{"id":"https://openalex.org/W4404564234","doi":"https://doi.org/10.1109/dft63277.2024.10753529","title":"Special Session: Overcoming Transient Faults and Aging Effects in Digital Computing-in-Memory Architectures: Detection, Tolerance, and Mitigation Strategies","display_name":"Special Session: Overcoming Transient Faults and Aging Effects in Digital Computing-in-Memory Architectures: Detection, Tolerance, and Mitigation Strategies","publication_year":2024,"publication_date":"2024-10-08","ids":{"openalex":"https://openalex.org/W4404564234","doi":"https://doi.org/10.1109/dft63277.2024.10753529"},"language":"en","primary_location":{"id":"doi:10.1109/dft63277.2024.10753529","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft63277.2024.10753529","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049049466","display_name":"Yu-Guang Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Yu-Guang Chen","raw_affiliation_strings":["National Central University,Department of Electrical Engineering,Taoyuan,Taiwan"],"affiliations":[{"raw_affiliation_string":"National Central University,Department of Electrical Engineering,Taoyuan,Taiwan","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079147069","display_name":"Ting-Yi Wu","orcid":"https://orcid.org/0000-0003-2993-8329"},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ting-Yi Wu","raw_affiliation_strings":["National Central University,Department of Electrical Engineering,Taoyuan,Taiwan"],"affiliations":[{"raw_affiliation_string":"National Central University,Department of Electrical Engineering,Taoyuan,Taiwan","institution_ids":["https://openalex.org/I22265921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5049049466"],"corresponding_institution_ids":["https://openalex.org/I22265921"],"apc_list":null,"apc_paid":null,"fwci":0.4449,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.64767264,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9886000156402588,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7359747886657715},{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.7271522283554077},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5190128087997437},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5088410973548889},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3406983017921448},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.27626246213912964},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12238577008247375}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7359747886657715},{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.7271522283554077},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5190128087997437},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5088410973548889},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3406983017921448},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.27626246213912964},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12238577008247375},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft63277.2024.10753529","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft63277.2024.10753529","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8399999737739563,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W2029252327","https://openalex.org/W2053744765","https://openalex.org/W2066647049","https://openalex.org/W2079825333","https://openalex.org/W2089272132","https://openalex.org/W2091485565","https://openalex.org/W2099569658","https://openalex.org/W2144154842","https://openalex.org/W2146745163","https://openalex.org/W2151908422","https://openalex.org/W2154344146","https://openalex.org/W2158359146","https://openalex.org/W2252288845","https://openalex.org/W2625439172","https://openalex.org/W2750392872","https://openalex.org/W2773414563","https://openalex.org/W2773835648","https://openalex.org/W2781857877","https://openalex.org/W2902593524","https://openalex.org/W2913032416","https://openalex.org/W2914359245","https://openalex.org/W2993577165","https://openalex.org/W3013462594","https://openalex.org/W3013739639","https://openalex.org/W3123856488","https://openalex.org/W3134526034","https://openalex.org/W3184114148","https://openalex.org/W4224307474","https://openalex.org/W4289656062","https://openalex.org/W4312611881","https://openalex.org/W4319430290","https://openalex.org/W4384517557","https://openalex.org/W4394586013","https://openalex.org/W6635851226"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W4230197055","https://openalex.org/W4296749040","https://openalex.org/W621808327","https://openalex.org/W644007644","https://openalex.org/W2497198634","https://openalex.org/W3012257603","https://openalex.org/W1586784764"],"abstract_inverted_index":{"Digital":[0],"computing-in-memory":[1],"(DCIM)":[2],"is":[3],"a":[4],"promising":[5],"solution":[6],"to":[7,35,53,85,107],"the":[8,74,88,109],"von":[9],"Neumann":[10],"bottleneck.":[11],"By":[12],"utilizing":[13],"bit-multiplication":[14],"memory":[15],"(BMM)":[16],"cells":[17,29],"and":[18,30,42,93,104],"adder":[19,31],"trees.,":[20],"DCIM":[21],"efficiently":[22],"performs":[23],"MAC":[24,77],"operations.":[25],"However.,":[26],"both":[27],"BMM":[28],"trees":[32],"are":[33],"susceptible":[34],"reliability":[36,70,110],"issues.,":[37],"such":[38],"as":[39],"transient":[40,91],"faults":[41,46,92],"aging":[43,57,94],"effects.":[44],"Transient":[45],"can":[47,58,72],"cause":[48],"single-event":[49],"upsets":[50],"(SEUs).,":[51],"leading":[52],"data":[54],"loss.,":[55],"while":[56],"degrade":[59],"circuit":[60],"performance":[61],"over":[62],"time.,":[63],"potentially":[64],"resulting":[65],"in":[66],"functional":[67],"errors.":[68],"These":[69],"threats":[71],"impact":[73],"accuracy":[75],"of":[76,90,111],"computation":[78],"results.":[79],"In":[80],"this":[81],"tutorial.,":[82],"we":[83,99],"aim":[84],"comprehensively":[86],"investigate":[87],"influence":[89],"effects":[95],"on":[96],"DCIM.":[97,112],"Additionally.,":[98],"will":[100],"explore":[101],"detection.,":[102],"tolerance.,":[103],"mitigation":[105],"strategies":[106],"enhance":[108]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}