{"id":"https://openalex.org/W3208095669","doi":"https://doi.org/10.1109/dft52944.2021.9568290","title":"RADPlace: A Timing-aware RAdiation-Hardening Detailed Placement Scheme Satisfying TMR Spacing Constraints","display_name":"RADPlace: A Timing-aware RAdiation-Hardening Detailed Placement Scheme Satisfying TMR Spacing Constraints","publication_year":2021,"publication_date":"2021-10-06","ids":{"openalex":"https://openalex.org/W3208095669","doi":"https://doi.org/10.1109/dft52944.2021.9568290","mag":"3208095669"},"language":"en","primary_location":{"id":"doi:10.1109/dft52944.2021.9568290","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft52944.2021.9568290","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015586753","display_name":"Christos Georgakidis","orcid":"https://orcid.org/0000-0002-7491-2606"},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Christos Georgakidis","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Thessaly, Volos, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Thessaly, Volos, Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035300872","display_name":"Iordanis Lilitsis","orcid":null},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Iordanis Lilitsis","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Thessaly, Volos, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Thessaly, Volos, Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042615933","display_name":"Georgios Stanimeropoulos","orcid":null},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Georgios Stanimeropoulos","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Thessaly, Volos, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Thessaly, Volos, Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103066371","display_name":"Christos Sotiriou","orcid":"https://orcid.org/0000-0001-9318-474X"},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Christos Sotiriou","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Thessaly, Volos, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Thessaly, Volos, Greece","institution_ids":["https://openalex.org/I145722265"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5015586753"],"corresponding_institution_ids":["https://openalex.org/I145722265"],"apc_list":null,"apc_paid":null,"fwci":0.3036,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.57298438,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6083148121833801},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.5215632319450378},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5111826062202454},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5003936290740967},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.45927363634109497},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.4566532373428345},{"id":"https://openalex.org/keywords/rdm","display_name":"RDM","score":0.455939918756485},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4323112368583679},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.4297247529029846},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.41654258966445923},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32094770669937134},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.31613439321517944},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2420976459980011},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19364288449287415},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18875917792320251},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09677863121032715},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0954943299293518}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6083148121833801},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.5215632319450378},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5111826062202454},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5003936290740967},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.45927363634109497},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.4566532373428345},{"id":"https://openalex.org/C114965421","wikidata":"https://www.wikidata.org/wiki/Q2069955","display_name":"RDM","level":2,"score":0.455939918756485},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4323112368583679},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.4297247529029846},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.41654258966445923},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32094770669937134},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.31613439321517944},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2420976459980011},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19364288449287415},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18875917792320251},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09677863121032715},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0954943299293518},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dft52944.2021.9568290","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft52944.2021.9568290","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:ir.lib.uth.gr:11615/72037","is_oa":false,"landing_page_url":"http://hdl.handle.net/11615/72037","pdf_url":null,"source":{"id":"https://openalex.org/S4306400243","display_name":"University of Thessaly Institutional Repository (University of Thessaly)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I145722265","host_organization_name":"University of Thessaly","host_organization_lineage":["https://openalex.org/I145722265"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT","raw_type":"conferenceItem"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5199999809265137,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1567490303","https://openalex.org/W1832104134","https://openalex.org/W1945306823","https://openalex.org/W1971476921","https://openalex.org/W2050431855","https://openalex.org/W2061643944","https://openalex.org/W2114136290","https://openalex.org/W2167002145","https://openalex.org/W2497735908","https://openalex.org/W2560787762","https://openalex.org/W2751111909","https://openalex.org/W3040935927","https://openalex.org/W3046969749","https://openalex.org/W3108693540","https://openalex.org/W3137237606","https://openalex.org/W3182208082","https://openalex.org/W4234143391","https://openalex.org/W6638531267","https://openalex.org/W6676886990"],"related_works":["https://openalex.org/W2995137536","https://openalex.org/W1749592617","https://openalex.org/W2537369590","https://openalex.org/W2116473596","https://openalex.org/W2007710086","https://openalex.org/W2045255589","https://openalex.org/W2126481660","https://openalex.org/W2563310135","https://openalex.org/W2068711101","https://openalex.org/W3182233882"],"abstract_inverted_index":{"The":[0,89],"continuous":[1],"evolution":[2,123],"of":[3,124],"VLSI":[4],"technology":[5],"as":[6,8,24],"well":[7],"the":[9,13,28,49,81,86,135,140],"device":[10],"shrinking":[11],"render":[12],"Integrated":[14],"Circuits":[15],"more":[16],"susceptible":[17],"to":[18,39,69,133,158,164],"hazards":[19],"caused":[20,43],"by":[21,44,93],"ionising":[22,45],"radiation,":[23,46],"Soft":[25],"Errors.":[26],"Moreover,":[27],"Radiation":[29],"Hardening":[30],"process,":[31,83],"i.e.":[32],"rendering":[33],"electronic":[34],"cells":[35],"and":[36,53,114,166],"circuits":[37],"resistant":[38],"damage":[40],"or":[41],"malfunction":[42],"differs":[47],"from":[48,56,59],"standard":[50],"design":[51],"flow":[52],"suffers":[54],"currently":[55],"insufficient":[57],"support":[58],"industrial":[60],"EDA":[61],"tools.":[62],"R-Abax":[63,94,109],"is":[64],"an":[65,122,154],"academic":[66],"tool":[67],"able":[68],"satisfy":[70],"user-specified":[71,141],"spacing":[72,90,144],"constraints":[73,91],"between":[74],"Triple":[75],"Modular":[76],"Redundancy":[77],"(TMR)":[78],"members,":[79],"during":[80,85],"Place&Route":[82],"specifically":[84],"Legalisation":[87],"step.":[88],"enforced":[92],"ensure":[95],"that":[96,149],"a":[97,127],"particle":[98],"strike":[99],"will":[100],"only":[101],"affect":[102],"at":[103],"most":[104],"one":[105],"TMR":[106,142],"triplet":[107],"member.":[108],"may":[110],"operate":[111],"in":[112],"Displacement-driven":[113],"HPWL-driven":[115],"mode.":[116],"In":[117],"this":[118],"work,":[119],"we":[120],"propose":[121],"R-Abax,":[125],"RADPlace,":[126],"Timing-Aware":[128],"Detailed":[129,151],"Placement":[130,152],"algorithm,":[131],"aiming":[132],"improve":[134],"circuit":[136,159],"timing,":[137],"while":[138],"enforcing":[139],"groups":[143],"constraints.":[145],"Experimental":[146],"results":[147],"indicate":[148],"RADPlace":[150],"achieves,":[153],"average":[155],"18%":[156],"improvement":[157],"performance,":[160],"with":[161],"negligible":[162],"changes":[163],"area":[165],"power":[167],"consumption.":[168]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2021-11-08T00:00:00"}