{"id":"https://openalex.org/W4388674573","doi":"https://doi.org/10.1109/dft59622.2023.10313556","title":"Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs","display_name":"Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs","publication_year":2023,"publication_date":"2023-10-03","ids":{"openalex":"https://openalex.org/W4388674573","doi":"https://doi.org/10.1109/dft59622.2023.10313556"},"language":"en","primary_location":{"id":"doi:10.1109/dft59622.2023.10313556","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft59622.2023.10313556","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://ris.utwente.nl/ws/files/496462221/Neutron_Radiation_Tests_of_the_NEORV32_RISC-V_SoC_on_Flash-Based_FPGAs.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5093262341","display_name":"Kevin B\u00f6hmer","orcid":null},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Kevin B\u00f6hmer","raw_affiliation_strings":["University of Twente,The Netherlands","University of Twente, The Netherlands"],"affiliations":[{"raw_affiliation_string":"University of Twente,The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"University of Twente, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015332284","display_name":"Bruno Forlin","orcid":"https://orcid.org/0000-0003-4822-1841"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Bruno Forlin","raw_affiliation_strings":["University of Twente,The Netherlands","University of Twente, The Netherlands"],"affiliations":[{"raw_affiliation_string":"University of Twente,The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"University of Twente, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011899281","display_name":"Carlo Cazzaniga","orcid":"https://orcid.org/0000-0002-3110-0253"},"institutions":[{"id":"https://openalex.org/I1286704778","display_name":"Rutherford Appleton Laboratory","ror":"https://ror.org/03gq8fr08","country_code":"GB","type":"facility","lineage":["https://openalex.org/I1286704778","https://openalex.org/I162524378","https://openalex.org/I4210087105"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Carlo Cazzaniga","raw_affiliation_strings":["Rutherford Appleton Laboratory,UK","Rutherford Appleton Laboratory, UK"],"affiliations":[{"raw_affiliation_string":"Rutherford Appleton Laboratory,UK","institution_ids":["https://openalex.org/I1286704778"]},{"raw_affiliation_string":"Rutherford Appleton Laboratory, UK","institution_ids":["https://openalex.org/I1286704778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054264208","display_name":"Paolo Rech","orcid":"https://orcid.org/0000-0002-9597-1007"},"institutions":[{"id":"https://openalex.org/I193223587","display_name":"University of Trento","ror":"https://ror.org/05trd4x28","country_code":"IT","type":"education","lineage":["https://openalex.org/I193223587"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Paolo Rech","raw_affiliation_strings":["Univeristy of Trento,Italy","Univeristy of Trento, Italy"],"affiliations":[{"raw_affiliation_string":"Univeristy of Trento,Italy","institution_ids":["https://openalex.org/I193223587"]},{"raw_affiliation_string":"Univeristy of Trento, Italy","institution_ids":["https://openalex.org/I193223587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009045604","display_name":"Gianluca Furano","orcid":"https://orcid.org/0000-0001-7624-1415"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Gianluca Furano","raw_affiliation_strings":["European Space Agency,The Netherlands","European Space Agency, The Netherlands"],"affiliations":[{"raw_affiliation_string":"European Space Agency,The Netherlands","institution_ids":[]},{"raw_affiliation_string":"European Space Agency, The Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010135755","display_name":"Nikolaos Alachiotis","orcid":"https://orcid.org/0000-0001-8162-3792"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Nikolaos Alachiotis","raw_affiliation_strings":["University of Twente,The Netherlands","University of Twente, The Netherlands"],"affiliations":[{"raw_affiliation_string":"University of Twente,The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"University of Twente, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048232172","display_name":"Marco Ottavi","orcid":"https://orcid.org/0000-0002-5064-7342"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]},{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["IT","NL"],"is_corresponding":false,"raw_author_name":"Marco Ottavi","raw_affiliation_strings":["University of Twente,The Netherlands","University of Twente, The Netherlands","University of Rome Tor Vergata, Italy"],"affiliations":[{"raw_affiliation_string":"University of Twente,The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"University of Twente, The Netherlands","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"University of Rome Tor Vergata, Italy","institution_ids":["https://openalex.org/I116067653"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5093262341"],"corresponding_institution_ids":["https://openalex.org/I94624287"],"apc_list":null,"apc_paid":null,"fwci":0.9252,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.75016212,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7005161643028259},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6715689897537231},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6692660450935364},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.4739546775817871},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.47269582748413086},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.45508909225463867},{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.41869550943374634},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3179740905761719},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2152801752090454}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7005161643028259},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6715689897537231},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