{"id":"https://openalex.org/W4388674566","doi":"https://doi.org/10.1109/dft59622.2023.10313562","title":"On-Chip Sensors Data Collection and Analysis for SoC Health Management","display_name":"On-Chip Sensors Data Collection and Analysis for SoC Health Management","publication_year":2023,"publication_date":"2023-10-03","ids":{"openalex":"https://openalex.org/W4388674566","doi":"https://doi.org/10.1109/dft59622.2023.10313562"},"language":"en","primary_location":{"id":"doi:10.1109/dft59622.2023.10313562","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft59622.2023.10313562","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028380153","display_name":"Konstantin Shibin","orcid":"https://orcid.org/0000-0002-8041-1779"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Konstantin Shibin","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia","Tallinn University of Technology, Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]},{"raw_affiliation_string":"Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059391257","display_name":"Maksim Jenihhin","orcid":"https://orcid.org/0000-0001-8165-9592"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Maksim Jenihhin","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia","Tallinn University of Technology, Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]},{"raw_affiliation_string":"Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059021602","display_name":"Artur Jutman","orcid":"https://orcid.org/0000-0002-2018-5589"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Artur Jutman","raw_affiliation_strings":["Tallinn University of Technology,Tallinn,Estonia","Tallinn University of Technology, Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]},{"raw_affiliation_string":"Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054970559","display_name":"Sergei Devadze","orcid":"https://orcid.org/0000-0001-7445-3801"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sergei Devadze","raw_affiliation_strings":["Testonica Lab OÜ,Tallinn,Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Testonica Lab OÜ,Tallinn,Estonia","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045334611","display_name":"Anton T\u0161ertov","orcid":"https://orcid.org/0000-0003-4084-7313"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Anton Tsertov","raw_affiliation_strings":["Testonica Lab OÜ,Tallinn,Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Testonica Lab OÜ,Tallinn,Estonia","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.2452,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.93354129,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9850999712944031,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/operability","display_name":"Operability","score":0.7169433832168579},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6617708802223206},{"id":"https://openalex.org/keywords/health-management-system","display_name":"Health management system","score":0.6238543391227722},{"id":"https://openalex.org/keywords/raw-data","display_name":"Raw data","score":0.6127406358718872},{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.5943300724029541},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.478839635848999},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4486251473426819},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.42853862047195435},{"id":"https://openalex.org/keywords/hierarchy","display_name":"Hierarchy","score":0.4183596968650818},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.37221792340278625},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.11276957392692566},{"id":"https://openalex.org/keywords/medicine","display_name":"Medicine","score":0.08625423908233643}],"concepts":[{"id":"https://openalex.org/C126231374","wikidata":"https://www.wikidata.org/wiki/Q1061298","display_name":"Operability","level":2,"score":0.7169433832168579},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6617708802223206},{"id":"https://openalex.org/C171265473","wikidata":"https://www.wikidata.org/wiki/Q5691117","display_name":"Health management system","level":3,"score":0.6238543391227722},{"id":"https://openalex.org/C132964779","wikidata":"https://www.wikidata.org/wiki/Q2110223","display_name":"Raw data","level":2,"score":0.6127406358718872},{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.5943300724029541},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.478839635848999},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4486251473426819},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.42853862047195435},{"id":"https://openalex.org/C31170391","wikidata":"https://www.wikidata.org/wiki/Q188619","display_name":"Hierarchy","level":2,"score":0.4183596968650818},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.37221792340278625},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.11276957392692566},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.08625423908233643},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C34447519","wikidata":"https://www.wikidata.org/wiki/Q179522","display_name":"Market economy","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft59622.2023.10313562","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft59622.2023.10313562","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1984145458","https://openalex.org/W2010340060","https://openalex.org/W2051396856","https://openalex.org/W2090117799","https://openalex.org/W2117352826","https://openalex.org/W2143993529","https://openalex.org/W2306582323","https://openalex.org/W2409005280","https://openalex.org/W2414784133","https://openalex.org/W2528862985","https://openalex.org/W2756242979","https://openalex.org/W2893208548","https://openalex.org/W2980700924","https://openalex.org/W3036399803","https://openalex.org/W4241153235"],"related_works":["https://openalex.org/W3022231745","https://openalex.org/W2115233498","https://openalex.org/W4205715751","https://openalex.org/W1989165503","https://openalex.org/W2069451717","https://openalex.org/W271007108","https://openalex.org/W2044182513","https://openalex.org/W1964160495","https://openalex.org/W3139170465","https://openalex.org/W2383952951"],"abstract_inverted_index":{"Data":[0],"produced":[1],"by":[2,185],"on-chip":[3,147],"sensors":[4,71],"in":[5,177],"modern":[6],"SoCs":[7],"contains":[8,153],"a":[9,39,52,113,157,170,190],"large":[10],"amount":[11],"of":[12,38,47,98,143,172,193],"information":[13,31,85,123,155,188],"such":[14],"as":[15,42,44],"occurring":[16,127],"faults,":[17],"aging":[18],"status,":[19],"accumulated":[20],"radiation":[21],"dose,":[22],"performance":[23],"characteristics,":[24],"environmental":[25],"and":[26,57,104,129,141,201],"other":[27,105],"operational":[28],"parameters.":[29],"Such":[30],"provides":[32],"insight":[33],"into":[34,94,169],"the":[35,45,84,96,99,122,198],"overall":[36],"health":[37,65,78,174,183],"system's":[40,199],"hardware":[41,64,173],"well":[43],"operability":[46],"individual":[48],"modules.":[49],"This":[50],"gives":[51],"chance":[53],"to":[54,76,90],"mitigate":[55],"faults":[56,88,128],"avoid":[58],"using":[59,186],"faulty":[60],"units,":[61],"thus":[62,196],"enabling":[63],"management.":[66],"Raw":[67],"data":[68,144],"from":[69,146],"embedded":[70],"cannot":[72],"be":[73,91,167],"immediately":[74],"used":[75],"perform":[77],"management":[79,184],"tasks.":[80],"In":[81,134],"most":[82],"cases,":[83],"about":[86,124],"occurred":[87],"needs":[89],"analyzed":[92],"taking":[93],"account":[95],"history":[97],"previously":[100],"reported":[101],"fault":[102],"events":[103],"collected":[106],"statistics.":[107],"For":[108],"this":[109,187],"purpose,":[110],"we":[111,136],"propose":[112,137],"special":[114],"structure":[115],"called":[116],"Health":[117,151],"Map":[118,152],"(HM)":[119],"that":[120,165,176],"holds":[121],"functional":[125],"resources,":[126],"maps":[130],"relationships":[131],"between":[132],"these.":[133],"addition,":[135],"algorithms":[138],"for":[139],"aggregation":[140],"classification":[142],"received":[145],"sensors.":[148],"The":[149],"proposed":[150],"detailed":[154],"on":[156],"particular":[158],"system":[159,194],"level":[160,192],"(e.g.,":[161],"module,":[162],"SoC,":[163],"board)":[164],"can":[166],"compiled":[168],"summary":[171],"status":[175],"its":[178],"turn":[179],"enables":[180],"distributed":[181],"hierarchical":[182],"at":[189],"higher":[191],"hierarchy,":[195],"increasing":[197],"availability":[200],"effective":[202],"lifetime.":[203]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":5}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}