{"id":"https://openalex.org/W2055949477","doi":"https://doi.org/10.1109/dft.2014.6962103","title":"Improved correction for hot pixels in digital imagers","display_name":"Improved correction for hot pixels in digital imagers","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2055949477","doi":"https://doi.org/10.1109/dft.2014.6962103","mag":"2055949477"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2014.6962103","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2014.6962103","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061097022","display_name":"Glenn H. Chapman","orcid":"https://orcid.org/0000-0002-2486-2954"},"institutions":[{"id":"https://openalex.org/I18014758","display_name":"Simon Fraser University","ror":"https://ror.org/0213rcc28","country_code":"CA","type":"education","lineage":["https://openalex.org/I18014758"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Glenn H. Chapman","raw_affiliation_strings":["School of Engineering Science, Simon Fraser University, Burnaby, B.C, Canada","School of Engineering Science, Simon Fraser University, Burnaby B.C., Canada, V5A 1S6"],"affiliations":[{"raw_affiliation_string":"School of Engineering Science, Simon Fraser University, Burnaby, B.C, Canada","institution_ids":["https://openalex.org/I18014758"]},{"raw_affiliation_string":"School of Engineering Science, Simon Fraser University, Burnaby B.C., Canada, V5A 1S6","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080720196","display_name":"Rohit Thomas","orcid":null},"institutions":[{"id":"https://openalex.org/I18014758","display_name":"Simon Fraser University","ror":"https://ror.org/0213rcc28","country_code":"CA","type":"education","lineage":["https://openalex.org/I18014758"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Rohit Thomas","raw_affiliation_strings":["School of Engineering Science, Simon Fraser University, Burnaby, B.C, Canada","School of Engineering Science, Simon Fraser University, Burnaby B.C., Canada, V5A 1S6"],"affiliations":[{"raw_affiliation_string":"School of Engineering Science, Simon Fraser University, Burnaby, B.C, Canada","institution_ids":["https://openalex.org/I18014758"]},{"raw_affiliation_string":"School of Engineering Science, Simon Fraser University, Burnaby B.C., Canada, V5A 1S6","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068982210","display_name":"Rahul Thomas","orcid":"https://orcid.org/0009-0004-4755-5174"},"institutions":[{"id":"https://openalex.org/I18014758","display_name":"Simon Fraser University","ror":"https://ror.org/0213rcc28","country_code":"CA","type":"education","lineage":["https://openalex.org/I18014758"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Rahul Thomas","raw_affiliation_strings":["School of Engineering Science, Simon Fraser University, Burnaby, B.C, Canada","School of Engineering Science, Simon Fraser University, Burnaby B.C., Canada, V5A 1S6"],"affiliations":[{"raw_affiliation_string":"School of Engineering Science, Simon Fraser University, Burnaby, B.C, Canada","institution_ids":["https://openalex.org/I18014758"]},{"raw_affiliation_string":"School of Engineering Science, Simon Fraser University, Burnaby B.C., Canada, V5A 1S6","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055210733","display_name":"Israel Koren","orcid":"https://orcid.org/0000-0003-2741-7108"},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Israel Koren","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA","Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA 01003"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA","institution_ids":["https://openalex.org/I24603500"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA 01003","institution_ids":["https://openalex.org/I24603500"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023125411","display_name":"Zahava Koren","orcid":null},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zahava Koren","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA","Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA 01003"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA","institution_ids":["https://openalex.org/I24603500"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA 01003","institution_ids":["https://openalex.org/I24603500"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5061097022"],"corresponding_institution_ids":["https://openalex.org/I18014758"],"apc_list":null,"apc_paid":null,"fwci":0.2093,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.59515649,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"3","issue":null,"first_page":"116","last_page":"121"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.9126365184783936},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6531279683113098},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6442233324050903},{"id":"https://openalex.org/keywords/digital-camera","display_name":"Digital