{"id":"https://openalex.org/W2981510518","doi":"https://doi.org/10.1109/dft.2019.8875475","title":"Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory","display_name":"Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W2981510518","doi":"https://doi.org/10.1109/dft.2019.8875475","mag":"2981510518"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2019.8875475","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2019.8875475","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025660","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040663373","display_name":"Lucas Matana Luza","orcid":"https://orcid.org/0000-0003-4633-9483"},"institutions":[{"id":"https://openalex.org/I4647051","display_name":"Universit\u00e9 de Picardie Jules Verne","ror":"https://ror.org/01gyxrk03","country_code":"FR","type":"education","lineage":["https://openalex.org/I4647051"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lucas Matana Luza","raw_affiliation_strings":["LIRMM, University of Montnellier, Montnellier, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LIRMM, University of Montnellier, Montnellier, France","institution_ids":["https://openalex.org/I4647051"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064471282","display_name":"Alexandre Bosser","orcid":"https://orcid.org/0000-0002-0764-9051"},"institutions":[{"id":"https://openalex.org/I9927081","display_name":"Aalto University","ror":"https://ror.org/020hwjq30","country_code":"FI","type":"education","lineage":["https://openalex.org/I9927081"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Alexandre Bosser","raw_affiliation_strings":["School of Electrical Engineering, Aalto University, Espoo, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Aalto University, Espoo, Finland","institution_ids":["https://openalex.org/I9927081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018846997","display_name":"Viyas Gupta","orcid":"https://orcid.org/0000-0003-3611-2971"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Viyas Gupta","raw_affiliation_strings":["ESA/ESEC-Galaxia, European Space Agency, Transinne, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESA/ESEC-Galaxia, European Space Agency, Transinne, Belgium","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025847720","display_name":"Arto Javanainen","orcid":"https://orcid.org/0000-0001-7906-3669"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arto Javanainen","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079272069","display_name":"Ali Mohammadzadeh","orcid":"https://orcid.org/0000-0003-3329-5063"},"institutions":[{"id":"https://openalex.org/I44377176","display_name":"European Space Research and Technology Centre","ror":"https://ror.org/03h3jqn23","country_code":"NL","type":"government","lineage":["https://openalex.org/I2801994115","https://openalex.org/I44377176"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Ali Mohammadzadeh","raw_affiliation_strings":["6ESA/ESTEC, European Space Agency, Noordwijk, AG, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"6ESA/ESTEC, European Space Agency, Noordwijk, AG, The Netherlands","institution_ids":["https://openalex.org/I44377176"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001777299","display_name":"Luigi Dilillo","orcid":"https://orcid.org/0000-0002-1295-2688"},"institutions":[{"id":"https://openalex.org/I4647051","display_name":"Universit\u00e9 de Picardie Jules Verne","ror":"https://ror.org/01gyxrk03","country_code":"FR","type":"education","lineage":["https://openalex.org/I4647051"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Luigi Dilillo","raw_affiliation_strings":["LIRMM, University of Montnellier, Montnellier, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LIRMM, University of Montnellier, Montnellier, France","institution_ids":["https://openalex.org/I4647051"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2422,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.56545963,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"91","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.7700530290603638},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.7508176565170288},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.5797617435455322},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5708280801773071},{"id":"https://openalex.org/keywords/heavy-ion","display_name":"Heavy ion","score":0.5659533739089966},{"id":"https://openalex.org/keywords/proton","display_name":"Proton","score":0.45058414340019226},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.424239844083786},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4226805567741394},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.3488726019859314},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3483145236968994},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.2897452712059021},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18359121680259705},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.17949038743972778},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.17190095782279968},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.08854234218597412}],"concepts":[{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.7700530290603638},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.7508176565170288},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.5797617435455322},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5708280801773071},{"id":"https://openalex.org/C2988362075","wikidata":"https://www.wikidata.org/wiki/Q12416032","display_name":"Heavy