{"id":"https://openalex.org/W4416728069","doi":"https://doi.org/10.1109/dft66274.2025.11257486","title":"Compact SER Models for Line-Source-Induced Charge Collection Using Model Order Reduction","display_name":"Compact SER Models for Line-Source-Induced Charge Collection Using Model Order Reduction","publication_year":2025,"publication_date":"2025-10-21","ids":{"openalex":"https://openalex.org/W4416728069","doi":"https://doi.org/10.1109/dft66274.2025.11257486"},"language":null,"primary_location":{"id":"doi:10.1109/dft66274.2025.11257486","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft66274.2025.11257486","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.1109/DFT66274.2025.11257486","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011832290","display_name":"Pavlos Stoikos","orcid":"https://orcid.org/0000-0001-9099-8238"},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Pavlos Stoikos","raw_affiliation_strings":["University of Thessaly,Department of Electrical and Computer Engineering,Volos,Greece"],"affiliations":[{"raw_affiliation_string":"University of Thessaly,Department of Electrical and Computer Engineering,Volos,Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088212178","display_name":"Olympia Axelou","orcid":"https://orcid.org/0000-0001-8093-5882"},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Olympia Axelou","raw_affiliation_strings":["University of Thessaly,Department of Electrical and Computer Engineering,Volos,Greece"],"affiliations":[{"raw_affiliation_string":"University of Thessaly,Department of Electrical and Computer Engineering,Volos,Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039792365","display_name":"Pelopidas Tsoumanis","orcid":null},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Pelopidas Tsoumanis","raw_affiliation_strings":["University of Thessaly,Department of Electrical and Computer Engineering,Volos,Greece"],"affiliations":[{"raw_affiliation_string":"University of Thessaly,Department of Electrical and Computer Engineering,Volos,Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009316258","display_name":"Georgios-Ioannis Paliaroutis","orcid":"https://orcid.org/0000-0002-4897-0634"},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Georgios-Ioannis Paliaroutis","raw_affiliation_strings":["University of Thessaly,Department of Electrical and Computer Engineering,Volos,Greece"],"affiliations":[{"raw_affiliation_string":"University of Thessaly,Department of Electrical and Computer Engineering,Volos,Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001777299","display_name":"Luigi Dilillo","orcid":"https://orcid.org/0000-0002-1295-2688"},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Luigi Dilillo","raw_affiliation_strings":["University of Montpellier, CNRS,IES,Montpellier,France"],"affiliations":[{"raw_affiliation_string":"University of Montpellier, CNRS,IES,Montpellier,France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067055700","display_name":"Anuj Pathania","orcid":"https://orcid.org/0000-0002-5813-7021"},"institutions":[{"id":"https://openalex.org/I887064364","display_name":"University of Amsterdam","ror":"https://ror.org/04dkp9463","country_code":"NL","type":"education","lineage":["https://openalex.org/I887064364"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Anuj Pathania","raw_affiliation_strings":["University of Amsterdam,Amsterdam,The Netherlands"],"affiliations":[{"raw_affiliation_string":"University of Amsterdam,Amsterdam,The Netherlands","institution_ids":["https://openalex.org/I887064364"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066445455","display_name":"George Floros","orcid":"https://orcid.org/0000-0002-2867-9604"},"institutions":[{"id":"https://openalex.org/I205274468","display_name":"Trinity College Dublin","ror":"https://ror.org/02tyrky19","country_code":"IE","type":"education","lineage":["https://openalex.org/I205274468"]}],"countries":["IE"],"is_corresponding":false,"raw_author_name":"George Floros","raw_affiliation_strings":["Trinity College Dublin,Department of Electronic and Electrical Engineering,Dublin,Ireland"],"affiliations":[{"raw_affiliation_string":"Trinity College Dublin,Department of Electronic and Electrical Engineering,Dublin,Ireland","institution_ids":["https://openalex.org/I205274468"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5011832290"],"corresponding_institution_ids":["https://openalex.org/I145722265"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.39303158,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.5651000142097473,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.5651000142097473,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.2190999984741211,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10787","display_name":"Lightning and Electromagnetic Phenomena","score":0.028999999165534973,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/model-order-reduction","display_name":"Model order reduction","score":0.7236999869346619},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6654000282287598},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5763000249862671},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5519999861717224},{"id":"https://openalex.org/keywords/krylov-subspace","display_name":"Krylov subspace","score":0.5230000019073486},{"id":"https://openalex.org/keywords/discretization","display_name":"Discretization","score":0.4934999942779541},{"id":"https://openalex.org/keywords/moment","display_name":"Moment (physics)","score":0.4864000082015991},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.43470001220703125},{"id":"https://openalex.org/keywords/computational-complexity-theory","display_name":"Computational complexity theory","score":0.4074999988079071}],"concepts":[{"id":"https://openalex.org/C2779277453","wikidata":"https://www.wikidata.org/wiki/Q12202921","display_name":"Model order