{"id":"https://openalex.org/W4416726160","doi":"https://doi.org/10.1109/dft66274.2025.11257504","title":"Using RISC-V Extensions to Support Software-Implemented Hardware Fault Tolerance","display_name":"Using RISC-V Extensions to Support Software-Implemented Hardware Fault Tolerance","publication_year":2025,"publication_date":"2025-10-21","ids":{"openalex":"https://openalex.org/W4416726160","doi":"https://doi.org/10.1109/dft66274.2025.11257504"},"language":null,"primary_location":{"id":"doi:10.1109/dft66274.2025.11257504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft66274.2025.11257504","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037904549","display_name":"Brent De Blaere","orcid":"https://orcid.org/0000-0001-9340-604X"},"institutions":[{"id":"https://openalex.org/I2800805412","display_name":"Catholic University College of Bruges\u2013Ostend","ror":"https://ror.org/0113zvv22","country_code":"BE","type":"education","lineage":["https://openalex.org/I2800805412"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Brent De Blaere","raw_affiliation_strings":["KU Leuven - DistriNet,Dept. of Computer Science,Bruges,Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven - DistriNet,Dept. of Computer Science,Bruges,Belgium","institution_ids":["https://openalex.org/I2800805412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044320522","display_name":"Jens Vankeirsbilck","orcid":"https://orcid.org/0000-0003-0038-588X"},"institutions":[{"id":"https://openalex.org/I2800805412","display_name":"Catholic University College of Bruges\u2013Ostend","ror":"https://ror.org/0113zvv22","country_code":"BE","type":"education","lineage":["https://openalex.org/I2800805412"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jens Vankeirsbilck","raw_affiliation_strings":["KU Leuven - DistriNet,Dept. of Computer Science,Bruges,Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven - DistriNet,Dept. of Computer Science,Bruges,Belgium","institution_ids":["https://openalex.org/I2800805412"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030535974","display_name":"Jeroen Boydens","orcid":"https://orcid.org/0000-0002-7902-8537"},"institutions":[{"id":"https://openalex.org/I2800805412","display_name":"Catholic University College of Bruges\u2013Ostend","ror":"https://ror.org/0113zvv22","country_code":"BE","type":"education","lineage":["https://openalex.org/I2800805412"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jeroen Boydens","raw_affiliation_strings":["KU Leuven - DistriNet,Dept. of Computer Science,Bruges,Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven - DistriNet,Dept. of Computer Science,Bruges,Belgium","institution_ids":["https://openalex.org/I2800805412"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5037904549"],"corresponding_institution_ids":["https://openalex.org/I2800805412"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.39193425,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9106000065803528,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9106000065803528,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.06939999759197235,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.0071000000461936,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6876999735832214},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6236000061035156},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5195000171661377},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5019000172615051},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4952999949455261},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.48510000109672546},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.48350000381469727},{"id":"https://openalex.org/keywords/extensibility","display_name":"Extensibility","score":0.4652999937534332},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.4341000020503998}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7189000248908997},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6876999735832214},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6488999724388123},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6236000061035156},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5195000171661377},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5019000172615051},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4952999949455261},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.48510000109672546},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.48350000381469727},{"id":"https://openalex.org/C32833848","wikidata":"https://www.wikidata.org/wiki/Q4115054","display_name":"Extensibility","level":2,"score":0.4652999937534332},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.4341000020503998},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4203000068664551},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.40880000591278076},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.3668000102043152},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.350600004196167},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.34200000762939453},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.3127000033855438},{"id":"https://openalex.org/C117280010","wikidata":"https://www.wikidata.org/wiki/Q180944","display_name":"Register file","level":3,"score":0.3091000020503998},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3059000074863434},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2937999963760376},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.29120001196861267},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.28839999437332153},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.28519999980926514},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.28369998931884766},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.28029999136924744},{"id":"https://openalex.org/C42259789","wikidata":"https://www.wikidata.org/wiki/Q1392940","display_name":"Fail-safe","level":2,"score":0.2777000069618225},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.2533000111579895},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.25200000405311584}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dft66274.2025.11257504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft66274.2025.11257504","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:20.500.12942/777077","is_oa":false,"landing_page_url":"https://lirias.kuleuven.be/handle/20.500.12942/777077","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Barcelona, Spain, 21-23 October 2025","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"As":[0],"embedded":[1,165],"systems":[2],"are":[3],"increasingly":[4],"deployed":[5],"in":[6,14,49],"safety-critical":[7],"and":[8,42,52,89,107,118,145,163],"harsh":[9],"environments,":[10],"ensuring":[11],"their":[12],"reliability":[13],"the":[15,67,70,94,127,136],"presence":[16],"of":[17,69],"soft":[18],"errors":[19],"such":[20],"as":[21],"Single":[22],"Event":[23],"Upsets":[24],"has":[25],"become":[26],"essential.":[27],"While":[28],"Software-Implemented":[29],"Hardware":[30],"Fault":[31],"Tolerance":[32],"(SIHFT)":[33],"techniques":[34],"provide":[35],"a":[36,58,79,108,158],"flexible":[37],"solution":[38],"for":[39],"error":[40],"detection":[41,133],"correction,":[43],"they":[44],"often":[45],"incur":[46],"significant":[47],"overhead":[48],"code":[50,146],"size":[51,147],"execution":[53,143],"time.":[54],"This":[55],"paper":[56],"investigates":[57],"hardware-assisted":[59],"approach":[60],"to":[61,92,112,135],"mitigate":[62],"these":[63],"drawbacks":[64],"by":[65],"leveraging":[66],"extensibility":[68],"open-source":[71],"RISC-":[72,81,138,154],"V":[73,82,139,155],"instruction":[74],"set":[75],"architecture.":[76],"We":[77],"present":[78],"proof-of-concept":[80],"extension,":[83],"Xpdetector,":[84],"which":[85],"introduces":[86],"custom":[87,153],"instructions":[88],"hardware":[90],"support":[91],"implement":[93],"P-DETECTOR":[95],"SIHFT":[96],"technique.":[97],"The":[98,121],"extension":[99],"includes":[100],"four":[101],"new":[102],"instructions,":[103],"two":[104],"special-purpose":[105],"registers,":[106],"duplicated":[109],"register":[110],"file":[111],"enable":[113],"efficient":[114,162],"re-":[115],"execution-based":[116],"control-flow":[117],"data-flow":[119],"protection.":[120],"Im-peras":[122],"simulator":[123],"results":[124],"show":[125],"that":[126,152],"Xpdetector-enhanced":[128],"core":[129],"achieves":[130],"comparable":[131],"fault":[132],"capabilities":[134],"baseline":[137],"while":[140],"significantly":[141],"reducing":[142],"time":[144],"overhead.":[148],"These":[149],"findings":[150],"suggest":[151],"extensions":[156],"offer":[157],"promising":[159],"path":[160],"toward":[161],"reliable":[164],"system":[166],"design.":[167]},"counts_by_year":[],"updated_date":"2026-03-07T16:01:11.037858","created_date":"2025-11-25T00:00:00"}