{"id":"https://openalex.org/W2982168915","doi":"https://doi.org/10.1109/dft.2019.8875316","title":"Reliability Evaluation of Polyphase-filter based Decimators Implemented on SRAM-FPGAs","display_name":"Reliability Evaluation of Polyphase-filter based Decimators Implemented on SRAM-FPGAs","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W2982168915","doi":"https://doi.org/10.1109/dft.2019.8875316","mag":"2982168915"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2019.8875316","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2019.8875316","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054396881","display_name":"Zhen Gao","orcid":"https://orcid.org/0000-0002-2709-0216"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhen Gao","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028284977","display_name":"Jinhua Zhu","orcid":"https://orcid.org/0000-0003-2157-9077"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinhua Zhu","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019789757","display_name":"Lina Yan","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lina Yan","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036764694","display_name":"Yan Tong","orcid":"https://orcid.org/0000-0002-5552-0199"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tong Yan","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Pedro Reviriego","raw_affiliation_strings":["Departamento de Ingenier\u00eda Telem\u00e1tica, Universidad Carlos III de Madrid, Madrid, Spain"],"affiliations":[{"raw_affiliation_string":"Departamento de Ingenier\u00eda Telem\u00e1tica, Universidad Carlos III de Madrid, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5054396881"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":0.2385,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55971354,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/decimation","display_name":"Decimation","score":0.9334807991981506},{"id":"https://openalex.org/keywords/polyphase-system","display_name":"Polyphase system","score":0.7651408910751343},{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.5880782604217529},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5421321392059326},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5224468111991882},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5202092528343201},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.46446388959884644},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4040912687778473},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3042325973510742},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2833985686302185},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21094149351119995},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.12262770533561707}],"concepts":[{"id":"https://openalex.org/C173642442","wikidata":"https://www.wikidata.org/wiki/Q1253346","display_name":"Decimation","level":3,"score":0.9334807991981506},{"id":"https://openalex.org/C96157337","wikidata":"https://www.wikidata.org/wiki/Q391639","display_name":"Polyphase system","level":2,"score":0.7651408910751343},{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.5880782604217529},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5421321392059326},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5224468111991882},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5202092528343201},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.46446388959884644},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4040912687778473},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3042325973510742},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2833985686302185},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21094149351119995},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.12262770533561707}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2019.8875316","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2019.8875316","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W571536966","https://openalex.org/W1481646516","https://openalex.org/W1580543952","https://openalex.org/W1996112318","https://openalex.org/W2018533230","https://openalex.org/W2115722171","https://openalex.org/W2119571645","https://openalex.org/W2136438021","https://openalex.org/W2475646144","https://openalex.org/W2623058277","https://openalex.org/W2678723747","https://openalex.org/W2903732333","https://openalex.org/W4300835888"],"related_works":["https://openalex.org/W2384154497","https://openalex.org/W2148631971","https://openalex.org/W3134042881","https://openalex.org/W2536077922","https://openalex.org/W2071742369","https://openalex.org/W2096299862","https://openalex.org/W2170764174","https://openalex.org/W1575732032","https://openalex.org/W1922259324","https://openalex.org/W2252272481"],"abstract_inverted_index":{"Decimation":[0],"is":[1,158,167],"widely":[2],"used":[3],"in":[4,93,102],"digital":[5],"communication":[6],"systems":[7],"to":[8,54,61,169,194],"reduce":[9],"the":[10,14,30,35,56,59,68,72,82,94,99,103,112,118,156,170,180,195,199,201,205,207,214],"oversampling":[11],"rate":[12,203],"of":[13,20,29,37,58,108,117,127,145,160,163,179,209],"base":[15],"band":[16],"signal.":[17],"The":[18,125],"structure":[19],"Poly":[21],"Phase":[22],"Filters":[23],"(PPFs)":[24],"provides":[25],"an":[26],"efficient":[27],"implementation":[28],"decimator.":[31],"This":[32,151],"paper":[33],"studies":[34],"effects":[36],"Single":[38],"Event":[39],"Upsets":[40],"(SEUs)":[41],"on":[42,47,63,67,81,98,186],"PPFs":[43],"based":[44],"decimators":[45],"implemented":[46],"SRAM-FPGAs.":[48],"Fault":[49],"injection":[50],"experiments":[51],"are":[52,137],"performed":[53],"evaluate":[55],"reliability":[57],"decimator":[60,157],"SEUs":[62,80,97,119,128],"filter":[64,175,188],"coefficients":[65],"and":[66,140,148,173,198],"configuration":[69,104],"memory.":[70],"For":[71,96],"first":[73],"part,":[74],"experiment":[75],"results":[76],"show":[77],"that":[78,129,166],"only":[79],"two":[83],"most":[84],"significant":[85],"bits":[86,101],"would":[87,110,120,189],"cause":[88,121,130,191],"non":[89],"negligible":[90,122],"SNR":[91,123,132],"loss":[92,133],"output.":[95,182],"essential":[100],"memory,":[105],"about":[106],"20%":[107],"them":[109],"affect":[111],"results,":[113],"among":[114],"which":[115],"70%":[116],"loss.":[124],"percentage":[126],"a":[131,161,177,184],"larger":[134,200],"than":[135],"5dB":[136],"7%,":[138],"13%":[139],"16%":[141],"for":[142],"decimation":[143,171,202],"rates":[144],"16,":[146],"8":[147],"4,":[149],"respectively.":[150],"can":[152],"be":[153],"explained":[154],"as":[155],"composed":[159],"number":[162],"parallel":[164],"filters":[165],"equal":[168],"rate,":[172],"each":[174],"contributes":[176],"fraction":[178],"final":[181],"Therefore,":[183],"SEU":[185],"one":[187],"not":[190],"large":[192],"degradation":[193,208],"decimated":[196,210],"signal,":[197],"is,":[204],"smaller":[206],"signal":[211],"introduced":[212],"by":[213],"SEU.":[215]},"counts_by_year":[{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}