{"id":"https://openalex.org/W2782689766","doi":"https://doi.org/10.1109/dft.2017.8244437","title":"Simulation-based evaluation of frequency upscaled operation of exact/approximate ripple carry adders","display_name":"Simulation-based evaluation of frequency upscaled operation of exact/approximate ripple carry adders","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2782689766","doi":"https://doi.org/10.1109/dft.2017.8244437","mag":"2782689766"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2017.8244437","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2017.8244437","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047799828","display_name":"H Junqi","orcid":null},"institutions":[{"id":"https://openalex.org/I155043079","display_name":"University of Nottingham Malaysia Campus","ror":"https://ror.org/04mz9mt17","country_code":"MY","type":"education","lineage":["https://openalex.org/I142263535","https://openalex.org/I155043079"]}],"countries":["MY"],"is_corresponding":true,"raw_author_name":"H Junqi","raw_affiliation_strings":["Dept. of Electrical and Electronic Eng., The University of Nottingham, Selangor, Malaysia"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Eng., The University of Nottingham, Selangor, Malaysia","institution_ids":["https://openalex.org/I155043079"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022381918","display_name":"T. Nandha Kumar","orcid":"https://orcid.org/0000-0002-5033-3095"},"institutions":[{"id":"https://openalex.org/I155043079","display_name":"University of Nottingham Malaysia Campus","ror":"https://ror.org/04mz9mt17","country_code":"MY","type":"education","lineage":["https://openalex.org/I142263535","https://openalex.org/I155043079"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"T. Nandha Kumar","raw_affiliation_strings":["Dept. of Electrical and Electronic Eng., The University of Nottingham, Selangor, Malaysia"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Eng., The University of Nottingham, Selangor, Malaysia","institution_ids":["https://openalex.org/I155043079"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100777102","display_name":"Haider Abbas","orcid":"https://orcid.org/0000-0002-2437-4870"},"institutions":[{"id":"https://openalex.org/I155043079","display_name":"University of Nottingham Malaysia Campus","ror":"https://ror.org/04mz9mt17","country_code":"MY","type":"education","lineage":["https://openalex.org/I142263535","https://openalex.org/I155043079"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Haider Abbas","raw_affiliation_strings":["Dept. of Electrical and Electronic Eng., The University of Nottingham, Selangor, Malaysia"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Eng., The University of Nottingham, Selangor, Malaysia","institution_ids":["https://openalex.org/I155043079"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001979328","display_name":"Fabrizio Lombardi","orcid":"https://orcid.org/0000-0003-3152-3245"},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fabrizio Lombardi","raw_affiliation_strings":["Dept. of Electrical and Computer Eng., Northeastern University, Boston, MA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Eng., Northeastern University, Boston, MA","institution_ids":["https://openalex.org/I12912129"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5047799828"],"corresponding_institution_ids":["https://openalex.org/I155043079"],"apc_list":null,"apc_paid":null,"fwci":0.7167,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.74165342,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/adder","display_name":"Adder","score":0.9732110500335693},{"id":"https://openalex.org/keywords/ripple","display_name":"Ripple","score":0.5671606659889221},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.5177068710327148},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5167514681816101},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.509769856929779},{"id":"https://openalex.org/keywords/transistor-count","display_name":"Transistor count","score":0.49893951416015625},{"id":"https://openalex.org/keywords/serial-binary-adder","display_name":"Serial binary adder","score":0.485501766204834},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.48205432295799255},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4430132210254669},{"id":"https://openalex.org/keywords/carry","display_name":"Carry (investment)","score":0.43269792199134827},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42408865690231323},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4086466133594513},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3688194453716278},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.36225616931915283},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20990288257598877},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1130874752998352},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10445648431777954},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.10228991508483887}],"concepts":[{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.9732110500335693},{"id":"https://openalex.org/C2779599953","wikidata":"https://www.wikidata.org/wiki/Q1776117","display_name":"Ripple","level":3,"score":0.5671606659889221},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.5177068710327148},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5167514681816101},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.509769856929779},{"id":"https://openalex.org/C196320899","wikidata":"https://www.wikidata.org/wiki/Q2623746","display_name":"Transistor