{"id":"https://openalex.org/W4404564857","doi":"https://doi.org/10.1109/dft63277.2024.10753532","title":"Image Degradation due to Interacting Hot Pixels and SEUs","display_name":"Image Degradation due to Interacting Hot Pixels and SEUs","publication_year":2024,"publication_date":"2024-10-08","ids":{"openalex":"https://openalex.org/W4404564857","doi":"https://doi.org/10.1109/dft63277.2024.10753532"},"language":"en","primary_location":{"id":"doi:10.1109/dft63277.2024.10753532","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/dft63277.2024.10753532","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061097022","display_name":"Glenn H. Chapman","orcid":"https://orcid.org/0000-0002-2486-2954"},"institutions":[{"id":"https://openalex.org/I18014758","display_name":"Simon Fraser University","ror":"https://ror.org/0213rcc28","country_code":"CA","type":"education","lineage":["https://openalex.org/I18014758"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Glenn H. Chapman","raw_affiliation_strings":["School of Engineering Science, Simon Fraser University,Burnaby,B.C.,Canada,V5A 1S6"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering Science, Simon Fraser University,Burnaby,B.C.,Canada,V5A 1S6","institution_ids":["https://openalex.org/I18014758"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114728632","display_name":"Alireza Farahmandpour","orcid":null},"institutions":[{"id":"https://openalex.org/I18014758","display_name":"Simon Fraser University","ror":"https://ror.org/0213rcc28","country_code":"CA","type":"education","lineage":["https://openalex.org/I18014758"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Alireza Farahmandpour","raw_affiliation_strings":["School of Engineering Science, Simon Fraser University,Burnaby,B.C.,Canada,V5A 1S6"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering Science, Simon Fraser University,Burnaby,B.C.,Canada,V5A 1S6","institution_ids":["https://openalex.org/I18014758"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110428902","display_name":"A. Chakma","orcid":null},"institutions":[{"id":"https://openalex.org/I18014758","display_name":"Simon Fraser University","ror":"https://ror.org/0213rcc28","country_code":"CA","type":"education","lineage":["https://openalex.org/I18014758"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Amit Chakma","raw_affiliation_strings":["School of Engineering Science, Simon Fraser University,Burnaby,B.C.,Canada,V5A 1S6"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering Science, Simon Fraser University,Burnaby,B.C.,Canada,V5A 1S6","institution_ids":["https://openalex.org/I18014758"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055210733","display_name":"Israel Koren","orcid":"https://orcid.org/0000-0003-2741-7108"},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Israel Koren","raw_affiliation_strings":["University of Massachusetts,Dept. of Electrical and Computer Engineering,Amherst,MA,01003"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Massachusetts,Dept. of Electrical and Computer Engineering,Amherst,MA,01003","institution_ids":["https://openalex.org/I24603500"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023125411","display_name":"Zahava Koren","orcid":null},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zahava Koren","raw_affiliation_strings":["University of Massachusetts,Dept. of Electrical and Computer Engineering,Amherst,MA,01003"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Massachusetts,Dept. of Electrical and Computer Engineering,Amherst,MA,01003","institution_ids":["https://openalex.org/I24603500"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9271,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.71994536,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.8065000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.8065000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7281270623207092},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.7109576463699341},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49627572298049927},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4486958980560303},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3818676769733429},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3529388904571533},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08245542645454407}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7281270623207092},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.7109576463699341},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49627572298049927},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4486958980560303},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3818676769733429},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3529388904571533},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08245542645454407}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft63277.2024.10753532","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/dft63277.2024.10753532","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2027654975","https://openalex.org/W2031457674","https://openalex.org/W2110449873","https://openalex.org/W2110643826","https://openalex.org/W2113100884","https://openalex.org/W2122230135","https://openalex.org/W2124177559","https://openalex.org/W2140573010","https://openalex.org/W2158150403","https://openalex.org/W2784238382","https://openalex.org/W2886155985","https://openalex.org/W3108396160","https://openalex.org/W3142913228","https://openalex.org/W4310449400"],"related_works":["https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":{"Hot":[0,86,144,153],"pixels":[1,59],"(induced":[2],"by":[3,21],"cosmic":[4],"rays)":[5],"in":[6,66,133],"digital":[7],"imaging":[8],"sensors":[9],"accumulate":[10],"with":[11,160],"camera":[12,161],"age,":[13],"impacting":[14],"the":[15,22,27,90,109,120,149],"quality":[16],"of":[17,83,151],"all":[18],"images":[19],"produced":[20],"camera.":[23],"During":[24],"its":[25,158],"lifetime,":[26],"imager":[28],"also":[29,93],"experiences":[30],"Single":[31],"Event":[32],"Upsets":[33],"(SEU":[34],"s)":[35],"that":[36,60,72],"create":[37],"transient":[38],"defects":[39],"affecting":[40],"a":[41,48,75,79,123,142,152],"single":[42],"image.":[43,91],"The":[44],"SEUs":[45],"occur":[46,61],"at":[47],"much":[49],"higher":[50],"rate":[51],"(events/second)":[52],"compared":[53],"to":[54,147],"10-100s":[55],"additional":[56],"permanent":[57],"hot":[58],"per":[62],"year.":[63],"We":[64,92,137],"explore":[65],"this":[67],"paper":[68],"how":[69],"an":[70,84,97],"SEU":[71,98],"occurs":[73],"within":[74],"close":[76],"proximity":[77],"(within":[78],"5\u00d75":[80],"pixel":[81,125],"area)":[82],"existing":[85],"Pixel":[87,145],"may":[88],"distort":[89],"consider":[94],"situations":[95],"where":[96],"impacts":[99],"two":[100,143],"or":[101],"more":[102],"adjacent":[103],"pixels.":[104],"When":[105],"such":[106],"events":[107],"happen,":[108],"currently":[110],"employed":[111],"color":[112,129],"demosaicing":[113],"and":[114,131,156],"JPEG":[115],"image":[116,135],"compression":[117],"algorithms":[118],"spread":[119],"damage":[121],"into":[122],"16\u00d716":[124],"area,":[126],"creating":[127],"significant":[128],"changes":[130],"resulting":[132],"noticeable":[134],"degradation.":[136],"use":[138],"formulas":[139],"developed":[140],"for":[141],"interaction":[146],"estimate":[148],"probability":[150],"Pixel-SEU":[154],"interaction,":[155],"predict":[157],"increase":[159],"age.":[162]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}