{"id":"https://openalex.org/W1902096466","doi":"https://doi.org/10.1109/dft.2015.7315149","title":"Quest for a quantum search algorithm for testing stuck-at faults in digital circuits","display_name":"Quest for a quantum search algorithm for testing stuck-at faults in digital circuits","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W1902096466","doi":"https://doi.org/10.1109/dft.2015.7315149","mag":"1902096466"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2015.7315149","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2015.7315149","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057058915","display_name":"Muralidharan Venkatasubramanian","orcid":null},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]},{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Muralidharan Venkatasubramanian","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, Alabama","Department of Electrical and Computer Engineering, Auburn University, Alabama 36849, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, Alabama","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Alabama 36849, USA","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084081268","display_name":"Vishwani D. Agrawal","orcid":"https://orcid.org/0000-0002-7121-5979"},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]},{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vishwani D. Agrawal","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, Alabama","Department of Electrical and Computer Engineering, Auburn University, Alabama 36849, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, Alabama","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Alabama 36849, USA","institution_ids":["https://openalex.org/I17301866"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008946693","display_name":"James J. Janaher","orcid":null},"institutions":[{"id":"https://openalex.org/I17301866","display_name":"University of Alabama","ror":"https://ror.org/03xrrjk67","country_code":"US","type":"education","lineage":["https://openalex.org/I17301866"]},{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James J. Janaher","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, Alabama","Department of Electrical and Computer Engineering, Auburn University, Alabama 36849, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, Alabama","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Alabama 36849, USA","institution_ids":["https://openalex.org/I17301866"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"127","last_page":"132"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10682","display_name":"Quantum Computing Algorithms and Architecture","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.7317613363265991},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6426184177398682},{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.5828611254692078},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5426000952720642},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47762173414230347},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4661359190940857},{"id":"https://openalex.org/keywords/bounding-overwatch","display_name":"Bounding overwatch","score":0.4533490538597107},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4160971939563751},{"id":"https://openalex.org/keywords/intersection","display_name":"Intersection (aeronautics)","score":0.41143161058425903},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.26086488366127014},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1144302487373352},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09750545024871826},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.08308342099189758}],"concepts":[{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.7317613363265991},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6426184177398682},{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.5828611254692078},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5426000952720642},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47762173414230347},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4661359190940857},{"id":"https://openalex.org/C63584917","wikidata":"https://www.wikidata.org/wiki/Q333286","display_name":"Bounding overwatch","level":2,"score":0.4533490538597107},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4160971939563751},{"id":"https://openalex.org/C64543145","wikidata":"https://www.wikidata.org/wiki/Q162942","display_name":"Intersection (aeronautics)","level":2,"score":0.41143161058425903},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.26086488366127014},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1144302487373352},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09750545024871826},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.08308342099189758},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2015.7315149","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2015.7315149","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1507039213","https://openalex.org/W1631356911","https://openalex.org/W1906914439","https://openalex.org/W2006290558","https://openalex.org/W2021492392","https://openalex.org/W2022549597","https://openalex.org/W2061496873","https://openalex.org/W2065341612","https://openalex.org/W2084652510","https://openalex.org/W2099640828","https://openalex.org/W2106865739","https://openalex.org/W2111994103","https://openalex.org/W2119241964","https://openalex.org/W2123535960","https://openalex.org/W2133925514","https://openalex.org/W2149107969","https://openalex.org/W2161273503","https://openalex.org/W2173124859","https://openalex.org/W2174706414","https://openalex.org/W2541980361","https://openalex.org/W2990961515","https://openalex.org/W3143944275","https://openalex.org/W3145128584","https://openalex.org/W4233542855","https://openalex.org/W4246219036"],"related_works":["https://openalex.org/W2144004661","https://openalex.org/W2001352955","https://openalex.org/W3109020709","https://openalex.org/W1588361197","https://openalex.org/W1968374692","https://openalex.org/W2151556234","https://openalex.org/W2044021627","https://openalex.org/W2074895070","https://openalex.org/W2240333541","https://openalex.org/W2116129521"],"abstract_inverted_index":{"It":[0],"is":[1,19,204,232],"colloquially":[2],"known":[3],"that":[4,117,148,167,180],"searching":[5],"for":[6,42,126,236],"test":[7,10,38,123,136,238,268],"vectors":[8,67,74,137,147,166,179,192],"to":[9,15,27,36,81,86,89,119,130,159,173,191,206,234],"the":[11,28,122,139,150,160,169,174,185,209,222,245,252],"last":[12],"few":[13,128],"hard":[14,88,129],"detect":[16,90,131],"stuck-at":[17,91,152],"faults":[18,44,92,132],"computationally":[20],"most":[21],"expensive":[22],"and":[23,58,101,176,196,198,227,230,256],"mathematically":[24],"NP-complete.":[25],"Due":[26],"complex":[29],"nature":[30],"of":[31,224,244,254,259],"this":[32,79],"problem,":[33],"attempts":[34,118],"made":[35],"successfully":[37],"a":[39,82,113,237,241,266],"digital":[40],"circuit":[41,56],"all":[43,135],"in":[45,55,138,142,193,221,240],"computational":[46],"linear":[47],"time":[48,125],"start":[49],"becoming":[50],"exponential":[51],"with":[52,75,265],"an":[53],"increase":[54],"size":[57],"complexity.":[59],"Various":[60],"algorithms":[61],"have":[62,94,250],"been":[63],"proposed":[64],"where":[65],"new":[66,114],"are":[68],"generated":[69],"by":[70,133,262],"using":[71],"previous":[72],"successful":[73,109],"similar":[76],"properties.":[77],"However,":[78],"leads":[80],"bottleneck":[83],"when":[84],"trying":[85],"find":[87],"which":[93],"only":[95],"one":[96],"or":[97],"two":[98],"unique":[99,115],"tests":[100],"their":[102],"properties":[103],"may":[104,155],"not":[105,156],"match":[106],"other":[107,213],"previously":[108],"tests.":[110],"We":[111,249],"propose":[112],"algorithm":[116,261],"vastly":[120],"improve":[121],"search":[124,190,235],"these":[127],"classifying":[134],"vector":[140,239,247],"space":[141],"three":[143],"categories:":[144],"Category":[145,164,177],"I":[146,195,226],"activate":[149,182],"desired":[151],"fault":[153,170],"but":[154],"propagate":[157,168,184],"it":[158,203,231,264],"primary":[161],"outputs":[162],"(POs),":[163],"II":[165,228],"site":[171],"value":[172],"POs,":[175],"III":[178,201],"neither":[181],"nor":[183],"fault.":[186],"By":[187],"bounding":[188],"our":[189,260],"categories":[194,225],"II,":[197],"avoiding":[199],"category":[200],"vectors,":[202,229],"easier":[205,233],"arrive":[207],"at":[208],"solution":[210,218],"faster":[211],"than":[212],"algorithmic":[214],"implementations.":[215],"The":[216],"final":[217],"itself":[219],"lies":[220],"intersection":[223],"smaller":[242],"subset":[243],"large":[246],"space.":[248],"demonstrated":[251],"proof":[253],"concept":[255],"detailed":[257],"working":[258],"comparing":[263],"random":[267],"generator.":[269]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}