{"id":"https://openalex.org/W2545318895","doi":"https://doi.org/10.1109/dft.2016.7684080","title":"Design and characterization of a high-safety hardware/software module for the acquisition of Eurobalise telegrams","display_name":"Design and characterization of a high-safety hardware/software module for the acquisition of Eurobalise telegrams","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2545318895","doi":"https://doi.org/10.1109/dft.2016.7684080","mag":"2545318895"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2016.7684080","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2016.7684080","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080381250","display_name":"Filippo Giuliani","orcid":"https://orcid.org/0000-0003-1511-8311"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Filippo Giuliani","raw_affiliation_strings":["Rome, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rome, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048232172","display_name":"Marco Ottavi","orcid":"https://orcid.org/0000-0002-5064-7342"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Ottavi","raw_affiliation_strings":["Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy","institution_ids":["https://openalex.org/I116067653"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028297120","display_name":"G.C. Cardarilli","orcid":"https://orcid.org/0000-0002-7444-876X"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gian Carlo Cardarilli","raw_affiliation_strings":["Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy","institution_ids":["https://openalex.org/I116067653"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000963583","display_name":"M. Re","orcid":"https://orcid.org/0000-0001-9046-1318"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Re","raw_affiliation_strings":["Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy","institution_ids":["https://openalex.org/I116067653"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063300969","display_name":"Luca Di Nunzio","orcid":"https://orcid.org/0000-0002-4312-7939"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Di Nunzio","raw_affiliation_strings":["Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy","institution_ids":["https://openalex.org/I116067653"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048482308","display_name":"Rocco Fazzolari","orcid":"https://orcid.org/0000-0002-7383-2663"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Rocco Fazzolari","raw_affiliation_strings":["Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy","institution_ids":["https://openalex.org/I116067653"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085561654","display_name":"Antimo Bruno","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Antimo Bruno","raw_affiliation_strings":["Rome, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rome, Italy","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043284469","display_name":"Francesco Zuliani","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Francesco Zuliani","raw_affiliation_strings":["Rome, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rome, Italy","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2047,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.40399002,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"111","last_page":"114"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6779955625534058},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6481647491455078},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6461251378059387},{"id":"https://openalex.org/keywords/novelty","display_name":"Novelty","score":0.5904356241226196},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.5713469386100769},{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.5610851645469666},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5242050886154175},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5148855447769165},{"id":"https://openalex.org/keywords/work-flow","display_name":"Work flow","score":0.5078306794166565},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.49939513206481934},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4610310196876526},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3435053825378418},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.22495070099830627}],"concepts":[{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6779955625534058},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6481647491455078},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6461251378059387},{"id":"https://openalex.org/C2778738651","wikidata":"https://www.wikidata.org/wiki/Q16546687","display_name":"Novelty","level":2,"score":0.5904356241226196},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.5713469386100769},{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.5610851645469666},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5242050886154175},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5148855447769165},{"id":"https://openalex.org/C2985179714","wikidata":"https://www.wikidata.org/wiki/Q627335","display_name":"Work flow","level":2,"score":0.5078306794166565},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.49939513206481934},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4610310196876526},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3435053825378418},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.22495070099830627},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C27206212","wikidata":"https://www.wikidata.org/wiki/Q34178","display_name":"Theology","level":1,"score":0.0},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dft.2016.7684080","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2016.7684080","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:art.torvergata.it:2108/166258","is_oa":false,"landing_page_url":"http://hdl.handle.net/2108/166258","pdf_url":null,"source":{"id":"https://openalex.org/S4306400993","display_name":"Cineca Institutional Research Information System (Tor Vergata University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I116067653","host_organization_name":"University of Rome Tor Vergata","host_organization_lineage":["https://openalex.org/I116067653"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W932217927"],"related_works":["https://openalex.org/W2099839042","https://openalex.org/W2102690581","https://openalex.org/W1491404489","https://openalex.org/W2091104731","https://openalex.org/W2473740624","https://openalex.org/W2029915748","https://openalex.org/W2899623659","https://openalex.org/W2545318895","https://openalex.org/W2148994817","https://openalex.org/W2609080145"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"the":[3,19,31,43,68,76,89],"design":[4,17,45,90],"and":[5,37,87],"characterization":[6,104],"of":[7,18,42,67,72,78,92,102,105],"a":[8,24,53,93],"safety":[9,32,41,94],"critical":[10,95],"module":[11,20],"for":[12],"Eurobalise":[13],"railway":[14],"signalling.":[15],"The":[16,40,57,70],"is":[21,49,75],"done":[22],"on":[23,47,81],"HW/SW":[25],"platform":[26],"to":[27,30,85,110],"include":[28],"compliance":[29,109],"regulations":[33],"both":[34],"at":[35],"HW":[36],"SW":[38],"level.":[39],"obtained":[44],"implemented":[46,107],"FPGA":[48,82],"then":[50],"characterized":[51],"through":[52],"fault":[54,58,79],"injection":[55,59,80],"campaign.":[56],"campaign":[60],"isolated":[61],"some":[62],"corner":[63],"cases":[64],"suggesting":[65],"optimization":[66],"design.":[69],"novelty":[71],"our":[73],"work":[74],"use":[77],"based":[83],"platforms":[84],"characterize":[86],"optimize":[88],"flow":[91],"system":[96],"thus":[97],"adding":[98],"an":[99],"extra":[100],"layer":[101],"ex-post":[103],"designs":[106],"in":[108],"safety-driven":[111],"standards.":[112]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}