{"id":"https://openalex.org/W3209043743","doi":"https://doi.org/10.1109/dft52944.2021.9568336","title":"Analysis and Evaluation of the Effects of Single Event Upsets (SEU s) on Memories in Polar Decoders","display_name":"Analysis and Evaluation of the Effects of Single Event Upsets (SEU s) on Memories in Polar Decoders","publication_year":2021,"publication_date":"2021-10-06","ids":{"openalex":"https://openalex.org/W3209043743","doi":"https://doi.org/10.1109/dft52944.2021.9568336","mag":"3209043743"},"language":"en","primary_location":{"id":"doi:10.1109/dft52944.2021.9568336","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft52944.2021.9568336","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086818582","display_name":"Zhen Gao","orcid":"https://orcid.org/0000-0001-9887-1418"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhen Gao","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002746311","display_name":"Ruize Wang","orcid":"https://orcid.org/0000-0001-6281-4091"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruize Wang","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018506158","display_name":"Haoyu Du","orcid":"https://orcid.org/0009-0009-3948-3437"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haoyu Du","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Pedro Reviriego","raw_affiliation_strings":["ARIES Research Center, Universidad Antonio de Nebrija, Madrid, Spain"],"affiliations":[{"raw_affiliation_string":"ARIES Research Center, Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5086818582"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18647307,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11321","display_name":"Error Correcting Code Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11321","display_name":"Error Correcting Code Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10125","display_name":"Advanced Wireless Communication Techniques","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12029","display_name":"DNA and Biological Computing","score":0.9900000095367432,"subfield":{"id":"https://openalex.org/subfields/1312","display_name":"Molecular Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/polar-code","display_name":"Polar code","score":0.8409218788146973},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.7949914932250977},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7405300140380859},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7042843103408813},{"id":"https://openalex.org/keywords/polar","display_name":"Polar","score":0.6141621470451355},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.5270314812660217},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.5235400199890137},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.5021662712097168},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4778056740760803},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.44195619225502014},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.43072718381881714},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.41546082496643066},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40452444553375244},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.38872793316841125},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3409702181816101},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.20009294152259827},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.18143507838249207},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1492426097393036},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.08495140075683594},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07488438487052917}],"concepts":[{"id":"https://openalex.org/C2778396592","wikidata":"https://www.wikidata.org/wiki/Q7209069","display_name":"Polar code","level":3,"score":0.8409218788146973},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.7949914932250977},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7405300140380859},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7042843103408813},{"id":"https://openalex.org/C29705727","wikidata":"https://www.wikidata.org/wiki/Q294562","display_name":"Polar","level":2,"score":0.6141621470451355},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.5270314812660217},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.5235400199890137},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.5021662712097168},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4778056740760803},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.44195619225502014},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.43072718381881714},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.41546082496643066},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40452444553375244},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.38872793316841125},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3409702181816101},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.20009294152259827},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18143507838249207},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1492426097393036},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.08495140075683594},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07488438487052917},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft52944.2021.9568336","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft52944.2021.9568336","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3978025620","display_name":null,"funder_award_id":"TAPIR-CM,P2018/TCS-4496","funder_id":"https://openalex.org/F4320313831","funder_display_name":"Comunidad de Madrid"}],"funders":[{"id":"https://openalex.org/F4320313831","display_name":"Comunidad de Madrid","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W571536966","https://openalex.org/W1512085033","https://openalex.org/W1580543952","https://openalex.org/W1607327922","https://openalex.org/W2055534149","https://openalex.org/W2106045225","https://openalex.org/W2150498905","https://openalex.org/W2163509114","https://openalex.org/W2168323440","https://openalex.org/W2284321898","https://openalex.org/W2475646144","https://openalex.org/W2518374686","https://openalex.org/W2541133130","https://openalex.org/W3035380969","https://openalex.org/W3082143909","https://openalex.org/W3147637518","https://openalex.org/W6630600501","https://openalex.org/W6634799193"],"related_works":["https://openalex.org/W2963228343","https://openalex.org/W3009157344","https://openalex.org/W1599814246","https://openalex.org/W3106389544","https://openalex.org/W3080200660","https://openalex.org/W627911969","https://openalex.org/W2008803526","https://openalex.org/W3196757433","https://openalex.org/W1514186088","https://openalex.org/W2895000685"],"abstract_inverted_index":{"Polar":[0],"codes":[1],"are":[2,31,123],"used":[3,33],"in":[4,34,39,47,95],"5G":[5],"system":[6],"for":[7,20,158],"the":[8,45,48,66,81,89,93,101,105,111,127,141,147,151],"transmission":[9],"of":[10,68,83,92,107,113,116,129,138,153,167,179],"control":[11],"channels":[12],"due":[13],"to":[14,71,110,125,176,182],"its":[15],"excellent":[16],"error":[17],"correction":[18],"capability":[19],"short":[21],"sequence,":[22],"and":[23,61,150,164],"CRC":[24],"assistant":[25],"successive":[26],"cancellation":[27],"list":[28],"(CA-SCL)":[29],"decoders":[30,155,181],"commonly":[32],"practical":[35],"system.":[36],"When":[37],"applied":[38],"critical":[40],"environment,":[41],"e.g.":[42],"space":[43],"platform,":[44],"memories":[46,74,94,142],"hardware":[49],"polar":[50,69,154,180],"decoder":[51,70,98,148,169],"will":[52,173],"suffer":[53],"single-event":[54],"upsets":[55,86],"(SEUs)":[56,87],"that":[57,135],"can":[58,143],"cause":[59],"failures":[60],"disrupt":[62],"communications.":[63],"Therefore,":[64],"analyzing":[65],"reliability":[67,112,152],"SEUs":[72,139],"on":[73,88,100,140],"is":[75,156],"important.":[76],"This":[77],"paper":[78],"first":[79],"analyzes":[80],"effects":[82],"single":[84],"event":[85],"different":[90],"parts":[91],"a":[96],"CA-SCL":[97],"based":[99],"decoding":[102],"principle,":[103],"including":[104],"influence":[106],"main":[108],"parameters":[109],"each":[114],"part":[115],"user":[117],"memory.":[118],"Then":[119],"fault":[120],"injection":[121],"simulations":[122],"performed":[124],"check":[126],"conclusions":[128],"theoretical":[130],"analysis.":[131],"Experiment":[132],"results":[133,172],"show":[134],"about":[136],"99%":[137],"be":[144,174],"tolerated":[145],"by":[146],"itself,":[149],"higher":[157],"longer":[159],"code,":[160],"lower":[161],"code":[162],"rate":[163],"larger":[165],"number":[166],"parallel":[168],"units.":[170],"These":[171],"valuable":[175],"efficient":[177],"protection":[178],"SEUs.":[183]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}