{"id":"https://openalex.org/W1921113851","doi":"https://doi.org/10.1109/dft.2015.7315164","title":"A fast and scalable fault injection framework to evaluate multi/many-core soft error reliability","display_name":"A fast and scalable fault injection framework to evaluate multi/many-core soft error reliability","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W1921113851","doi":"https://doi.org/10.1109/dft.2015.7315164","mag":"1921113851"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2015.7315164","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2015.7315164","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://figshare.com/articles/conference_contribution/A_Fast_and_Scalable_Fault_Injection_Framework_to_Evaluate_Multi_Many-core_Soft_Error_Reliability/10172882","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023228231","display_name":"Felipe Rosa","orcid":"https://orcid.org/0000-0003-4964-5136"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Felipe Rosa","raw_affiliation_strings":["UFRGS, PGMicro/PPGC, Porto Alegre, RS, Brazil","UFRGS, Instituto de Inform\u00e1tica, PGMicro/PPGC, Av. Bento Gon\u00e7alves, 9500, Porto Alegre, RS, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UFRGS, PGMicro/PPGC, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"UFRGS, Instituto de Inform\u00e1tica, PGMicro/PPGC, Av. Bento Gon\u00e7alves, 9500, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024813896","display_name":"Fernanda Lima Kastensmidt","orcid":"https://orcid.org/0000-0001-5767-8582"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fernanda Kastensmidt","raw_affiliation_strings":["UFRGS, PGMicro/PPGC, Porto Alegre, RS, Brazil","UFRGS, Instituto de Inform\u00e1tica, PGMicro/PPGC, Av. Bento Gon\u00e7alves, 9500, Porto Alegre, RS, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UFRGS, PGMicro/PPGC, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"UFRGS, Instituto de Inform\u00e1tica, PGMicro/PPGC, Av. Bento Gon\u00e7alves, 9500, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108043721","display_name":"Ricardo Reis","orcid":"https://orcid.org/0000-0001-5781-5858"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ricardo Reis","raw_affiliation_strings":["UFRGS, PGMicro/PPGC, Porto Alegre, RS, Brazil","UFRGS, Instituto de Inform\u00e1tica, PGMicro/PPGC, Av. Bento Gon\u00e7alves, 9500, Porto Alegre, RS, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UFRGS, PGMicro/PPGC, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"UFRGS, Instituto de Inform\u00e1tica, PGMicro/PPGC, Av. Bento Gon\u00e7alves, 9500, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080883695","display_name":"Luciano Ost","orcid":"https://orcid.org/0000-0002-5160-5232"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]},{"id":"https://openalex.org/I153648349","display_name":"University of Leicester","ror":"https://ror.org/04h699437","country_code":"GB","type":"education","lineage":["https://openalex.org/I153648349"]}],"countries":["BR","GB"],"is_corresponding":false,"raw_author_name":"Luciano Ost","raw_affiliation_strings":["UFRGS, PGMicro/PPGC, Porto Alegre, RS, Brazil","Department of Engineering - University of Leicester, University Road, LE1 7RH, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UFRGS, PGMicro/PPGC, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Department of Engineering - University of Leicester, University Road, LE1 7RH, UK","institution_ids":["https://openalex.org/I153648349"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":8.2352,"has_fulltext":false,"cited_by_count":47,"citation_normalized_percentile":{"value":0.98733574,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"211","last_page":"214"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.8820412158966064},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7383060455322266},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.7282140851020813},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7187968492507935},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.597140908241272},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5595608353614807},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5433961749076843},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.49843430519104004},{"id":"https://openalex.org/keywords/multiprocessing","display_name":"Multiprocessing","score":0.47475960850715637},{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.4580253064632416},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4404083788394928},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.43387675285339355},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.425426185131073},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3927803039550781},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.30332136154174805},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.2681271433830261},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.16920441389083862},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14610734581947327},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.14309415221214294}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.8820412158966064},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7383060455322266},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.7282140851020813},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7187968492507935},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.597140908241272},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5595608353614807},