{"id":"https://openalex.org/W3210240472","doi":"https://doi.org/10.1109/dft52944.2021.9568351","title":"A Fault Model to Detect Design Errors in Combinational Circuits","display_name":"A Fault Model to Detect Design Errors in Combinational Circuits","publication_year":2021,"publication_date":"2021-10-06","ids":{"openalex":"https://openalex.org/W3210240472","doi":"https://doi.org/10.1109/dft52944.2021.9568351","mag":"3210240472"},"language":"en","primary_location":{"id":"doi:10.1109/dft52944.2021.9568351","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft52944.2021.9568351","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002871794","display_name":"Puneet Ramesh Savanur","orcid":null},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Puneet Ramesh Savanur","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, Carbondale, IL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, Carbondale, IL, USA","institution_ids":["https://openalex.org/I110378019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083284025","display_name":"Spyros Tragoudas","orcid":"https://orcid.org/0009-0006-2575-3588"},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Spyros Tragoudas","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, Carbondale, IL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, Carbondale, IL, USA","institution_ids":["https://openalex.org/I110378019"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I110378019"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17195299,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.8332312107086182},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6766369938850403},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6650471687316895},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5332388877868652},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5203627943992615},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5175511240959167},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.46712902188301086},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4670464098453522},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.43887466192245483},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.43260428309440613},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4304335117340088},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3356538414955139},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.32533150911331177},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21463707089424133},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1295645833015442}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.8332312107086182},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6766369938850403},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6650471687316895},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5332388877868652},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5203627943992615},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5175511240959167},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.46712902188301086},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4670464098453522},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.43887466192245483},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.43260428309440613},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4304335117340088},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3356538414955139},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.32533150911331177},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21463707089424133},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1295645833015442},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft52944.2021.9568351","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft52944.2021.9568351","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.6800000071525574,"display_name":"Peace, Justice and strong institutions"}],"awards":[{"id":"https://openalex.org/G6010437740","display_name":null,"funder_award_id":"IIP1361847","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W32887977","https://openalex.org/W345239313","https://openalex.org/W1538643901","https://openalex.org/W2026399599","https://openalex.org/W2061946964","https://openalex.org/W2096007426","https://openalex.org/W2100425664","https://openalex.org/W2104219811","https://openalex.org/W2111994103","https://openalex.org/W2136043644","https://openalex.org/W2149107969","https://openalex.org/W2162200351","https://openalex.org/W2534524955","https://openalex.org/W6601390065"],"related_works":["https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W2340957901","https://openalex.org/W1555400249","https://openalex.org/W2031110496","https://openalex.org/W2157154381","https://openalex.org/W2568949342","https://openalex.org/W2037862379","https://openalex.org/W4253743993","https://openalex.org/W4252048065"],"abstract_inverted_index":{"A":[0],"new":[1],"fault":[2],"model":[3,46],"capable":[4],"of":[5,16,31,55,61],"effectively":[6],"detecting":[7],"design":[8],"errors":[9],"or":[10],"defects":[11],"that":[12],"alter":[13],"the":[14,29,44,53,56,59],"functionality":[15],"an":[17],"embedded":[18],"module":[19],"in":[20],"a":[21,62],"circuit":[22],"is":[23,26,47],"presented.":[24,49],"It":[25],"built":[27],"on":[28],"principle":[30],"Modified":[32],"Condition":[33],"Decision":[34],"Coverage.":[35],"An":[36],"approach":[37,57],"to":[38],"efficiently":[39],"generate":[40],"test":[41],"patterns":[42],"using":[43],"proposed":[45],"also":[48],"Experimental":[50],"results":[51],"demonstrate":[52],"effectiveness":[54],"at":[58],"gates":[60],"combinational":[63],"circuit.":[64]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}