reduction","level":3,"score":0.7236999869346619},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6654000282287598},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5763000249862671},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5519999861717224},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5443999767303467},{"id":"https://openalex.org/C147060835","wikidata":"https://www.wikidata.org/wiki/Q1757151","display_name":"Krylov subspace","level":3,"score":0.5230000019073486},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5166000127792358},{"id":"https://openalex.org/C73000952","wikidata":"https://www.wikidata.org/wiki/Q17007827","display_name":"Discretization","level":2,"score":0.4934999942779541},{"id":"https://openalex.org/C179254644","wikidata":"https://www.wikidata.org/wiki/Q13222844","display_name":"Moment (physics)","level":2,"score":0.4864000082015991},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.43470001220703125},{"id":"https://openalex.org/C179799912","wikidata":"https://www.wikidata.org/wiki/Q205084","display_name":"Computational complexity theory","level":2,"score":0.4074999988079071},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.4052000045776367},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.4049000144004822},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.4036000072956085},{"id":"https://openalex.org/C32834561","wikidata":"https://www.wikidata.org/wiki/Q660730","display_name":"Subspace topology","level":2,"score":0.365200012922287},{"id":"https://openalex.org/C459310","wikidata":"https://www.wikidata.org/wiki/Q117801","display_name":"Computational science","level":1,"score":0.3634999990463257},{"id":"https://openalex.org/C66024118","wikidata":"https://www.wikidata.org/wiki/Q1122506","display_name":"Computational model","level":2,"score":0.35510000586509705},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33469998836517334},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.328000009059906},{"id":"https://openalex.org/C182306322","wikidata":"https://www.wikidata.org/wiki/Q1779371","display_name":"Order (exchange)","level":2,"score":0.31360000371932983},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.313400000333786},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.29829999804496765},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.2915000021457672},{"id":"https://openalex.org/C77405623","wikidata":"https://www.wikidata.org/wiki/Q598451","display_name":"System dynamics","level":2,"score":0.2863999903202057},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.28380000591278076},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.2718000113964081},{"id":"https://openalex.org/C76969082","wikidata":"https://www.wikidata.org/wiki/Q486902","display_name":"Mathematical model","level":2,"score":0.26809999346733093},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.26660001277923584},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2662000060081482},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.2637999951839447},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.25929999351501465},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.25850000977516174},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25450000166893005}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dft66274.2025.11257486","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft66274.2025.11257486","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:zenodo.org:17775641","is_oa":true,"landing_page_url":"https://doi.org/10.1109/DFT66274.2025.11257486","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:17775641","is_oa":true,"landing_page_url":"https://doi.org/10.1109/DFT66274.2025.11257486","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferencePaper"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2030501553","https://openalex.org/W2049568828","https://openalex.org/W2099569658","https://openalex.org/W2141068710","https://openalex.org/W2142358791","https://openalex.org/W2161549238","https://openalex.org/W2908608091","https://openalex.org/W3030874150","https://openalex.org/W4210737214","https://openalex.org/W4362563601"],"related_works":[],"abstract_inverted_index":{"Soft":[0,47],"errors,":[1,36],"typically":[2],"caused":[3],"by":[4,86,121],"cosmic":[5],"rays":[6],"and":[7,21,55,111],"particle":[8],"strikes,":[9],"have":[10,61],"become":[11,62],"a":[12,31,41,74,116],"reliability":[13],"challenge":[14],"of":[15,29,97,151],"modern":[16],"electronics":[17],"in":[18,107],"aerospace,":[19],"automotive,":[20],"high-performance":[22],"computing.":[23],"In":[24,65],"advanced":[25],"nodes":[26],"with":[27,129],"billions":[28],"transistors,":[30],"single":[32],"strike":[33],"can":[34],"propagate":[35],"disrupting":[37],"critical":[38],"operations.":[39],"As":[40],"result,":[42],"traditional":[43],"methods":[44],"for":[45],"estimating":[46],"Error":[48],"Rate":[49],"(SER),":[50],"such":[51],"as":[52,115],"TCAD":[53],"simulations":[54],"arithmetic":[56],"formulas,":[57],"are":[58],"accurate":[59],"but":[60],"computationally":[63],"expensive.":[64],"order":[66],"to":[67,80],"alleviate":[68],"the":[69,94,98,104,108,113,123,149,152],"computational":[70,136,145],"burden,":[71],"we":[72,91,102,134],"propose":[73],"Model":[75],"Order":[76],"Reduction":[77],"(MOR)":[78],"approach":[79],"analyze":[81],"charge":[82],"collection":[83],"dynamics":[84],"induced":[85],"ionizing":[87],"particles.":[88],"More":[89],"specifically,":[90],"start":[92],"from":[93],"physics-based":[95],"model":[96],"diffusion-collection":[99],"mechanism,":[100],"then":[101],"discretize":[103],"fundamental":[105],"equations":[106],"3D":[109],"space,":[110],"formulate":[112],"system":[114],"high-dimensional":[117],"state-space":[118],"problem.":[119],"Finally,":[120],"applying":[122],"Extended":[124],"Krylov":[125],"Subspace":[126],"(EKS)":[127],"combined":[128],"Moment":[130],"Matching":[131],"(MM)":[132],"techniques,":[133],"reduce":[135],"overhead":[137],"while":[138,147],"maintaining":[139,148],"accuracy.":[140],"Experimental":[141],"results":[142],"demonstrate":[143],"significant":[144],"speedups":[146],"accuracy":[150],"full":[153],"model.":[154]},"counts_by_year":[],"updated_date":"2026-03-07T16:01:11.037858","created_date":"2025-11-20T00:00:00"}