{"id":"https://openalex.org/W4310501993","doi":"https://doi.org/10.1109/dft56152.2022.9962339","title":"Selective Hardening of CNNs based on Layer Vulnerability Estimation","display_name":"Selective Hardening of CNNs based on Layer Vulnerability Estimation","publication_year":2022,"publication_date":"2022-10-19","ids":{"openalex":"https://openalex.org/W4310501993","doi":"https://doi.org/10.1109/dft56152.2022.9962339"},"language":"en","primary_location":{"id":"doi:10.1109/dft56152.2022.9962339","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft56152.2022.9962339","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hdl.handle.net/11311/1230506","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014159983","display_name":"Cristiana Bolchini","orcid":"https://orcid.org/0000-0001-5065-7906"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Cristiana Bolchini","raw_affiliation_strings":["Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007108808","display_name":"Luca Cassano","orcid":"https://orcid.org/0000-0003-3824-7714"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Cassano","raw_affiliation_strings":["Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031451381","display_name":"Antonio Miele","orcid":"https://orcid.org/0000-0003-3197-0723"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Miele","raw_affiliation_strings":["Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077244764","display_name":"Alessandro Nazzari","orcid":"https://orcid.org/0009-0003-7007-1066"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessandro Nazzari","raw_affiliation_strings":["Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5014159983"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":0.9146,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.73304019,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9882000088691711,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7691992521286011},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.7040073275566101},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6297814846038818},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.6088711619377136},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5520591139793396},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.48552775382995605},{"id":"https://openalex.org/keywords/replication","display_name":"Replication (statistics)","score":0.4824584126472473},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4734078347682953},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.45563310384750366},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3504665493965149},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2835109233856201},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.1073715090751648},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10208010673522949}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7691992521286011},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.7040073275566101},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6297814846038818},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.6088711619377136},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5520591139793396},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.48552775382995605},{"id":"https://openalex.org/C12590798","wikidata":"https://www.wikidata.org/wiki/Q3933199","display_name":"Replication (statistics)","level":2,"score":0.4824584126472473},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4734078347682953},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.45563310384750366},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3504665493965149},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2835109233856201},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.1073715090751648},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10208010673522949},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dft56152.2022.9962339","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft56152.2022.9962339","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1230506","is_oa":true,"landing_page_url":"https://hdl.handle.net/11311/1230506","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:re.public.polimi.it:11311/1230506","is_oa":true,"landing_page_url":"https://hdl.handle.net/11311/1230506","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W2027716782","https://openalex.org/W2096927458","https://openalex.org/W2102104695","https://openalex.org/W2116097016","https://openalex.org/W2889973014","https://openalex.org/W2901848761","https://openalex.org/W2902083778","https://openalex.org/W2903175372","https://openalex.org/W2908896109","https://openalex.org/W2937443896","https://openalex.org/W2943759410","https://openalex.org/W2987441303","https://openalex.org/W3046764219","https://openalex.org/W3101271453","https://openalex.org/W3104353633","https://openalex.org/W3187552919","https://openalex.org/W3190210848","https://openalex.org/W4211189626","https://openalex.org/W4244241786","https://openalex.org/W4285261113","https://openalex.org/W4299281336","https://openalex.org/W6774139053"],"related_works":["https://openalex.org/W4205713785","https://openalex.org/W4293226380","https://openalex.org/W3016766501","https://openalex.org/W2901033488","https://openalex.org/W3086458689","https://openalex.org/W4287666211","https://openalex.org/W2031325922","https://openalex.org/W2898161671","https://openalex.org/W2249859249","https://openalex.org/W4282545449"],"abstract_inverted_index":{"There":[0],"is":[1,19,48],"an":[2],"increasing":[3],"interest":[4],"in":[5,11,87],"employing":[6],"Convolutional":[7],"Neural":[8],"Networks":[9],"(CNNs)":[10],"safety-critical":[12],"application":[13,25,124],"fields.":[14],"In":[15,75],"such":[16],"scenarios,":[17],"it":[18,47],"vital":[20],"to":[21,51,91,97,115,118,129],"ensure":[22],"that":[23],"the":[24,27,37,41,67,70,80,123,126],"fulfills":[26],"reliability":[28,58,101],"requirements":[29],"expressed":[30],"by":[31],"customers":[32],"and":[33,59,63,93],"design":[34,112],"standards.":[35],"On":[36],"other":[38],"hand,":[39],"given":[40],"CNNs":[42,133],"extremely":[43],"high":[44,53],"computational":[45],"requirements,":[46,61],"also":[49],"paramount":[50],"achieve":[52,98],"performance.":[54],"To":[55,106],"meet":[56],"both":[57],"performance":[60],"partial":[62],"selective":[64],"replication":[65],"of":[66,69,84,89,125],"layers":[68,83,117],"CNN":[71,86],"can":[72],"be":[73,119],"applied.":[74],"this":[76,107],"paper,":[77],"we":[78,109],"identify":[79,116],"most":[81],"critical":[82],"a":[85,99,111],"terms":[88],"vulnerability":[90],"fault":[92],"selectively":[94],"duplicate":[95],"them":[96],"target":[100],"vs.":[102],"execution":[103],"time":[104],"trade-off.":[105],"end":[108],"perform":[110],"space":[113],"exploration":[114],"duplicated.":[120],"Results":[121],"on":[122],"proposed":[127],"approach":[128],"four":[130],"case":[131],"study":[132],"are":[134],"reported.":[135]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}