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5433961749076843},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.49843430519104004},{"id":"https://openalex.org/C4822641","wikidata":"https://www.wikidata.org/wiki/Q846651","display_name":"Multiprocessing","level":2,"score":0.47475960850715637},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.4580253064632416},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4404083788394928},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.43387675285339355},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.425426185131073},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3927803039550781},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.30332136154174805},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.2681271433830261},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.16920441389083862},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14610734581947327},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.14309415221214294},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/dft.2015.7315164","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2015.7315164","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:figshare.com:article/10172882","is_oa":true,"landing_page_url":"https://figshare.com/articles/conference_contribution/A_Fast_and_Scalable_Fault_Injection_Framework_to_Evaluate_Multi_Many-core_Soft_Error_Reliability/10172882","pdf_url":null,"source":{"id":"https://openalex.org/S4306402621","display_name":"INDIGO (University of Illinois at Chicago)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I39422238","host_organization_name":"University of Illinois Chicago","host_organization_lineage":["https://openalex.org/I39422238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference contribution"},{"id":"pmh:oai:lra.le.ac.uk:2381/37454","is_oa":true,"landing_page_url":"http://hdl.handle.net/2381/37454","pdf_url":null,"source":{"id":"https://openalex.org/S4306402365","display_name":"Leicester Research Archive (University of Leicester)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I153648349","host_organization_name":"University of Leicester","host_organization_lineage":["https://openalex.org/I153648349"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference Paper"}],"best_oa_location":{"id":"pmh:oai:figshare.com:article/10172882","is_oa":true,"landing_page_url":"https://figshare.com/articles/conference_contribution/A_Fast_and_Scalable_Fault_Injection_Framework_to_Evaluate_Multi_Many-core_Soft_Error_Reliability/10172882","pdf_url":null,"source":{"id":"https://openalex.org/S4306402621","display_name":"INDIGO (University of Illinois at Chicago)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I39422238","host_organization_name":"University of Illinois Chicago","host_organization_lineage":["https://openalex.org/I39422238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference contribution"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1972649107","https://openalex.org/W2014215998","https://openalex.org/W2050157787","https://openalex.org/W2099634310","https://openalex.org/W2114384323","https://openalex.org/W2120635877","https://openalex.org/W2132362854","https://openalex.org/W2147657366","https://openalex.org/W2150267144","https://openalex.org/W4255519882"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2078707653","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2969553121","https://openalex.org/W2593605297","https://openalex.org/W2782341877","https://openalex.org/W3196277062","https://openalex.org/W2485576852","https://openalex.org/W1553526993"],"abstract_inverted_index":{"Increasing":[0],"chip":[1],"power":[2],"densities":[3],"allied":[4],"to":[5,18,29,44,74,103,116,123,135,141],"the":[6,22,46,77,128,131],"continuous":[7],"technology":[8],"shrink":[9],"is":[10],"making":[11],"emerging":[12],"multiprocessor":[13],"embedded":[14],"systems":[15],"more":[16,34],"vulnerable":[17],"soft":[19],"errors.":[20],"Due":[21],"high":[23],"cost":[24],"and":[25,36,63,99,130,138,144],"design":[26,48,53],"time":[27],"inherent":[28],"board-based":[30],"fault":[31,39,65,78,86],"injection":[32,40,79,87],"approaches,":[33],"appropriate":[35],"efficient":[37],"simulation-based":[38],"frameworks":[41],"become":[42],"crucial":[43],"guarantee":[45],"adequate":[47],"exploration":[49],"support":[50],"at":[51,82,119],"early":[52],"phase.":[54],"In":[55],"this":[56,58],"scenario,":[57],"paper":[59],"proposes":[60],"a":[61,95],"fast":[62],"flexible":[64],"injector":[66],"framework,":[67],"called":[68],"OVPSim-FIM,":[69,84],"which":[70],"supports":[71],"parallel":[72],"simulation":[73],"boost":[75],"up":[76,102,122],"process.":[80],"Aiming":[81],"validating":[83],"several":[85],"campaigns":[88],"were":[89],"performed":[90],"in":[91],"ARM":[92],"processors,":[93],"considering":[94],"market":[96],"leading":[97],"RTOS":[98],"benchmarks":[100],"with":[101],"10":[104],"billions":[105],"of":[106,121],"object":[107],"code":[108],"instructions.":[109],"Results":[110],"have":[111],"shown":[112],"that":[113],"OVPSim-FIM":[114],"enables":[115],"inject":[117],"faults":[118],"speed":[120],"10,000":[124],"MIPS,":[125],"depending":[126],"on":[127],"processor":[129],"benchmark":[132],"profile,":[133],"enabling":[134],"identify":[136],"erros":[137],"exceptions":[139],"according":[140],"different":[142],"criteria":[143],"classifications.":[145]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":8},{"year":2016,"cited_by_count":4}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}