count","level":4,"score":0.49893951416015625},{"id":"https://openalex.org/C116206932","wikidata":"https://www.wikidata.org/wiki/Q7454686","display_name":"Serial binary adder","level":4,"score":0.485501766204834},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.48205432295799255},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4430132210254669},{"id":"https://openalex.org/C2776299755","wikidata":"https://www.wikidata.org/wiki/Q432449","display_name":"Carry (investment)","level":2,"score":0.43269792199134827},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42408865690231323},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4086466133594513},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3688194453716278},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.36225616931915283},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20990288257598877},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1130874752998352},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10445648431777954},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.10228991508483887},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2017.8244437","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2017.8244437","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.49000000953674316,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1492513355","https://openalex.org/W1579004116","https://openalex.org/W1598341975","https://openalex.org/W1998525920","https://openalex.org/W1998824039","https://openalex.org/W1999356037","https://openalex.org/W2005652364","https://openalex.org/W2005865544","https://openalex.org/W2010635096","https://openalex.org/W2017819499","https://openalex.org/W2020217519","https://openalex.org/W2045294186","https://openalex.org/W2076536455","https://openalex.org/W2083156986","https://openalex.org/W2100098458","https://openalex.org/W2124616298","https://openalex.org/W2129926968","https://openalex.org/W2152977845","https://openalex.org/W2171661253","https://openalex.org/W2346541696","https://openalex.org/W3147234326","https://openalex.org/W4234974086","https://openalex.org/W6634717524","https://openalex.org/W6635633684"],"related_works":["https://openalex.org/W1976039195","https://openalex.org/W2064215635","https://openalex.org/W986131379","https://openalex.org/W3166220017","https://openalex.org/W2950842282","https://openalex.org/W1683129808","https://openalex.org/W2094261928","https://openalex.org/W2073461555","https://openalex.org/W1584617340","https://openalex.org/W2136161477"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,19,28,132],"simulation-based":[4],"evaluation":[5],"of":[6,34,86,163],"approximate":[7],"(inexact)":[8],"and":[9,13,66,93,114,138,156,166],"exact":[10,147,167],"adder":[11,40,62,65,130],"cells":[12,63,120],"ripple":[14],"carry":[15],"adders":[16],"(RCA)":[17],"using":[18,118],"frequency":[20,33,72,103,110,136],"upscaling":[21,73,104,111],"technique.":[22],"In":[23,57],"the":[24,32,35,54,79,82,102,128,150,157,164],"proposed":[25],"method":[26],"at":[27,74],"constant":[29],"supply":[30,94],"voltage,":[31],"inputs":[36],"applied":[37],"to":[38,101],"an":[39,146],"cell":[41],"is":[42,121,125],"increased":[43],"(upscaled)":[44],"beyond":[45],"its":[46],"largest":[47],"operating":[48],"value":[49],"thereby":[50],"generating":[51],"errors":[52],"in":[53,81],"addition":[55],"operation.":[56],"this":[58],"paper,":[59],"exact/inexact":[60,119],"full":[61],"(mirror":[64],"AMA1)":[67],"are":[68,96,169],"initially":[69],"operated":[70],"under":[71,109],"different":[75],"feature":[76],"sizes":[77],"for":[78,112],"transistors":[80],"circuits.":[83],"The":[84],"effects":[85],"process":[87],"variations":[88],"(such":[89],"as":[90],"gate":[91],"length":[92],"voltage)":[95],"also":[97],"analyzed":[98],"with":[99,145],"respect":[100],"process.":[105],"An":[106],"exhaustive":[107],"simulation":[108],"4":[113],"8":[115],"bits":[116],"RCAs":[117,168],"then":[122],"pursued.":[123],"It":[124],"observed":[126],"that":[127],"inexact":[129,165],"sustains":[131],"higher":[133],"(1.3":[134],"times)":[135],"operation":[137],"lower":[139],"energy":[140],"dissipation":[141],"(50%":[142],"reduction)":[143],"compared":[144],"adder.":[148],"Also":[149],"normalized":[151],"mean":[152,158],"error":[153,160],"distance":[154,161],"(NMED)":[155],"relative":[159],"(MRED)":[162],"very":[170],"close.":[171]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}