{"id":"https://openalex.org/W4404564564","doi":"https://doi.org/10.1109/dft63277.2024.10753559","title":"Special Session: Testing of Digital Computing-In Memories with MAC Function","display_name":"Special Session: Testing of Digital Computing-In Memories with MAC Function","publication_year":2024,"publication_date":"2024-10-08","ids":{"openalex":"https://openalex.org/W4404564564","doi":"https://doi.org/10.1109/dft63277.2024.10753559"},"language":"en","primary_location":{"id":"doi:10.1109/dft63277.2024.10753559","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft63277.2024.10753559","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100741020","display_name":"Jin-Fu Li","orcid":"https://orcid.org/0000-0003-1961-9674"},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Jin-Fu Li","raw_affiliation_strings":["National Central University,Advanced Reliable System (ARES) Lab.,Department of Electrical Engineering,Taoyuan,Taiwan,320"],"affiliations":[{"raw_affiliation_string":"National Central University,Advanced Reliable System (ARES) Lab.,Department of Electrical Engineering,Taoyuan,Taiwan,320","institution_ids":["https://openalex.org/I22265921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100741020"],"corresponding_institution_ids":["https://openalex.org/I22265921"],"apc_list":null,"apc_paid":null,"fwci":1.4479,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.83596961,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9376999735832214,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.8612017035484314},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8020319938659668},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4535074234008789},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.37739142775535583},{"id":"https://openalex.org/keywords/world-wide-web","display_name":"World Wide Web","score":0.15260273218154907}],"concepts":[{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.8612017035484314},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8020319938659668},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4535074234008789},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.37739142775535583},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.15260273218154907},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft63277.2024.10753559","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft63277.2024.10753559","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7309991214","display_name":null,"funder_award_id":"MOST 112-2221-E-008-096-MY3,MOST 112-2218-E-002-025-MBK,NSTC 113-2640-E-008-001","funder_id":"https://openalex.org/F2461203286","funder_display_name":"National Science and Technology Council"}],"funders":[{"id":"https://openalex.org/F2461203286","display_name":"National Science and Technology Council","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W2331783522","https://openalex.org/W2591601611","https://openalex.org/W2771238178","https://openalex.org/W2775637085","https://openalex.org/W2793009352","https://openalex.org/W2827033417","https://openalex.org/W2981537656","https://openalex.org/W3005157299","https://openalex.org/W3033017298","https://openalex.org/W3038585068","https://openalex.org/W3039319489","https://openalex.org/W3115575231","https://openalex.org/W3134526034","https://openalex.org/W3185896771","https://openalex.org/W4220922172","https://openalex.org/W4221038786","https://openalex.org/W4312611881","https://openalex.org/W4312627759","https://openalex.org/W4360605969","https://openalex.org/W4387129467","https://openalex.org/W4388666846","https://openalex.org/W4392114388"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W4230197055","https://openalex.org/W4296749040","https://openalex.org/W621808327","https://openalex.org/W644007644","https://openalex.org/W2497198634","https://openalex.org/W3012257603","https://openalex.org/W1586784764"],"abstract_inverted_index":{"Digital":[0],"computing-in-memory":[1],"(DCIM)":[2],"with":[3,24,55,73,85,94,112,122],"MAC":[4,25,95,113,123],"function":[5,26],"has":[6],"been":[7],"considered":[8],"as":[9],"a":[10,29],"good":[11],"alternative":[12],"for":[13,81,91,110],"the":[14,92,104],"computation":[15],"deep":[16],"neural":[17],"networks":[18],"(DNNs).":[19],"A":[20],"basic":[21],"DCIM":[22,43,61],"unit":[23],"consists":[27],"of":[28,42,49,120],"bit-multiplication":[30],"memory":[31],"(BMM)":[32],"and":[33,39,52,69,78,83,107],"an":[34],"adder":[35],"tree.":[36],"The":[37],"architecture":[38],"bit-cell":[40],"structure":[41],"is":[44,63],"very":[45],"different":[46,70],"from":[47,71],"those":[48],"conventional":[50],"SRAMs":[51,82],"digital":[53],"CIMs":[54],"logic":[56,74,86],"operations.":[57,75],"This":[58],"means":[59],"that":[60],"testing":[62,68,108,118],"more":[64],"difficult":[65],"than":[66],"SRAM":[67],"DCIMs":[72,84,93,111,121],"Fault":[76],"models":[77],"march-like":[79],"tests":[80],"functions":[87],"are":[88,125],"not":[89],"enough":[90],"operation.":[96,114],"In":[97],"this":[98],"embedded":[99],"tutorial,":[100],"therefore,":[101],"we":[102],"introduce":[103],"fault":[105],"analysis":[106],"methods":[109],"Some":[115],"perspectives":[116],"on":[117],"challenges":[119],"operation":[124],"also":[126],"raised.":[127]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}