{"id":"https://openalex.org/W2981668544","doi":"https://doi.org/10.1109/dft.2019.8875392","title":"Combining Cluster Sampling and ACE analysis to improve fault-injection based reliability evaluation of GPU-based systems","display_name":"Combining Cluster Sampling and ACE analysis to improve fault-injection based reliability evaluation of GPU-based systems","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W2981668544","doi":"https://doi.org/10.1109/dft.2019.8875392","mag":"2981668544"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2019.8875392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2019.8875392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011079176","display_name":"Alessandro Vallero","orcid":"https://orcid.org/0000-0001-5058-9608"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Alessandro Vallero","raw_affiliation_strings":["Control and Computer Engineering Department, Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Control and Computer Engineering Department, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026593274","display_name":"Stefano Di Carlo","orcid":"https://orcid.org/0000-0002-7512-5356"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Stefano di Carlo","raw_affiliation_strings":["Control and Computer Engineering Department, Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Control and Computer Engineering Department, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5011079176"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.1192,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.47377696,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"8138","last_page":"8143"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8025271892547607},{"id":"https://openalex.org/keywords/general-purpose-computing-on-graphics-processing-units","display_name":"General-purpose computing on graphics processing units","score":0.7701632976531982},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7347828149795532},{"id":"https://openalex.org/keywords/register-file","display_name":"Register file","score":0.6611402630805969},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6350517868995667},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.571570873260498},{"id":"https://openalex.org/keywords/massively-parallel","display_name":"Massively parallel","score":0.5580553412437439},{"id":"https://openalex.org/keywords/graphics","display_name":"Graphics","score":0.5201966166496277},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46282678842544556},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.43425673246383667},{"id":"https://openalex.org/keywords/supercomputer","display_name":"Supercomputer","score":0.4189499616622925},{"id":"https://openalex.org/keywords/cluster","display_name":"Cluster (spacecraft)","score":0.412168025970459},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4107666611671448},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3759377896785736},{"id":"https://openalex.org/keywords/instruction-set","display_name":"Instruction set","score":0.2725958228111267},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.13727575540542603},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09706759452819824},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08470675349235535},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07895174622535706}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8025271892547607},{"id":"https://openalex.org/C50630238","wikidata":"https://www.wikidata.org/wiki/Q971505","display_name":"General-purpose computing on graphics processing units","level":3,"score":0.7701632976531982},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7347828149795532},{"id":"https://openalex.org/C117280010","wikidata":"https://www.wikidata.org/wiki/Q180944","display_name":"Register file","level":3,"score":0.6611402630805969},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6350517868995667},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.571570873260498},{"id":"https://openalex.org/C190475519","wikidata":"https://www.wikidata.org/wiki/Q544384","display_name":"Massively parallel","level":2,"score":0.5580553412437439},{"id":"https://openalex.org/C21442007","wikidata":"https://www.wikidata.org/wiki/Q1027879","display_name":"Graphics","level":2,"score":0.5201966166496277},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46282678842544556},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.43425673246383667},{"id":"https://openalex.org/C83283714","wikidata":"https://www.wikidata.org/wiki/Q121117","display_name":"Supercomputer","level":2,"score":0.4189499616622925},{"id":"https://openalex.org/C164866538","wikidata":"https://www.wikidata.org/wiki/Q367351","display_name":"Cluster (spacecraft)","level":2,"score":0.412168025970459},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4107666611671448},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3759377896785736},{"id":"https://openalex.org/C202491316","wikidata":"https://www.wikidata.org/wiki/Q272683","display_name":"Instruction set","level":2,"score":0.2725958228111267},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.13727575540542603},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09706759452819824},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08470675349235535},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07895174622535706},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2019.8875392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2019.8875392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1963880259","https://openalex.org/W2025940962","https://openalex.org/W2027716782","https://openalex.org/W2031533321","https://openalex.org/W2103742924","https://openalex.org/W2134309495","https://openalex.org/W2138293202","https://openalex.org/W2144512449","https://openalex.org/W2146351362","https://openalex.org/W2411279070","https://openalex.org/W2735162286","https://openalex.org/W2760030941","https://openalex.org/W2805459376","https://openalex.org/W4249144718"],"related_works":["https://openalex.org/W2027716782","https://openalex.org/W2130922779","https://openalex.org/W4224229821","https://openalex.org/W2121043529","https://openalex.org/W4309582188","https://openalex.org/W2082366402","https://openalex.org/W2120242933","https://openalex.org/W1657300322","https://openalex.org/W2083209667","https://openalex.org/W2185394135"],"abstract_inverted_index":{"Computing":[0],"capability":[1],"demand":[2],"has":[3,40],"grown":[4],"massively":[5],"in":[6,140,163,202,217],"recent":[7],"years.":[8],"Modern":[9],"GPU":[10,162],"chips":[11],"are":[12,57,192],"designed":[13],"to":[14,50,105,125],"deliver":[15],"extreme":[16],"performance":[17],"for":[18,21,174],"graphics":[19],"and":[20,60,144],"data-parallel":[22],"general":[23],"purpose":[24],"computing":[25],"workloads":[26],"(GPGPU":[27],"computing)":[28],"as":[29],"well.":[30],"Many":[31],"GPGPU":[32],"applications":[33],"require":[34],"high":[35],"reliability,":[36],"thus":[37,136],"reliability":[38,53,156],"evaluation":[39,145],"become":[41],"a":[42,55,90,126],"crucial":[43],"step":[44],"during":[45],"their":[46],"design.":[47],"State-of-the-art":[48],"techniques":[49,201],"assess":[51],"the":[52,73,83,100,107,132,149,154,170,179,187],"of":[54,82,102,142,157,165,178,195,204,215,219],"system":[56],"fault":[58,108,118,207],"injection":[59,109,119,208],"ACE":[61,103],"analysis.":[62],"The":[63],"former":[64],"can":[65],"produce":[66],"accurate":[67,198],"results":[68],"despite":[69],"eternal":[70],"time":[71],"while":[72,210],"latter":[74],"is":[75,129,183],"very":[76],"fast":[77],"but":[78],"it":[79],"lacks":[80],"accuracy":[81,143],"results.":[84],"In":[85,111],"this":[86],"paper":[87],"we":[88,114,152,191],"introduce":[89],"new":[91],"sampling":[92,97,134],"methodology":[93],"based":[94],"on":[95,189],"cluster":[96],"that":[98,116,184],"enables":[99],"exploitation":[101],"analysis":[104],"accelerate":[106],"process.":[110],"our":[112],"experiments":[113],"demonstrate":[115],"state-of-the-art":[117],"techniques,":[120],"generating":[121],"random":[122],"faults":[123],"according":[124],"uniform":[127],"distribution,":[128],"outperformed":[130],"by":[131],"proposed":[133],"technique,":[135],"enabling":[137],"several":[138],"advantages":[139],"terms":[141],"time.":[146],"To":[147],"quantify":[148],"introduced":[150],"benefits":[151],"analyzed":[153],"micro-architecture":[155],"an":[158],"AMD":[159],"Southern":[160],"Islands":[161],"presence":[164],"single":[166],"bit":[167],"upset":[168],"affecting":[169],"vector":[171],"register":[172],"file":[173],"6":[175],"benchmarks.":[176],"One":[177],"most":[180],"important":[181],"achievements":[182],"considering":[185],"all":[186],"benchmarks,":[188],"average,":[190],"one":[193],"order":[194],"magnitude":[196,216],"faster/more":[197],"than":[199,212],"uniform-sampling-based":[200],"case":[203,218],"non":[205],"exhaustive":[206,220],"campaigns,":[209],"more":[211],"two":[213],"orders":[214],"campaigns.":[221]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}