{"id":"https://openalex.org/W4310449417","doi":"https://doi.org/10.1109/dft56152.2022.9962335","title":"Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip","display_name":"Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip","publication_year":2022,"publication_date":"2022-10-19","ids":{"openalex":"https://openalex.org/W4310449417","doi":"https://doi.org/10.1109/dft56152.2022.9962335"},"language":"en","primary_location":{"id":"doi:10.1109/dft56152.2022.9962335","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft56152.2022.9962335","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://zenodo.org/record/7590414","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045486535","display_name":"Douglas A. Santos","orcid":"https://orcid.org/0000-0002-6502-4682"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Douglas A. Santos","raw_affiliation_strings":["University of Montpellier, CNRS,LIRMM,Montpellier,France","LIRMM, University of Montpellier, CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"University of Montpellier, CNRS,LIRMM,Montpellier,France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM, University of Montpellier, CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087104917","display_name":"Andr\u00e9 Martins Pio de Mattos","orcid":"https://orcid.org/0000-0001-9872-2199"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Andre M. P. Mattos","raw_affiliation_strings":["University of Montpellier, CNRS,LIRMM,Montpellier,France","LIRMM, University of Montpellier, CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"University of Montpellier, CNRS,LIRMM,Montpellier,France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM, University of Montpellier, CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040663373","display_name":"Lucas Matana Luza","orcid":"https://orcid.org/0000-0003-4633-9483"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lucas M. Luza","raw_affiliation_strings":["University of Montpellier, CNRS,LIRMM,Montpellier,France","LIRMM, University of Montpellier, CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"University of Montpellier, CNRS,LIRMM,Montpellier,France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM, University of Montpellier, CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011899281","display_name":"Carlo Cazzaniga","orcid":"https://orcid.org/0000-0002-3110-0253"},"institutions":[{"id":"https://openalex.org/I1286704778","display_name":"Rutherford Appleton Laboratory","ror":"https://ror.org/03gq8fr08","country_code":"GB","type":"facility","lineage":["https://openalex.org/I1286704778","https://openalex.org/I162524378","https://openalex.org/I4210087105"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Carlo Cazzaniga","raw_affiliation_strings":["ISIS Facility, STFC, Rutherford Appleton Laboratory,United Kingdom","ISIS Facility, STFC, Rutherford Appleton Laboratory, United Kingdom"],"affiliations":[{"raw_affiliation_string":"ISIS Facility, STFC, Rutherford Appleton Laboratory,United Kingdom","institution_ids":["https://openalex.org/I1286704778"]},{"raw_affiliation_string":"ISIS Facility, STFC, Rutherford Appleton Laboratory, United Kingdom","institution_ids":["https://openalex.org/I1286704778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042871814","display_name":"Maria Kastriotou","orcid":"https://orcid.org/0000-0003-1010-2396"},"institutions":[{"id":"https://openalex.org/I1286704778","display_name":"Rutherford Appleton Laboratory","ror":"https://ror.org/03gq8fr08","country_code":"GB","type":"facility","lineage":["https://openalex.org/I1286704778","https://openalex.org/I162524378","https://openalex.org/I4210087105"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Maria Kastriotou","raw_affiliation_strings":["ISIS Facility, STFC, Rutherford Appleton Laboratory,United Kingdom","ISIS Facility, STFC, Rutherford Appleton Laboratory, United Kingdom"],"affiliations":[{"raw_affiliation_string":"ISIS Facility, STFC, Rutherford Appleton Laboratory,United Kingdom","institution_ids":["https://openalex.org/I1286704778"]},{"raw_affiliation_string":"ISIS Facility, STFC, Rutherford Appleton Laboratory, United Kingdom","institution_ids":["https://openalex.org/I1286704778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007786013","display_name":"Douglas R. Melo","orcid":"https://orcid.org/0000-0001-5791-6958"},"institutions":[{"id":"https://openalex.org/I4210144729","display_name":"Universidade do Vale do Itaja\u00ed","ror":"https://ror.org/041pjwa23","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210144729"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Douglas R. Melo","raw_affiliation_strings":["University of Vale do Itajaí,LEDS,Brazil"],"affiliations":[{"raw_affiliation_string":"University of Vale do Itajaí,LEDS,Brazil","institution_ids":["https://openalex.org/I4210144729"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001777299","display_name":"Luigi Dilillo","orcid":"https://orcid.org/0000-0002-1295-2688"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Luigi Dilillo","raw_affiliation_strings":["University of Montpellier, CNRS,LIRMM,Montpellier,France","LIRMM, University of Montpellier, CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"University of Montpellier, CNRS,LIRMM,Montpellier,France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM, University of Montpellier, CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5045486535"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"],"apc_list":null,"apc_paid":null,"fwci":0.7386,"has_fulltext":true,"cited_by_count":9,"citation_normalized_percentile":{"value":0.69592679,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9886000156402588,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6296244859695435},{"id":"https://openalex.org/keywords/workload","display_name":"Workload","score":0.6111634969711304},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5590893030166626},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4776512384414673},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4753137230873108},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.467615008354187},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.45513781905174255},{"id":"https://openalex.org/keywords/neutron-irradiation","display_name":"Neutron