{"id":"https://openalex.org/W4310449352","doi":"https://doi.org/10.1109/dft56152.2022.9962353","title":"Study and Comparison of QDI Pipeline Components\u2019 Sensitivity to Permanent Faults","display_name":"Study and Comparison of QDI Pipeline Components\u2019 Sensitivity to Permanent Faults","publication_year":2022,"publication_date":"2022-10-19","ids":{"openalex":"https://openalex.org/W4310449352","doi":"https://doi.org/10.1109/dft56152.2022.9962353"},"language":"en","primary_location":{"id":"doi:10.1109/dft56152.2022.9962353","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft56152.2022.9962353","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052514205","display_name":"Raghda El Shehaby","orcid":"https://orcid.org/0009-0000-6653-9074"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Raghda El Shehaby","raw_affiliation_strings":["TU Wien, Institute of Computer Engineering,Vienna,Austria","TU Wien, Institute of Computer Engineering, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"TU Wien, Institute of Computer Engineering,Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"TU Wien, Institute of Computer Engineering, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006749662","display_name":"Andreas Steininger","orcid":"https://orcid.org/0000-0002-3847-1647"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Andreas Steininger","raw_affiliation_strings":["TU Wien, Institute of Computer Engineering,Vienna,Austria","TU Wien, Institute of Computer Engineering, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"TU Wien, Institute of Computer Engineering,Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"TU Wien, Institute of Computer Engineering, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5052514205"],"corresponding_institution_ids":["https://openalex.org/I145847075"],"apc_list":null,"apc_paid":null,"fwci":0.1481,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.37412801,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9768999814987183,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9768999814987183,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9555000066757202,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9291999936103821,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6971166133880615},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.621735155582428},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5237776637077332},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3686404824256897},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24713793396949768},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.09266665577888489},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.06153601408004761}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6971166133880615},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.621735155582428},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5237776637077332},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3686404824256897},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24713793396949768},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.09266665577888489},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.06153601408004761}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft56152.2022.9962353","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft56152.2022.9962353","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W4402327032","https://openalex.org/W2382290278"],"abstract_inverted_index":{"In":[0,53],"the":[1,9,27,47,58,65,69,71,76,83,104,111,123,129,162,166,173],"presence":[2],"of":[3,12,68,85,131,165,184],"permanent":[4,61],"faults,":[5],"QDI":[6],"circuits":[7,102],"exhibit":[8],"beneficial":[10],"property":[11],"halting":[13],"their":[14],"operation":[15],"until":[16],"a":[17,37,60,132,147,159],"repair":[18],"procedure":[19],"has":[20,63,169],"been":[21],"conducted.":[22],"The":[23],"state":[24],"in":[25,50],"which":[26,141],"circuit":[28,48],"resides,":[29],"however,":[30],"does":[31,126],"not":[32,127],"always":[33],"remain":[34],"clean,":[35],"i.e.,":[36],"recovery":[38],"process":[39],"might":[40],"be":[41],"needed.":[42],"This":[43],"depends":[44],"on":[45,64,100,151,172],"how":[46],"reacts":[49],"these":[51,185],"situations.":[52],"this":[54],"study,":[55],"we":[56,138,153],"investigate":[57,182],"effect":[59],"fault":[62],"different":[66,101],"components":[67],"pipeline,":[70],"logic":[72,112,124,167],"function":[73,113,125],"unit":[74],"and":[75,88,114,136],"butter.":[77],"Our":[78,119],"aim":[79],"is":[80],"to":[81,90,176],"identify":[82],"weaknesses":[84],"each":[86,92],"component":[87],"try":[89],"enhance":[91],"one":[93],"accordingly.":[94],"We":[95,181],"perform":[96,144],"extensive":[97],"fault-injection":[98],"simulations":[99],"following":[103],"famous":[105],"4-phase":[106],"communication":[107],"protocol,":[108],"while":[109],"varying":[110],"butter":[115,134,142],"style":[116,164],"for":[117,146],"comparison.":[118],"results":[120],"show":[121],"that":[122],"affect":[128],"resilience":[130],"specific":[133,148],"type,":[135],"hence":[137],"can":[139],"deduce":[140],"should":[143],"better":[145],"application":[149],"based":[150],"parameters":[152],"extract":[154],"from":[155],"our":[156],"experiments.":[157],"On":[158],"parallel":[160],"note,":[161],"implementation":[163],"also":[168],"an":[170],"impact":[171],"block\u2019s":[174],"ability":[175],"hold":[177],"out":[178],"against":[179],"faults.":[180],"two":[183],"styles.":[186]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}