ion","level":3,"score":0.5659533739089966},{"id":"https://openalex.org/C54516573","wikidata":"https://www.wikidata.org/wiki/Q2294","display_name":"Proton","level":2,"score":0.45058414340019226},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.424239844083786},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4226805567741394},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.3488726019859314},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3483145236968994},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2897452712059021},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18359121680259705},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.17949038743972778},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.17190095782279968},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08854234218597412},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/dft.2019.8875475","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2019.8875475","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:lirmm-03025660v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025660","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"DFT 2019 - 32th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2019, Noordwijk, Netherlands. pp.1-6, ⟨10.1109/DFT.2019.8875475⟩","raw_type":"Conference papers"},{"id":"pmh:oai:aaltodoc.aalto.fi:123456789/42037","is_oa":true,"landing_page_url":"https://research.aalto.fi/en/publications/5b0a78e1-18ed-419c-8899-eb7809d213b4","pdf_url":null,"source":{"id":"https://openalex.org/S4306401662","display_name":"Aaltodoc (Aalto University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I9927081","host_organization_name":"Aalto University","host_organization_lineage":["https://openalex.org/I9927081"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"acceptedVersion"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-03025660v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025660","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"DFT 2019 - 32th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2019, Noordwijk, Netherlands. pp.1-6, ⟨10.1109/DFT.2019.8875475⟩","raw_type":"Conference papers"},"sustainable_development_goals":[{"score":0.699999988079071,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2375886910","display_name":null,"funder_award_id":"4000111085/14/NL/PA","funder_id":"https://openalex.org/F4320318240","funder_display_name":"European Space Agency"},{"id":"https://openalex.org/G7043180237","display_name":null,"funder_award_id":"4000111630/14/NL/PA","funder_id":"https://openalex.org/F4320318240","funder_display_name":"European Space Agency"}],"funders":[{"id":"https://openalex.org/F4320318240","display_name":"European Space Agency","ror":"https://ror.org/03wd9za21"},{"id":"https://openalex.org/F4320328356","display_name":"R\u00e9gion Occitanie Pyr\u00e9n\u00e9es-M\u00e9diterran\u00e9e","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W289052539","https://openalex.org/W1982381330","https://openalex.org/W2100962262","https://openalex.org/W2102107061","https://openalex.org/W2109838914","https://openalex.org/W2110395205","https://openalex.org/W2121141357","https://openalex.org/W2136263689","https://openalex.org/W2141585946","https://openalex.org/W2496512073","https://openalex.org/W2560461434","https://openalex.org/W2590043516","https://openalex.org/W2770403636","https://openalex.org/W3101380091"],"related_works":["https://openalex.org/W2054139911","https://openalex.org/W1577524679","https://openalex.org/W2162027152","https://openalex.org/W2489439822","https://openalex.org/W2116397085","https://openalex.org/W2393840644","https://openalex.org/W2535372975","https://openalex.org/W4237143391","https://openalex.org/W2017101954","https://openalex.org/W2537636062"],"abstract_inverted_index":{"Space":[0],"applications":[1],"frequently":[2],"use":[3],"flash":[4],"memories":[5],"for":[6],"mass":[7],"storage":[8],"data.":[9],"However,":[10],"the":[11,15,29,67,70,76],"technology":[12],"applied":[13],"in":[14],"memory":[16],"array":[17],"and":[18,38,54],"peripheral":[19],"circuity":[20],"are":[21],"not":[22],"inherently":[23],"radiation":[24,32],"tolerant.":[25],"This":[26],"work":[27],"introduces":[28],"results":[30],"of":[31,66,69,73],"test":[33],"campaigns":[34],"with":[35],"heavy":[36],"ions":[37],"protons":[39],"on":[40,75],"a":[41],"SLC":[42],"NAND":[43],"Flash.":[44],"Static":[45],"tests":[46],"showed":[47],"different":[48],"failures":[49],"types.":[50],"Single":[51],"events":[52],"upsets":[53],"raw":[55],"error":[56],"cross":[57],"sections":[58],"were":[59],"presented,":[60],"as":[61,63],"well":[62],"an":[64],"evaluation":[65],"occurrences":[68],"events.":[71],"Characterization":[72],"effects":[74],"embedded":[77],"data":[78],"registers":[79],"was":[80],"also":[81],"performed.":[82]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}