{"id":"https://openalex.org/W1957382615","doi":"https://doi.org/10.1109/dft.2015.7315131","title":"On enhancing the debug architecture of a system-on-chip (SoC) to detect software attacks","display_name":"On enhancing the debug architecture of a system-on-chip (SoC) to detect software attacks","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W1957382615","doi":"https://doi.org/10.1109/dft.2015.7315131","mag":"1957382615"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2015.7315131","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2015.7315131","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008478076","display_name":"Jerry Backer","orcid":null},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jerry Backer","raw_affiliation_strings":["Polytechnic School of Engineering, New York University, Brooklyn, NY","Polytechnic School of Engineering, New York University, Brooklyn, 11201, USA"],"affiliations":[{"raw_affiliation_string":"Polytechnic School of Engineering, New York University, Brooklyn, NY","institution_ids":["https://openalex.org/I57206974"]},{"raw_affiliation_string":"Polytechnic School of Engineering, New York University, Brooklyn, 11201, USA","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060495895","display_name":"David H\u00e9ly","orcid":"https://orcid.org/0000-0003-3249-7667"},"institutions":[{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"David Hely","raw_affiliation_strings":["LCIS, Universit\u00e9 Grenoble Alpes, Valence, France","Universit\u00e9 Grenoble Alpes, LCIS, F-26000 Valence, France"],"affiliations":[{"raw_affiliation_string":"LCIS, Universit\u00e9 Grenoble Alpes, Valence, France","institution_ids":["https://openalex.org/I899635006"]},{"raw_affiliation_string":"Universit\u00e9 Grenoble Alpes, LCIS, F-26000 Valence, France","institution_ids":["https://openalex.org/I899635006"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059648257","display_name":"Ramesh Karri","orcid":"https://orcid.org/0000-0001-7989-5617"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ramesh Karri","raw_affiliation_strings":["Polytechnic School of Engineering, New York University, Brooklyn, NY","Polytechnic School of Engineering, New York University, Brooklyn, 11201, USA"],"affiliations":[{"raw_affiliation_string":"Polytechnic School of Engineering, New York University, Brooklyn, NY","institution_ids":["https://openalex.org/I57206974"]},{"raw_affiliation_string":"Polytechnic School of Engineering, New York University, Brooklyn, 11201, USA","institution_ids":["https://openalex.org/I57206974"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5008478076"],"corresponding_institution_ids":["https://openalex.org/I57206974"],"apc_list":null,"apc_paid":null,"fwci":2.2001064,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.93426037,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"29","last_page":"34"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7541674971580505},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.722510576248169},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.694177508354187},{"id":"https://openalex.org/keywords/background-debug-mode-interface","display_name":"Background debug mode interface","score":0.638239860534668},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.4895842969417572},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.452677458524704},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.3774656057357788},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3347894549369812}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7541674971580505},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.722510576248169},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.694177508354187},{"id":"https://openalex.org/C124774103","wikidata":"https://www.wikidata.org/wiki/Q4839640","display_name":"Background debug mode interface","level":3,"score":0.638239860534668},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4895842969417572},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.452677458524704},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.3774656057357788},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3347894549369812}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dft.2015.7315131","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2015.7315131","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01398767v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01398767","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015 IEEE International Symposium on, IEEE, Oct 2015, Amherst, United States. ⟨10.1109/DFT.2015.7315131⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W70478248","https://openalex.org/W1498835653","https://openalex.org/W1686420892","https://openalex.org/W1896868715","https://openalex.org/W1999902052","https://openalex.org/W2025718175","https://openalex.org/W2036853599","https://openalex.org/W2052992577","https://openalex.org/W2067569648","https://openalex.org/W2088503757","https://openalex.org/W2089380275","https://openalex.org/W2121030089","https://openalex.org/W2128171167","https://openalex.org/W2134633067","https://openalex.org/W2136613319","https://openalex.org/W2138146350","https://openalex.org/W2153256720","https://openalex.org/W2169636698","https://openalex.org/W2170382128","https://openalex.org/W2484902940","https://openalex.org/W2518400702","https://openalex.org/W4232751114","https://openalex.org/W4239813889","https://openalex.org/W4246780762","https://openalex.org/W6602906054","https://openalex.org/W6726065836"],"related_works":["https://openalex.org/W2361273971","https://openalex.org/W2351581202","https://openalex.org/W2978026406","https://openalex.org/W2385068581","https://openalex.org/W2381166695","https://openalex.org/W4241045879","https://openalex.org/W2366346238","https://openalex.org/W2366922255","https://openalex.org/W2387706296","https://openalex.org/W2347893649"],"abstract_inverted_index":{"International":[0],"audience":[1]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}