{"id":"https://openalex.org/W2981925675","doi":"https://doi.org/10.1109/dft.2019.8875362","title":"On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA","display_name":"On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W2981925675","doi":"https://doi.org/10.1109/dft.2019.8875362","mag":"2981925675"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2019.8875362","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2019.8875362","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091108518","display_name":"Boyang Du","orcid":"https://orcid.org/0000-0002-1305-0459"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Boyang Du","raw_affiliation_strings":["Department of Control and Computer Engineering, Politecnico di Torino Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering, Politecnico di Torino Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004083312","display_name":"Sarah Azimi","orcid":"https://orcid.org/0000-0002-9169-6140"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sarah Azimi","raw_affiliation_strings":["Department of Control and Computer Engineering, Politecnico di Torino Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering, Politecnico di Torino Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018567565","display_name":"Corrado De Sio","orcid":"https://orcid.org/0000-0003-4212-3052"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Corrado de Sio","raw_affiliation_strings":["Department of Control and Computer Engineering, Politecnico di Torino Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering, Politecnico di Torino Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091713814","display_name":"Ludovica Bozzoli","orcid":"https://orcid.org/0000-0001-5099-9359"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Ludovica Bozzoli","raw_affiliation_strings":["Department of Control and Computer Engineering, Politecnico di Torino Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering, Politecnico di Torino Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021426042","display_name":"Luca Sterpone","orcid":"https://orcid.org/0000-0002-3080-2560"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Sterpone","raw_affiliation_strings":["Department of Control and Computer Engineering, Politecnico di Torino Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering, Politecnico di Torino Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.5429,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.90041446,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7528996467590332},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6817485094070435},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6524708867073059},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5446187853813171},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5418118238449097},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.4443594515323639},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4344104528427124},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.4162443280220032},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3044801950454712},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2988399863243103},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15695995092391968},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.1074846088886261},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.0929962694644928}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7528996467590332},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6817485094070435},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6524708867073059},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5446187853813171},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5418118238449097},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.4443594515323639},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4344104528427124},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.4162443280220032},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3044801950454712},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2988399863243103},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15695995092391968},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.1074846088886261},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0929962694644928},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2019.8875362","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2019.8875362","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1832693441","https://openalex.org/W1892339738","https://openalex.org/W1970027940","https://openalex.org/W1979377475","https://openalex.org/W1984541135","https://openalex.org/W2013305145","https://openalex.org/W2015786233","https://openalex.org/W2016053056","https://openalex.org/W2076063813","https://openalex.org/W2112796928","https://openalex.org/W2116097016","https://openalex.org/W2139072039","https://openalex.org/W2163605009","https://openalex.org/W2264905057","https://openalex.org/W2266701264","https://openalex.org/W2284646714","https://openalex.org/W2300242332","https://openalex.org/W2319920447","https://openalex.org/W2492686975","https://openalex.org/W2565125333","https://openalex.org/W2609773735","https://openalex.org/W2753775551","https://openalex.org/W2943759410","https://openalex.org/W2944028880","https://openalex.org/W3102169921","https://openalex.org/W6684191040","https://openalex.org/W6693066613","https://openalex.org/W6693721977","https://openalex.org/W6762129386"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W3006277082","https://openalex.org/W2610634993","https://openalex.org/W2081738003","https://openalex.org/W2097660413","https://openalex.org/W2943396510"],"abstract_inverted_index":{"In":[0,75,189],"recent":[1],"years,":[2],"topics":[3],"around":[4],"machine":[5,150],"learning":[6,151],"and":[7,32,34,61,69,122,158],"artificial":[8],"intelligence":[9],"(AI)":[10],"have":[11],"(re-)gained":[12],"a":[13,199],"lot":[14],"of":[15,72,116,181,235],"interest":[16],"due":[17,153],"to":[18,83,97,124,154],"high":[19,156],"demand":[20],"in":[21,25,87,89,111,144,172,217,222],"industrial":[22,76],"automation":[23],"applications":[24,48,152],"various":[26],"areas":[27],"such":[28,92],"as":[29,110],"medical,":[30],"automotive":[31,90,112],"space":[33],"the":[35,70,73,106,114,117,131,145,163,182,194,228,233],"increasing":[36,142,159],"computational":[37,160],"power":[38],"offered":[39],"by":[40,176],"technology":[41],"advancements.":[42],"One":[43],"common":[44],"task":[45,79,93,107,118,229],"for":[46,100,149],"these":[47],"is":[49,54,63,67,108,120,166,179],"object":[50,66],"recognition/classification":[51],"whose":[52],"input":[53],"usually":[55],"an":[56,65],"image":[57],"taken":[58,244],"from":[59],"camera":[60],"output":[62],"whether":[64],"present":[68,193],"class":[71],"object.":[74],"pipeline,":[77],"this":[78,190],"could":[80,94],"be":[81,95,125,243],"used":[82],"identify":[84],"possible":[85],"defects":[86],"products;":[88],"application,":[91,113],"deployed":[96],"detect":[98],"pedestrians":[99],"Advanced":[101],"Driver-Assistance":[102],"Systems":[103],"(ADAS).":[104],"When":[105,162],"safety-critical":[109],"reliability":[115],"implementation":[119,204,219],"crucial":[121],"has":[123],"evaluated":[126],"before":[127],"final":[128],"deployment.":[129],"On":[130],"other":[132],"hand,":[133],"Field":[134],"Programmable":[135],"Gate":[136],"Array":[137],"(FPGA)":[138],"devices":[139],"are":[140],"gaining":[141],"attention":[143],"hardware":[146],"acceleration":[147],"part":[148],"their":[155],"flexibility":[157],"power.":[161],"SRAM-based":[164,207],"FPGA":[165,208],"considered,":[167],"Single":[168,236],"Event":[169,237],"Upset":[170],"(SEU)":[171],"configuration":[173,223],"memory":[174,224],"induced":[175],"radiation":[177],"particle":[178],"one":[180,220],"major":[183],"concerns":[184],"even":[185],"at":[186],"sea":[187],"level.":[188],"paper,":[191],"we":[192],"fault":[195],"injection":[196],"results":[197,231],"on":[198,205],"Convolutional":[200],"Neural":[201],"Network":[202],"(CNN)":[203],"Xilinx":[206],"which":[209],"demonstrate":[210],"that":[211],"though":[212],"there":[213],"exists":[214],"built-in":[215],"redundancy":[216],"CNN":[218],"SEU":[221],"can":[225],"still":[226],"impact":[227],"execution":[230],"while":[232],"possibility":[234],"Multiple":[238],"Upsets":[239],"(SEMU)":[240],"must":[241],"also":[242],"into":[245],"consideration.":[246]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":11},{"year":2020,"cited_by_count":5}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}