{"id":"https://openalex.org/W4416726811","doi":"https://doi.org/10.1109/dft66274.2025.11257452","title":"PBO-Based Pattern Replacement for Compacting Diagnostic Patterns to Achieve Complete Diagnostic Resolution","display_name":"PBO-Based Pattern Replacement for Compacting Diagnostic Patterns to Achieve Complete Diagnostic Resolution","publication_year":2025,"publication_date":"2025-10-21","ids":{"openalex":"https://openalex.org/W4416726811","doi":"https://doi.org/10.1109/dft66274.2025.11257452"},"language":null,"primary_location":{"id":"doi:10.1109/dft66274.2025.11257452","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft66274.2025.11257452","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Tatsuya Aono","orcid":null},"institutions":[{"id":"https://openalex.org/I104946051","display_name":"Nihon University","ror":"https://ror.org/05jk51a88","country_code":"JP","type":"education","lineage":["https://openalex.org/I104946051"]},{"id":"https://openalex.org/I52706244","display_name":"College of Industrial Technology","ror":"https://ror.org/054a9s036","country_code":"JP","type":"education","lineage":["https://openalex.org/I52706244"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Tatsuya Aono","raw_affiliation_strings":["Graduate School of Industrial Technology, Nihon University,Chiba,JAPAN"],"affiliations":[{"raw_affiliation_string":"Graduate School of Industrial Technology, Nihon University,Chiba,JAPAN","institution_ids":["https://openalex.org/I52706244","https://openalex.org/I104946051"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113865938","display_name":"Toshinori Hosokawa","orcid":null},"institutions":[{"id":"https://openalex.org/I104946051","display_name":"Nihon University","ror":"https://ror.org/05jk51a88","country_code":"JP","type":"education","lineage":["https://openalex.org/I104946051"]},{"id":"https://openalex.org/I52706244","display_name":"College of Industrial Technology","ror":"https://ror.org/054a9s036","country_code":"JP","type":"education","lineage":["https://openalex.org/I52706244"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshinori Hosokawa","raw_affiliation_strings":["College of Industrial Technology, Nihon University,Chiba,JAPAN"],"affiliations":[{"raw_affiliation_string":"College of Industrial Technology, Nihon University,Chiba,JAPAN","institution_ids":["https://openalex.org/I52706244","https://openalex.org/I104946051"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101029241","display_name":"Masayoshi Yoshimura","orcid":null},"institutions":[{"id":"https://openalex.org/I168356945","display_name":"Kyoto Sangyo University","ror":"https://ror.org/05t70xh16","country_code":"JP","type":"education","lineage":["https://openalex.org/I168356945"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masayoshi Yoshimura","raw_affiliation_strings":["Kyoto Sangyo University,Faculty of Information Science and Engineering,Kyoto,JAPAN"],"affiliations":[{"raw_affiliation_string":"Kyoto Sangyo University,Faculty of Information Science and Engineering,Kyoto,JAPAN","institution_ids":["https://openalex.org/I168356945"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009084626","display_name":"Koji Yamazaki","orcid":"https://orcid.org/0000-0003-2025-6268"},"institutions":[{"id":"https://openalex.org/I16656306","display_name":"Meiji University","ror":"https://ror.org/02rqvrp93","country_code":"JP","type":"education","lineage":["https://openalex.org/I16656306"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koji Yamazaki","raw_affiliation_strings":["School of Information and Communication, Meiji University,Tokyo,JAPAN"],"affiliations":[{"raw_affiliation_string":"School of Information and Communication, Meiji University,Tokyo,JAPAN","institution_ids":["https://openalex.org/I16656306"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033483661","display_name":"Masayuki Arai","orcid":"https://orcid.org/0000-0002-4636-6310"},"institutions":[{"id":"https://openalex.org/I104946051","display_name":"Nihon University","ror":"https://ror.org/05jk51a88","country_code":"JP","type":"education","lineage":["https://openalex.org/I104946051"]},{"id":"https://openalex.org/I52706244","display_name":"College of Industrial Technology","ror":"https://ror.org/054a9s036","country_code":"JP","type":"education","lineage":["https://openalex.org/I52706244"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masayuki Arai","raw_affiliation_strings":["College of Industrial Technology, Nihon University,Chiba,JAPAN"],"affiliations":[{"raw_affiliation_string":"College of Industrial Technology, Nihon University,Chiba,JAPAN","institution_ids":["https://openalex.org/I52706244","https://openalex.org/I104946051"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I104946051","https://openalex.org/I52706244"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.39009065,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9876000285148621,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9876000285148621,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.004399999976158142,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.002400000113993883,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7491999864578247},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6449000239372253},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5900999903678894},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5637000203132629},{"id":"https://openalex.org/keywords/diagnostic-test","display_name":"Diagnostic