{"id":"https://openalex.org/W3211299416","doi":"https://doi.org/10.1109/dft52944.2021.9568326","title":"An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults","display_name":"An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults","publication_year":2021,"publication_date":"2021-10-06","ids":{"openalex":"https://openalex.org/W3211299416","doi":"https://doi.org/10.1109/dft52944.2021.9568326","mag":"3211299416"},"language":"en","primary_location":{"id":"doi:10.1109/dft52944.2021.9568326","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft52944.2021.9568326","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058697402","display_name":"Anuraag Narang","orcid":null},"institutions":[{"id":"https://openalex.org/I146655781","display_name":"University of Liverpool","ror":"https://ror.org/04xs57h96","country_code":"GB","type":"education","lineage":["https://openalex.org/I146655781"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Anuraag Narang","raw_affiliation_strings":["Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool, United Kingdom","institution_ids":["https://openalex.org/I146655781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086444218","display_name":"Balaji Venu","orcid":"https://orcid.org/0000-0001-7696-9473"},"institutions":[{"id":"https://openalex.org/I2801109035","display_name":"ARM (United Kingdom)","ror":"https://ror.org/04mmhzs81","country_code":"GB","type":"company","lineage":["https://openalex.org/I2801109035"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Balaji Venu","raw_affiliation_strings":["Arm Ltd., Cambridge, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arm Ltd., Cambridge, United Kingdom","institution_ids":["https://openalex.org/I2801109035"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107854382","display_name":"Saqib Khursheed","orcid":"https://orcid.org/0000-0002-5720-0607"},"institutions":[{"id":"https://openalex.org/I146655781","display_name":"University of Liverpool","ror":"https://ror.org/04xs57h96","country_code":"GB","type":"education","lineage":["https://openalex.org/I146655781"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Saqib Khursheed","raw_affiliation_strings":["Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool, United Kingdom","institution_ids":["https://openalex.org/I146655781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110258524","display_name":"Peter Harrod","orcid":null},"institutions":[{"id":"https://openalex.org/I2801109035","display_name":"ARM (United Kingdom)","ror":"https://ror.org/04mmhzs81","country_code":"GB","type":"company","lineage":["https://openalex.org/I2801109035"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Peter Harrod","raw_affiliation_strings":["Arm Ltd., Cambridge, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arm Ltd., Cambridge, United Kingdom","institution_ids":["https://openalex.org/I2801109035"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4539,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.60586057,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.7263677716255188},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.72137051820755},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6155760884284973},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5477159023284912},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.544102668762207},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5176506638526917},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.4769103527069092},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4567874073982239},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4405781030654907},{"id":"https://openalex.org/keywords/pruning","display_name":"Pruning","score":0.4380744397640228},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4136436879634857},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3256717622280121},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.31854912638664246},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30837976932525635}],"concepts":[{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.7263677716255188},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.72137051820755},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6155760884284973},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5477159023284912},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.544102668762207},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5176506638526917},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.4769103527069092},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4567874073982239},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4405781030654907},{"id":"https://openalex.org/C108010975","wikidata":"https://www.wikidata.org/wiki/Q500094","display_name":"Pruning","level":2,"score":0.4380744397640228},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4136436879634857},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3256717622280121},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.31854912638664246},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30837976932525635},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft52944.2021.9568326","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft52944.2021.9568326","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4280696163","display_name":"DTP 2016-2017 University of Liverpool","funder_award_id":"EP/N509693/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2145071552","https://openalex.org/W2416978151","https://openalex.org/W2566036489","https://openalex.org/W2783572681","https://openalex.org/W2792567960","https://openalex.org/W2918741387","https://openalex.org/W2947185665","https://openalex.org/W2981373258","https://openalex.org/W3038628877","https://openalex.org/W3102759955","https://openalex.org/W3173023159","https://openalex.org/W6749477282"],"related_works":["https://openalex.org/W2150780157","https://openalex.org/W2024194466","https://openalex.org/W3148663848","https://openalex.org/W2021253405","https://openalex.org/W2951627661","https://openalex.org/W2142519941","https://openalex.org/W2145224123","https://openalex.org/W2463298697","https://openalex.org/W2130111591","https://openalex.org/W2098049592"],"abstract_inverted_index":{"Microprocessor":[0],"software":[1],"test":[2,36,90,97,122,201,208,233],"libraries":[3],"(STLs)":[4],"must":[5],"provide":[6],"maximum":[7],"fault":[8,28,32,111,222],"coverage":[9,33,112,131,223,242],"with":[10,113,137,165,224,248,276],"minimum":[11],"overhead.":[12,37,98,209],"Pruning":[13],"safe":[14,49,76,85,133,187,196,244],"faults,":[15,50],"which":[16],"cannot":[17],"cause":[18],"errors":[19],"in":[20,92,110,203,221],"the":[21,24,27,45,63,80,114,117,130,174,191,225,228,241],"output":[22],"of":[23,47,65,116,132,149,176,227,243,260],"processor,":[25],"from":[26],"list":[29],"can":[30,42],"increase":[31],"without":[34],"adding":[35],"Applying":[38],"more":[39,48,161,272],"application-specific":[40],"constraints":[41,54,68,73,179,184],"lead":[43],"to":[44,57,94,107,129,205,218,240],"identification":[46],"and":[51,160,271],"some":[52],"such":[53],"are":[55],"yet":[56],"be":[58],"explored.":[59],"This":[60,171],"work":[61,172],"explores":[62,173],"use":[64,115,175,226],"signal":[66,177],"combination-based":[67,178],"alongside":[69,180],"well-known":[70,181],"constant":[71,182],"signal-based":[72,183],"for":[74,79,100,157,168,185,190,211,268,279],"identifying":[75,186],"faults.":[77,188],"Also,":[78,189],"first":[81,192],"time,":[82,193],"information":[83,194],"on":[84,147,195,258],"faults":[86,134,197,245],"is":[87,135,198,246],"utilised":[88,199],"during":[89,200],"compaction":[91,151,202,262],"order":[93,204],"further":[95,206],"minimise":[96,207],"Results":[99,210],"an":[101,212],"OpenRISC":[102,213],"processor":[103,214],"design":[104,164,215,275],"show":[105,216],"up":[106,217],"2.33%":[108,219],"improvement":[109,220],"proposed":[118,229],"constraints.":[119,230],"In":[120,231],"one":[121,232],"program,":[123,234],"a":[124,141,158,235,252,269],"code":[125,144,236,255],"segment":[126,237],"contributing":[127,238],"only":[128,239],"identified,":[136,247],"its":[138,249],"removal":[139,250],"providing":[140,251],"1.09":[142,253],"%":[143,254],"size":[145,256],"reduction":[146,257],"top":[148,259],"existing":[150,261],"techniques.":[152,263],"The":[153,264],"results":[154,265],"may":[155,266],"vary":[156,267],"larger":[159,270],"complex":[162,273],"commercial":[163,274],"greater":[166,277],"scope":[167,278],"redundant":[169,280],"logic.":[170,281]},"counts_by_year":[{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}