{"id":"https://openalex.org/W1955718652","doi":"https://doi.org/10.1109/dft.2015.7315142","title":"Using value similarity of registers for soft error mitigation","display_name":"Using value similarity of registers for soft error mitigation","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W1955718652","doi":"https://doi.org/10.1109/dft.2015.7315142","mag":"1955718652"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2015.7315142","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2015.7315142","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019614322","display_name":"Abdulaziz Eker","orcid":null},"institutions":[{"id":"https://openalex.org/I13236232","display_name":"TOBB University of Economics and Technology","ror":"https://ror.org/03ewx7v96","country_code":"TR","type":"education","lineage":["https://openalex.org/I13236232"]}],"countries":["TR"],"is_corresponding":true,"raw_author_name":"Abdulaziz Eker","raw_affiliation_strings":["Dept. of Computer Engineering, TOBB University of Economics and Technology, Ankara, Turkey","Department of Computer Engineering , TOBB University of Economics and Technology, Ankara, Turkey#TAB#"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Engineering, TOBB University of Economics and Technology, Ankara, Turkey","institution_ids":["https://openalex.org/I13236232"]},{"raw_affiliation_string":"Department of Computer Engineering , TOBB University of Economics and Technology, Ankara, Turkey#TAB#","institution_ids":["https://openalex.org/I13236232"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052707216","display_name":"O\u011fuz Ergin","orcid":"https://orcid.org/0000-0003-2701-3787"},"institutions":[{"id":"https://openalex.org/I13236232","display_name":"TOBB University of Economics and Technology","ror":"https://ror.org/03ewx7v96","country_code":"TR","type":"education","lineage":["https://openalex.org/I13236232"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Oguz Ergin","raw_affiliation_strings":["Dept. of Computer Engineering, TOBB University of Economics and Technology, Ankara, Turkey","Department of Computer Engineering , TOBB University of Economics and Technology, Ankara, Turkey#TAB#"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Engineering, TOBB University of Economics and Technology, Ankara, Turkey","institution_ids":["https://openalex.org/I13236232"]},{"raw_affiliation_string":"Department of Computer Engineering , TOBB University of Economics and Technology, Ankara, Turkey#TAB#","institution_ids":["https://openalex.org/I13236232"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5019614322"],"corresponding_institution_ids":["https://openalex.org/I13236232"],"apc_list":null,"apc_paid":null,"fwci":0.3946,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.66161276,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"25","issue":null,"first_page":"91","last_page":"96"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/register-file","display_name":"Register file","score":0.8072335720062256},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7872020602226257},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7667157649993896},{"id":"https://openalex.org/keywords/hamming-code","display_name":"Hamming code","score":0.7041760087013245},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6317322850227356},{"id":"https://openalex.org/keywords/datapath","display_name":"Datapath","score":0.5945905447006226},{"id":"https://openalex.org/keywords/hamming-distance","display_name":"Hamming distance","score":0.5752962827682495},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.49883294105529785},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.37194788455963135},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.32058048248291016},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.14947864413261414},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.13215288519859314},{"id":"https://openalex.org/keywords/instruction-set","display_name":"Instruction set","score":0.12444743514060974},{"id":"https://openalex.org/keywords/block-code","display_name":"Block code","score":0.08765459060668945},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08203065395355225}],"concepts":[{"id":"https://openalex.org/C117280010","wikidata":"https://www.wikidata.org/wiki/Q180944","display_name":"Register file","level":3,"score":0.8072335720062256},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7872020602226257},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7667157649993896},{"id":"https://openalex.org/C73150493","wikidata":"https://www.wikidata.org/wiki/Q853922","display_name":"Hamming