camera","score":0.5547778606414795},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5366662740707397},{"id":"https://openalex.org/keywords/interpolation","display_name":"Interpolation (computer graphics)","score":0.5035144686698914},{"id":"https://openalex.org/keywords/digital-image","display_name":"Digital image","score":0.4124312400817871},{"id":"https://openalex.org/keywords/frame","display_name":"Frame (networking)","score":0.4104897081851959},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.25528693199157715},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.16782128810882568}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.9126365184783936},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6531279683113098},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6442233324050903},{"id":"https://openalex.org/C2779705975","wikidata":"https://www.wikidata.org/wiki/Q62927","display_name":"Digital camera","level":2,"score":0.5547778606414795},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5366662740707397},{"id":"https://openalex.org/C137800194","wikidata":"https://www.wikidata.org/wiki/Q11713455","display_name":"Interpolation (computer graphics)","level":3,"score":0.5035144686698914},{"id":"https://openalex.org/C42781572","wikidata":"https://www.wikidata.org/wiki/Q1250322","display_name":"Digital image","level":4,"score":0.4124312400817871},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.4104897081851959},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.25528693199157715},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.16782128810882568},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2014.6962103","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2014.6962103","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2026213743","https://openalex.org/W2027654975","https://openalex.org/W2031457674","https://openalex.org/W2110449873","https://openalex.org/W2110643826","https://openalex.org/W2113100884","https://openalex.org/W2122230135","https://openalex.org/W2124177559","https://openalex.org/W2158150403","https://openalex.org/W2543013901","https://openalex.org/W3142913228","https://openalex.org/W6656986232","https://openalex.org/W6657224702","https://openalex.org/W6677901311"],"related_works":["https://openalex.org/W1998512593","https://openalex.org/W2284814053","https://openalex.org/W4313427965","https://openalex.org/W2117577511","https://openalex.org/W3047317905","https://openalex.org/W2040648696","https://openalex.org/W2371345008","https://openalex.org/W1268453668","https://openalex.org/W2335586607","https://openalex.org/W2392923056"],"abstract_inverted_index":{"From":[0],"extensive":[1],"study":[2],"of":[3,42],"digital":[4,15],"imager":[5],"defects,":[6,17],"we":[7,33,61,104],"found":[8],"that":[9,19,106],"\u201cHot":[10],"Pixels\u201d":[11],"are":[12],"the":[13,29,35,43,86,92,107,114,118,122,134],"main":[14],"camera":[16,55,124],"and":[18,91,129,132],"they":[20],"increase":[21],"at":[22,97,121],"a":[23,39,49,54,69,77,98],"nearly":[24],"constant":[25],"temporal":[26],"rate":[27],"over":[28],"camera's":[30],"lifetime.":[31],"Previously":[32],"characterized":[34],"hot":[36,59,64,88,115],"pixels":[37],"by":[38],"linear":[40],"function":[41],"exposure":[44,130],"time":[45],"in":[46],"response":[47],"to":[48,68,82],"dark":[50],"frame":[51],"setting.":[52],"Using":[53,100],"with":[56],"55":[57],"known":[58],"pixels,":[60],"compared":[62],"our":[63],"pixel":[65,89,95,116],"correction":[66,108],"algorithm":[67],"conventional":[70],"4-nearest":[71],"neighbor":[72],"interpolation":[73],"techniques.":[74],"We":[75],"developed":[76],"new":[78],"\u201cmoving":[79],"camera\u201d":[80],"method":[81,109],"exactly":[83],"obtain":[84],"both":[85],"actual":[87],"contribution":[90],"true":[93],"undamaged":[94],"value":[96],"defect.":[99],"these":[101],"calibrated":[102],"results":[103],"find":[105],"should":[110],"be":[111],"based":[112],"on":[113,133],"severity,":[117],"illumination":[119],"intensity":[120],"pixel,":[123],"parameters":[125],"such":[126],"as":[127],"ISO":[128],"time,":[131],"neighboring":[135],"pixels'":[136],"variability.":[137]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}