{"id":"https://openalex.org/W4388667085","doi":"https://doi.org/10.1109/dft59622.2023.10313558","title":"Analyzing the Reliability of Alternative Convolution Implementations for Deep Learning Applications","display_name":"Analyzing the Reliability of Alternative Convolution Implementations for Deep Learning Applications","publication_year":2023,"publication_date":"2023-10-03","ids":{"openalex":"https://openalex.org/W4388667085","doi":"https://doi.org/10.1109/dft59622.2023.10313558"},"language":"en","primary_location":{"id":"doi:10.1109/dft59622.2023.10313558","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/dft59622.2023.10313558","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://re.public.polimi.it/bitstream/11311/1259389/1/DFT2023-3.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014159983","display_name":"Cristiana Bolchini","orcid":"https://orcid.org/0000-0001-5065-7906"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Cristiana Bolchini","raw_affiliation_strings":["Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007108808","display_name":"Luca Cassano","orcid":"https://orcid.org/0000-0003-3824-7714"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Cassano","raw_affiliation_strings":["Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031451381","display_name":"Antonio Miele","orcid":"https://orcid.org/0000-0003-3197-0723"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Miele","raw_affiliation_strings":["Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077244764","display_name":"Alessandro Nazzari","orcid":"https://orcid.org/0009-0003-7007-1066"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessandro Nazzari","raw_affiliation_strings":["Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5093260775","display_name":"Dario Passarello","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Dario Passarello","raw_affiliation_strings":["Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5014159983"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":0.1329,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.46404333,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7719916105270386},{"id":"https://openalex.org/keywords/implementation","display_name":"Implementation","score":0.7376255989074707},{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.7145072221755981},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6010521650314331},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4643701910972595},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4234768748283386},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.41511303186416626},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3504398465156555},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1919403076171875},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.15918341279029846}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7719916105270386},{"id":"https://openalex.org/C26713055","wikidata":"https://www.wikidata.org/wiki/Q245962","display_name":"Implementation","level":2,"score":0.7376255989074707},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.7145072221755981},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6010521650314331},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4643701910972595},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4234768748283386},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.41511303186416626},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3504398465156555},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1919403076171875},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.15918341279029846},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dft59622.2023.10313558","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/dft59622.2023.10313558","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1259389","is_oa":true,"landing_page_url":"https://hdl.handle.net/11311/1259389","pdf_url":"https://re.public.polimi.it/bitstream/11311/1259389/1/DFT2023-3.pdf","source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:re.public.polimi.it:11311/1259389","is_oa":true,"landing_page_url":"https://hdl.handle.net/11311/1259389","pdf_url":"https://re.public.polimi.it/bitstream/11311/1259389/1/DFT2023-3.pdf","source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4388667085.pdf","grobid_xml":"https://content.openalex.org/works/W4388667085.grobid-xml"},"referenced_works_count":22,"referenced_works":["https://openalex.org/W2096927458","https://openalex.org/W2102104695","https://openalex.org/W2116097016","https://openalex.org/W2147800946","https://openalex.org/W2155503253","https://openalex.org/W2172654076","https://openalex.org/W2889973014","https://openalex.org/W2908896109","https://openalex.org/W2945580137","https://openalex.org/W2979340153","https://openalex.org/W3000371584","https://openalex.org/W3187862527","https://openalex.org/W3188924112","https://openalex.org/W4211189626","https://openalex.org/W4285261113","https://openalex.org/W4293023174","https://openalex.org/W4297337476","https://openalex.org/W4297337546","https://openalex.org/W4302296459","https://openalex.org/W4310501993","https://openalex.org/W6637151318","https://openalex.org/W6638020065"],"related_works":["https://openalex.org/W2120447654","https://openalex.org/W2977179488","https://openalex.org/W2144453115","https://openalex.org/W2744553356","https://openalex.org/W2128223750","https://openalex.org/W4238532390","https://openalex.org/W2188872161","https://openalex.org/W2961779879","https://openalex.org/W797688974","https://openalex.org/W4390846322"],"abstract_inverted_index":{"Convolution":[0],"represents":[1],"the":[2,10,22,34,56,72,85],"core":[3],"of":[4,13,21,29,36,74],"Deep":[5],"Learning":[6],"(DL)":[7],"applications,":[8],"enabling":[9],"automatic":[11],"extraction":[12],"features":[14],"from":[15],"raw":[16],"input":[17],"data.":[18],"Several":[19],"implementations":[20,32],"convolution":[23,86,93],"have":[24],"been":[25,40,48],"proposed.":[26],"The":[27,100],"impact":[28],"these":[30],"different":[31],"on":[33],"performance":[35],"DL":[37,112],"applications":[38,113],"has":[39,47],"studied.":[41],"However,":[42],"no":[43],"specific":[44],"reliability-related":[45],"analysis":[46,60],"carried":[49],"out.":[50],"In":[51],"this":[52],"paper,":[53],"we":[54],"apply":[55],"CLASSES":[57],"cross-layer":[58],"reliability":[59,116],"methodology":[61],"for":[62,111],"an":[63],"in-depth":[64],"study":[65],"aimed":[66],"at:":[67],"i)":[68],"analyzing":[69],"and":[70,88,117],"characterizing":[71],"effects":[73],"Single":[75],"Event":[76],"Upsets":[77],"occurring":[78],"in":[79],"Graphics":[80],"Processing":[81],"Units":[82],"while":[83],"executing":[84],"operators;":[87],"ii)":[89],"identifying":[90],"whether":[91],"a":[92],"implementation":[94],"is":[95],"more":[96],"robust":[97],"than":[98],"others.":[99],"outcomes":[101],"can":[102],"then":[103],"be":[104],"exploited":[105],"to":[106,114],"tailor":[107],"better":[108],"hardening":[109],"schemes":[110],"improve":[115],"reduce":[118],"overhead.":[119]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-03-12T08:34:05.389933","created_date":"2023-11-15T00:00:00"}