code","level":4,"score":0.7041760087013245},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6317322850227356},{"id":"https://openalex.org/C2781198647","wikidata":"https://www.wikidata.org/wiki/Q1633673","display_name":"Datapath","level":2,"score":0.5945905447006226},{"id":"https://openalex.org/C193319292","wikidata":"https://www.wikidata.org/wiki/Q272172","display_name":"Hamming distance","level":2,"score":0.5752962827682495},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.49883294105529785},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.37194788455963135},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.32058048248291016},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.14947864413261414},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.13215288519859314},{"id":"https://openalex.org/C202491316","wikidata":"https://www.wikidata.org/wiki/Q272683","display_name":"Instruction set","level":2,"score":0.12444743514060974},{"id":"https://openalex.org/C157125643","wikidata":"https://www.wikidata.org/wiki/Q884707","display_name":"Block code","level":3,"score":0.08765459060668945},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08203065395355225},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2015.7315142","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2015.7315142","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6800000071525574,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1522250664","https://openalex.org/W2005487922","https://openalex.org/W2031846229","https://openalex.org/W2037819198","https://openalex.org/W2043184000","https://openalex.org/W2071068906","https://openalex.org/W2094446102","https://openalex.org/W2096198922","https://openalex.org/W2105404019","https://openalex.org/W2120185818","https://openalex.org/W2120444887","https://openalex.org/W2138146350","https://openalex.org/W2148313391","https://openalex.org/W2159889776","https://openalex.org/W2167839483","https://openalex.org/W2168116639","https://openalex.org/W4236380341","https://openalex.org/W6631155369","https://openalex.org/W6668140606"],"related_works":["https://openalex.org/W2115178757","https://openalex.org/W2094874787","https://openalex.org/W3013048777","https://openalex.org/W2024145214","https://openalex.org/W2572792030","https://openalex.org/W2518357287","https://openalex.org/W1547739295","https://openalex.org/W2407896","https://openalex.org/W1990419382","https://openalex.org/W1955718652"],"abstract_inverted_index":{"Soft":[0],"errors":[1,183],"caused":[2],"by":[3,155],"the":[4,8,11,15,25,29,33,45,53,62,79,84,88,117,148,162,167,170,182],"cosmic":[5],"particles":[6],"or":[7],"radiation":[9],"from":[10,128],"packaging":[12],"material":[13],"of":[14,32,61,83,116,119,147,161,166,181,189],"integrated":[16],"circuits":[17],"are":[18,37],"an":[19,58,185],"increasingly":[20],"important":[21,59],"design":[22],"problem.":[23],"With":[24],"shrinking":[26],"feature":[27],"sizes,":[28],"datapath":[30],"components":[31],"out-of-order":[34],"superscalar":[35],"pipeline":[36],"becoming":[38],"more":[39],"prone":[40],"to":[41,71,98,141,176],"soft":[42,74,109],"errors.":[43,75],"Being":[44],"major":[46],"data":[47],"holding":[48],"component":[49],"in":[50],"contemporary":[51],"microprocessors,":[52],"register":[54,89,121,171],"file":[55,90],"has":[56],"been":[57],"part":[60],"processor":[63],"on":[64],"which":[65],"researchers":[66],"offered":[67],"many":[68,82,146],"different":[69],"schemes":[70,157],"protect":[72],"against":[73],"We":[76,131],"start":[77],"with":[78,138,184],"observation":[80],"that":[81,113,123,158],"stored":[85,149],"values":[86,122,168],"inside":[87,169],"have":[91,124],"very":[92],"small":[93],"Hamming":[94,126],"distances":[95],"when":[96],"compared":[97],"each":[99,129],"other.":[100,130],"After":[101],"showing":[102],"this":[103,133],"analysis":[104],"results":[105,152],"we":[106],"propose":[107],"a":[108],"error":[110,143],"correction":[111,144],"scheme":[112],"makes":[114],"use":[115,132,160],"presence":[118],"multiple":[120],"zero":[125],"distance":[127],"already":[134,163],"available":[135,164],"redundancy":[136],"along":[137],"parity":[139],"protection":[140],"achieve":[142],"for":[145],"values.":[150],"Our":[151],"show":[153],"that,":[154],"employing":[156],"make":[159],"copies":[165],"file,":[172],"it":[173],"is":[174],"possible":[175],"detect":[177],"and":[178],"correct":[179],"39.0%":[180],"additional":[186],"power":[187],"consumption":[188],"18.9%.":[190]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}