":[0],"Deep":[1],"Neural":[2],"Networks":[3],"(DNNs)":[4],"are":[5,98],"increasingly":[6],"deployed":[7],"in":[8,45,78],"safety-critical":[9],"applications,":[10],"ensuring":[11],"their":[12],"reliability":[13],"and":[14,125],"security":[15,32,54,122],"is":[16,62,130],"essential.":[17],"Fault":[18],"tolerance":[19,50,69,117],"techniques":[20,70],"enhance":[21],"DNN":[22],"resilience":[23],"to":[24,37,71,87,101],"hardware-induced":[25],"errors":[26,77],"but":[27],"may":[28],"unintentionally":[29],"introduce":[30],"new":[31],"vulnerabilities":[33],"by":[34],"introducing":[35],"redundancy":[36],"systems.":[38],"This":[39],"paper":[40],"addresses":[41],"a":[42,83,109,126],"critical":[43],"question":[44],"this":[46,57],"regard:":[47],"Does":[48],"fault":[49,68,116,134],"safeguard":[51],"DNNs":[52,97],"against":[53],"threats?":[55],"In":[56],"work,":[58],"an":[59],"open-source":[60],"tool":[61],"proposed":[63],"that":[64,94,115],"applies":[65],"multiple":[66],"model-level":[67],"mitigate":[72],"the":[73,88,95,121],"impact":[74],"of":[75,123],"soft":[76],"parameters.":[79],"Then,":[80],"we":[81],"apply":[82],"state-of-the-art":[84],"bitflip":[85],"attack":[86],"hardened":[89,96],"DNNs.":[90],"The":[91,112],"results":[92,113],"indicate":[93],"more":[99],"resilient":[100],"intended":[102],"bitflips,":[103],"yet":[104],"they":[105],"can":[106],"fail":[107],"with":[108,133],"few":[110],"bitflips.":[111],"suggest":[114],"does":[118],"not":[119],"guarantee":[120],"DNNs,":[124],"dedicated":[127],"security-aware":[128],"design":[129],"necessary":[131],"along":[132],"tolerance.":[135]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-11-25T00:00:00"}