{"id":"https://openalex.org/W4404564771","doi":"https://doi.org/10.1109/dft63277.2024.10753533","title":"Zero-Memory-Overhead Clipping-Based Fault Tolerance for LSTM Deep Neural Networks","display_name":"Zero-Memory-Overhead Clipping-Based Fault Tolerance for LSTM Deep Neural Networks","publication_year":2024,"publication_date":"2024-10-08","ids":{"openalex":"https://openalex.org/W4404564771","doi":"https://doi.org/10.1109/dft63277.2024.10753533"},"language":"en","primary_location":{"id":"doi:10.1109/dft63277.2024.10753533","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft63277.2024.10753533","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114728604","display_name":"Bahram Parchekani","orcid":null},"institutions":[{"id":"https://openalex.org/I99861883","display_name":"University of Zanjan","ror":"https://ror.org/05e34ej29","country_code":"IR","type":"education","lineage":["https://openalex.org/I99861883"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Bahram Parchekani","raw_affiliation_strings":["University of Zanjan,Zanjan,Iran"],"affiliations":[{"raw_affiliation_string":"University of Zanjan,Zanjan,Iran","institution_ids":["https://openalex.org/I99861883"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074780500","display_name":"Samira Nazari","orcid":null},"institutions":[{"id":"https://openalex.org/I99861883","display_name":"University of Zanjan","ror":"https://ror.org/05e34ej29","country_code":"IR","type":"education","lineage":["https://openalex.org/I99861883"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Samira Nazari","raw_affiliation_strings":["University of Zanjan,Zanjan,Iran"],"affiliations":[{"raw_affiliation_string":"University of Zanjan,Zanjan,Iran","institution_ids":["https://openalex.org/I99861883"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002269174","display_name":"Mohammad Hasan Ahmadilivani","orcid":"https://orcid.org/0000-0002-4162-6646"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Mohammad Hasan Ahmadilivani","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061289292","display_name":"Ali Azarpeyvand","orcid":"https://orcid.org/0000-0002-4166-7528"},"institutions":[{"id":"https://openalex.org/I99861883","display_name":"University of Zanjan","ror":"https://ror.org/05e34ej29","country_code":"IR","type":"education","lineage":["https://openalex.org/I99861883"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Ali Azarpeyvand","raw_affiliation_strings":["University of Zanjan,Zanjan,Iran"],"affiliations":[{"raw_affiliation_string":"University of Zanjan,Zanjan,Iran","institution_ids":["https://openalex.org/I99861883"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010286547","display_name":"Jaan Raik","orcid":"https://orcid.org/0000-0001-8113-020X"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Jaan Raik","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042603430","display_name":"Tara Ghasempouri","orcid":"https://orcid.org/0000-0001-8021-9368"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Tara Ghasempouri","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063193249","display_name":"Masoud Daneshtalab","orcid":"https://orcid.org/0000-0001-6289-1521"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Masoud Daneshtalab","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5114728604"],"corresponding_institution_ids":["https://openalex.org/I99861883"],"apc_list":null,"apc_paid":null,"fwci":0.3663,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.64081982,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9803000092506409,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.96670001745224,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/clipping","display_name":"Clipping (morphology)","score":0.7971622943878174},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7381328344345093},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6919195055961609},{"id":"https://openalex.org/keywords/zero","display_name":"Zero (linguistics)","score":0.5539212226867676},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5531435012817383},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5344628095626831},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.338601678609848},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3171288073062897},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.1488107144832611},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10792744159698486}],"concepts":[{"id":"https://openalex.org/C2776848632","wikidata":"https://www.wikidata.org/wiki/Q853463","display_name":"Clipping (morphology)","level":2,"score":0.7971622943878174},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7381328344345093},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6919195055961609},{"id":"https://openalex.org/C2780813799","wikidata":"https://www.wikidata.org/wiki/Q3274237","display_name":"Zero (linguistics)","level":2,"score":0.5539212226867676},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5531435012817383},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5344628095626831},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.338601678609848},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3171288073062897},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.1488107144832611},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10792744159698486},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft63277.2024.10753533","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft63277.2024.10753533","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2804473037","https://openalex.org/W2987441303","https://openalex.org/W3004001630","https://openalex.org/W3022643593","https://openalex.org/W3036979375","https://openalex.org/W3096295711","https://openalex.org/W3159562783","https://openalex.org/W3159836144","https://openalex.org/W4206286792","https://openalex.org/W4280513934","https://openalex.org/W4280608645","https://openalex.org/W4319865974","https://openalex.org/W4386607611","https://openalex.org/W4388667142","https://openalex.org/W4390145134","https://openalex.org/W4394564230","https://openalex.org/W4400034224","https://openalex.org/W4401329586"],"related_works":["https://openalex.org/W2035130982","https://openalex.org/W3198205105","https://openalex.org/W2956000802","https://openalex.org/W3198227724","https://openalex.org/W110878719","https://openalex.org/W2098726873","https://openalex.org/W1862835629","https://openalex.org/W2136799148","https://openalex.org/W2897533804","https://openalex.org/W2890506991"],"abstract_inverted_index":{"Long":[0],"Short-Term":[1],"Memory":[2],"(LSTM)":[3],"Deep":[4],"Neural":[5],"Net-works":[6],"(DNNs)":[7],"have":[8,47],"shown":[9],"superior":[10],"accuracy":[11],"in":[12,45,57,97],"predicting":[13],"and":[14,43],"classifying":[15],"time-series":[16],"data.":[17],"This":[18,61],"has":[19],"made":[20],"them":[21,56,93],"suitable":[22],"for":[23,88],"many":[24],"applications,":[25],"including":[26],"safety-critical":[27,58],"ones,":[28],"such":[29],"as":[30],"healthcare,":[31],"where":[32],"fault":[33,41,74,85,109],"tolerance":[34,86,110],"is":[35],"a":[36],"major":[37],"concern.":[38],"Until":[39],"now,":[40],"resilience":[42],"mitigation":[44],"LSTMs":[46],"not":[48],"been":[49],"thoroughly":[50],"explored,":[51],"raising":[52],"concerns":[53],"about":[54],"exploiting":[55],"use":[59],"cases.":[60],"work,":[62],"first,":[63],"extensively":[64],"explores":[65],"the":[66,79,104],"effect":[67],"of":[68,111],"faults":[69,96],"on":[70],"LSTM":[71,89],"DNNs":[72,90,113],"using":[73],"injection":[75],"into":[76],"parameters.":[77,99],"Moreover,":[78],"paper":[80],"presents":[81],"two":[82],"effective":[83],"zero-memory-overhead":[84],"techniques":[87,106],"to":[91,115],"protect":[92],"against":[94],"random":[95],"their":[98],"Experimental":[100],"results":[101],"indicate":[102],"that":[103],"proposed":[105],"can":[107],"improve":[108],"LSTM-based":[112],"up":[114],"278.6":[116],"times":[117],"concerning":[118],"unprotected":[119],"ones.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}