test","score":0.5435000061988831},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5264000296592712},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5112000107765198},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.4350999891757965}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7491999864578247},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6449000239372253},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5900999903678894},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5637000203132629},{"id":"https://openalex.org/C82157600","wikidata":"https://www.wikidata.org/wiki/Q2671652","display_name":"Diagnostic test","level":2,"score":0.5435000061988831},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5264000296592712},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5112000107765198},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4350999891757965},{"id":"https://openalex.org/C3020132585","wikidata":"https://www.wikidata.org/wiki/Q2671652","display_name":"Diagnostic accuracy","level":2,"score":0.39649999141693115},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.38350000977516174},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.37040001153945923},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.34700000286102295},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3449999988079071},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33629998564720154},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3310999870300293},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.32760000228881836},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.31779998540878296},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.31520000100135803},{"id":"https://openalex.org/C3020199158","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"High resolution","level":2,"score":0.28780001401901245},{"id":"https://openalex.org/C3020347449","wikidata":"https://www.wikidata.org/wiki/Q3366302","display_name":"Diagnostic model","level":2,"score":0.2754000127315521},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.25920000672340393},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.25519999861717224},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.25440001487731934}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft66274.2025.11257452","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft66274.2025.11257452","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1502387139","https://openalex.org/W1560834932","https://openalex.org/W2014953362","https://openalex.org/W2016114271","https://openalex.org/W2017520945","https://openalex.org/W2049791401","https://openalex.org/W2092357065","https://openalex.org/W2106183788","https://openalex.org/W2107203554","https://openalex.org/W2113518275","https://openalex.org/W2115005577","https://openalex.org/W2133512509","https://openalex.org/W2143846508","https://openalex.org/W2889739348","https://openalex.org/W2952274626","https://openalex.org/W3129976660","https://openalex.org/W4243061192","https://openalex.org/W4404564281"],"related_works":[],"abstract_inverted_index":{"In":[0],"testing":[1],"and":[2,21,140],"fault":[3,19,30,49,65,122],"diagnosis":[4],"for":[5,127,138,161],"VLSIs,":[6],"it":[7],"is":[8,22,75,78],"important":[9],"to":[10,24,55,100,109],"generate":[11,43],"a":[12,17,26,79,98],"test":[13,34,45,61,87,102,114],"set":[14,62,88],"which":[15,47,104,116],"achieves":[16],"high":[18,64],"efficiency":[20],"able":[23,54],"distinguish":[25,48],"large":[27],"number":[28,70,147,168],"of":[29,71,84,148,169],"pairs.":[31],"Therefore,":[32],"diagnostic":[33,73,111,118,150],"generation":[35],"methods":[36,42],"have":[37],"been":[38],"proposed.":[39],"The":[40],"conventional":[41],"additional":[44,72,149,170],"patterns":[46,74,103,115,151,171],"pairs":[50],"that":[51,81,145,166],"are":[52],"not":[53,106],"be":[56],"distinguished":[57],"using":[58,124],"an":[59],"initial":[60],"with":[63,113],"coverage.":[66],"However,":[67],"since":[68],"the":[69,82,85,146,167],"large,":[76],"there":[77],"problem":[80],"size":[83],"final":[86],"becomes":[89],"large.":[90],"To":[91],"solve":[92],"this":[93,95],"problem,":[94],"paper":[96],"proposes":[97],"method":[99],"replace":[101],"do":[105],"contribute":[107],"much":[108],"improving":[110],"resolution":[112,119],"improve":[117],"while":[120],"maintaining":[121],"coverage":[123],"pseudo-Boolean":[125],"optimization":[126],"stuck-at":[128,134],"faults":[129],"or":[130],"transition":[131,157],"faults.":[132],"For":[133,156],"faults,":[135,158],"experimental":[136,159],"results":[137,160],"ISCAS'89":[139,162],"ITC'99":[141],"benchmark":[142,163],"circuits":[143,164],"show":[144,165],"was":[152,172],"10.3%":[153],"on":[154,174],"average.":[155,175],"18.0%":[173]},"counts_by_year":[],"updated_date":"2026-04-17T18:11:37.981687","created_date":"2025-11-25T00:00:00"}