6692660450935364},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.4739546775817871},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.47269582748413086},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.45508909225463867},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.41869550943374634},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3179740905761719},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2152801752090454},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/dft59622.2023.10313556","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft59622.2023.10313556","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:ris.utwente.nl:publications/e1ffe30a-2b59-4571-b962-021fe881a287","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/e1ffe30a-2b59-4571-b962-021fe881a287","pdf_url":"https://ris.utwente.nl/ws/files/496462221/Neutron_Radiation_Tests_of_the_NEORV32_RISC-V_SoC_on_Flash-Based_FPGAs.pdf","source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"B\u00f6hmer, K, Forlin, B, Cazzaniga, C, Rech, P, Furano, G, Alachiotis, N & Ottavi, M 2023, Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs. in L Cassano, M Psarakis, M Traiola & A Bosio (eds), 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT, vol. 36, IEEE, Piscataway, NJ, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, 3/10/23. https://doi.org/10.1109/DFT59622.2023.10313556","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:purl.org/net/epubs:work/56357652","is_oa":false,"landing_page_url":"https://epubs.stfc.ac.uk/work/56357652","pdf_url":null,"source":{"id":"https://openalex.org/S4306400600","display_name":"ePubs (Science and Technology Facilities Council, Research Councils UK)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I162524378","host_organization_name":"Science and Technology Facilities Council","host_organization_lineage":["https://openalex.org/I162524378"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:ris.utwente.nl:publications/e1ffe30a-2b59-4571-b962-021fe881a287","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/e1ffe30a-2b59-4571-b962-021fe881a287","pdf_url":"https://ris.utwente.nl/ws/files/496462221/Neutron_Radiation_Tests_of_the_NEORV32_RISC-V_SoC_on_Flash-Based_FPGAs.pdf","source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"B\u00f6hmer, K, Forlin, B, Cazzaniga, C, Rech, P, Furano, G, Alachiotis, N & Ottavi, M 2023, Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs. in L Cassano, M Psarakis, M Traiola & A Bosio (eds), 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT, vol. 36, IEEE, Piscataway, NJ, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, 3/10/23. https://doi.org/10.1109/DFT59622.2023.10313556","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[{"score":0.8399999737739563,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4388674573.pdf"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W1997473119","https://openalex.org/W2185143587","https://openalex.org/W2770369928","https://openalex.org/W2806983213","https://openalex.org/W2915063325","https://openalex.org/W2944339534","https://openalex.org/W2965326516","https://openalex.org/W2978231018","https://openalex.org/W3004695961","https://openalex.org/W3026432130","https://openalex.org/W3188918325","https://openalex.org/W4297336601","https://openalex.org/W4302577616","https://openalex.org/W4312714658","https://openalex.org/W4376606433","https://openalex.org/W6773523348","https://openalex.org/W6892753374"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W3151633427","https://openalex.org/W2745001401","https://openalex.org/W4321353415","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W2130974462","https://openalex.org/W2109451123","https://openalex.org/W3088304681"],"abstract_inverted_index":{"Highly":[0],"reliable":[1,170],"and":[2,33,113,143],"customizable":[3],"micro-processors":[4],"are":[5,49,65,88],"critical":[6],"enablers":[7],"for":[8,27,98],"future":[9],"intelligent":[10],"space":[11],"platforms.":[12],"From":[13],"an":[14,140,148],"architectural":[15],"point":[16],"of":[17,36,103,119,162],"view,":[18],"the":[19,23,60,79,85,99,104,117,154,160],"RISC-V":[20,111],"architecture":[21],"is":[22,128,137],"current":[24],"best":[25],"option":[26],"adaptability,":[28],"with":[29,147],"its":[30],"modular":[31],"ISA":[32],"a":[34,41,44,107,131,144,168],"multitude":[35],"contributors.":[37],"To":[38],"implement":[39],"such":[40,93],"processor":[42],"at":[43,51],"low":[45,71],"price":[46],"range,":[47],"companies":[48],"looking":[50],"reprogrammable":[52],"Field-Programmable":[53],"Gate":[54],"Arrays":[55],"(FPGAs),":[56],"which":[57],"can":[58],"extend":[59],"mission":[61],"lifetime.":[62],"SRAM":[63],"FPGAs":[64,83],"known":[66],"to":[67,70,92],"be":[68],"susceptible":[69],"Linear":[72],"Energy":[73],"Transfer":[74],"Single-Event":[75],"Upsets":[76],"(SEUs)":[77],"in":[78,89,130,167],"configuration":[80],"memory,":[81],"Flash":[82],"on":[84],"other":[86],"hand,":[87],"general":[90],"immune":[91],"errors.":[94],"This":[95],"paper":[96],"performs":[97],"first":[100],"time":[101],"characterization":[102],"open-core":[105],"NEORV32,":[106],"lightweight":[108],"yet":[109],"representative":[110],"SoC,":[112],"provides":[114],"insights":[115],"into":[116],"tradeoffs":[118],"protection":[120,164],"mechanisms":[121],"against":[122,139],"neutron-induced":[123],"SEUs":[124],"when":[125],"this":[126],"core":[127,136],"implemented":[129],"Flash-based":[132],"FPGA.":[133],"The":[134],"Unmodified":[135],"compared":[138],"ECC-protected":[141],"version":[142],"register-level":[145],"TMR":[146],"ECC":[149,163],"version.":[150],"All":[151],"versions":[152],"execute":[153],"CoreMark":[155],"benchmark.":[156],"We":[157],"show":[158],"how":[159],"addition":[161],"single-handedly":[165],"resulted":[166],"more":[169],"core.":[171]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3}],"updated_date":"2026-03-17T17:19:04.345684","created_date":"2025-10-10T00:00:00"}