irradiation","score":0.451272189617157},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.433937668800354},{"id":"https://openalex.org/keywords/neutron","display_name":"Neutron","score":0.4145895838737488},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.25752466917037964},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.17231830954551697},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16341739892959595},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08648207783699036}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6296244859695435},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.6111634969711304},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5590893030166626},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4776512384414673},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4753137230873108},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.467615008354187},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.45513781905174255},{"id":"https://openalex.org/C2982764207","wikidata":"https://www.wikidata.org/wiki/Q901707","display_name":"Neutron irradiation","level":3,"score":0.451272189617157},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.433937668800354},{"id":"https://openalex.org/C152568617","wikidata":"https://www.wikidata.org/wiki/Q2348","display_name":"Neutron","level":2,"score":0.4145895838737488},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.25752466917037964},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.17231830954551697},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16341739892959595},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08648207783699036},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/dft56152.2022.9962335","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft56152.2022.9962335","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:zenodo.org:7590414","is_oa":true,"landing_page_url":"https://zenodo.org/record/7590414","pdf_url":"https://zenodo.org/record/7590414","source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:HAL:lirmm-03833983v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03833983","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.dfts.org","raw_type":"Conference papers"},{"id":"pmh:oai:purl.org/net/epubs:work/54078667","is_oa":false,"landing_page_url":"https://epubs.stfc.ac.uk/work/54078667","pdf_url":null,"source":{"id":"https://openalex.org/S4306400600","display_name":"ePubs (Science and Technology Facilities Council, Research Councils UK)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I162524378","host_organization_name":"Science and Technology Facilities Council","host_organization_lineage":["https://openalex.org/I162524378"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:7590414","is_oa":true,"landing_page_url":"https://zenodo.org/record/7590414","pdf_url":"https://zenodo.org/record/7590414","source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4310449417.pdf","grobid_xml":"https://content.openalex.org/works/W4310449417.grobid-xml"},"referenced_works_count":18,"referenced_works":["https://openalex.org/W2100624635","https://openalex.org/W2185143587","https://openalex.org/W2199022074","https://openalex.org/W2582467784","https://openalex.org/W2744495028","https://openalex.org/W2770020066","https://openalex.org/W2895268534","https://openalex.org/W2944339534","https://openalex.org/W2966099395","https://openalex.org/W3023961462","https://openalex.org/W3146456515","https://openalex.org/W3158069832","https://openalex.org/W3188918325","https://openalex.org/W3197721294","https://openalex.org/W4394736768","https://openalex.org/W6893764336","https://openalex.org/W6987144925","https://openalex.org/W6999016131"],"related_works":["https://openalex.org/W986318368","https://openalex.org/W2000785801","https://openalex.org/W2384410913","https://openalex.org/W2352878646","https://openalex.org/W2990194547","https://openalex.org/W2004734601","https://openalex.org/W2130149817","https://openalex.org/W1480123525","https://openalex.org/W2620865396","https://openalex.org/W1975191388"],"abstract_inverted_index":{"The":[0,69,86],"radiation":[1],"in":[2,41,58,65,97,126],"harsh":[3],"environments":[4],"affects":[5],"electronic":[6],"systems,":[7],"inducing":[8],"permanent":[9],"and":[10,23,60,120,136],"temporary":[11],"errors.":[12],"These":[13],"effects":[14],"lead":[15],"to":[16,20,79],"unpredictable":[17],"behaviors":[18],"detrimental":[19],"critical":[21],"applications":[22],"fail-safe":[24],"systems.":[25],"This":[26,107],"work":[27,46,108],"evaluates":[28],"the":[29,49,52,80,84,114,123,137],"reliability":[30,76],"of":[31,51,55,83,113,133,139],"a":[32,42,62,74,89,110,130],"fault-tolerant":[33],"RISC-V":[34],"System-on-Chip":[35],"(SoC)":[36],"under":[37],"atmospheric":[38],"neutron":[39],"irradiation":[40,67],"particle":[43],"accelerator.":[44],"Prior":[45],"has":[47],"analyzed":[48],"effectiveness":[50],"hardening":[53,71],"techniques":[54,72],"this":[56],"SoC":[57],"simulation":[59],"provided":[61],"preliminary":[63],"characterization":[64],"an":[66],"facility.":[68],"applied":[70],"showed":[73],"significant":[75],"improvement":[77],"compared":[78],"unhardened":[81],"implementation":[82,134],"SoC.":[85],"system":[87],"executed":[88],"performance":[90],"benchmark":[91],"as":[92],"workload,":[93],"which":[94],"finished":[95],"correctly":[96],"most":[98],"runs":[99],"despite":[100],"suffering":[101],"from":[102],"Single":[103],"Event":[104],"Effects":[105],"(SEEs).":[106],"presents":[109],"detailed":[111],"analysis":[112,124],"experimental":[115],"results,":[116],"reporting":[117],"error":[118],"rates":[119],"classification,":[121],"extending":[122],"given":[125],"previous":[127],"works.":[128],"Finally,":[129],"comprehensive":[131],"discussion":[132],"limitations":[135],"proposition":[138],"further":[140],"improvements":[141],"are":[142],"provided.":[143]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3}],"updated_date":"2026-04-19T06:08:04.723047","created_date":"2022-12-10T00:00:00"}