{"id":"https://openalex.org/W2081340222","doi":"https://doi.org/10.1109/dft.2014.6962085","title":"GPGPUs ECC efficiency and efficacy","display_name":"GPGPUs ECC efficiency and efficacy","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2081340222","doi":"https://doi.org/10.1109/dft.2014.6962085","mag":"2081340222"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2014.6962085","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2014.6962085","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060947874","display_name":"Daniel Oliveira","orcid":"https://orcid.org/0000-0002-8752-3992"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Daniel A. G. Oliveira","raw_affiliation_strings":["Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, BR","Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, BR","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054264208","display_name":"Paolo Rech","orcid":"https://orcid.org/0000-0002-9597-1007"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Paolo Rech","raw_affiliation_strings":["Institute of Informatics \u2013 Federal University of Rio Grande do Sul \u2013 Porto Alegre, Brazil","Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Institute of Informatics \u2013 Federal University of Rio Grande do Sul \u2013 Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043334547","display_name":"La\u00e9rcio Lima Pilla","orcid":"https://orcid.org/0000-0003-0997-586X"},"institutions":[{"id":"https://openalex.org/I4104125","display_name":"Universidade Federal de Santa Catarina","ror":"https://ror.org/041akq887","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Laercio L. Pilla","raw_affiliation_strings":["Department of Informatics and Statistics-CTC-Federal, University of Santa Catarina-Florian\u00f3polis, Brazil","Department of Informatics and Statistics - CTC - Federal University of Santa Catarina - Florian\u00f3polis, Brazil"],"affiliations":[{"raw_affiliation_string":"Department of Informatics and Statistics-CTC-Federal, University of Santa Catarina-Florian\u00f3polis, Brazil","institution_ids":["https://openalex.org/I4104125"]},{"raw_affiliation_string":"Department of Informatics and Statistics - CTC - Federal University of Santa Catarina - Florian\u00f3polis, Brazil","institution_ids":["https://openalex.org/I4104125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091234084","display_name":"Philippe O. A. Navaux","orcid":"https://orcid.org/0000-0002-9957-5861"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Philippe O. A. Navaux","raw_affiliation_strings":["Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, BR","Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, BR","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062358729","display_name":"Luigi Carro","orcid":"https://orcid.org/0000-0002-7402-4780"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Luigi Carro","raw_affiliation_strings":["Institute of Informatics \u2013 Federal University of Rio Grande do Sul \u2013 Porto Alegre, Brazil","Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Institute of Informatics \u2013 Federal University of Rio Grande do Sul \u2013 Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Institute of Informatics, Federal University of Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5060947874"],"corresponding_institution_ids":["https://openalex.org/I130442723"],"apc_list":null,"apc_paid":null,"fwci":2.4137,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.9023276,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7916386723518372},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.7368656992912292},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.7016444206237793},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6621023416519165},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6437923908233643},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.5001943111419678},{"id":"https://openalex.org/keywords/general-purpose-computing-on-graphics-processing-units","display_name":"General-purpose computing on graphics processing units","score":0.46320000290870667},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40037429332733154},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.37238574028015137},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3112486004829407},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2375776469707489},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08280879259109497}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7916386723518372},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.7368656992912292},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.7016444206237793},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6621023416519165},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6437923908233643},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.5001943111419678},{"id":"https://openalex.org/C50630238","wikidata":"https://www.wikidata.org/wiki/Q971505","display_name":"General-purpose computing on graphics processing units","level":3,"score":0.46320000290870667},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40037429332733154},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.37238574028015137},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3112486004829407},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2375776469707489},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08280879259109497},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C21442007","wikidata":"https://www.wikidata.org/wiki/Q1027879","display_name":"Graphics","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dft.2014.6962085","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2014.6962085","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:purl.org/net/epubs:work/12302599","is_oa":false,"landing_page_url":"http://purl.org/net/epubs/work/12302599","pdf_url":null,"source":{"id":"https://openalex.org/S4306400334","display_name":"Science and Technology Facilities Council","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.8199999928474426}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W57243869","https://openalex.org/W1594335079","https://openalex.org/W1963880259","https://openalex.org/W1975194220","https://openalex.org/W2078994750","https://openalex.org/W2083613288","https://openalex.org/W2091067307","https://openalex.org/W2093962471","https://openalex.org/W2096492216","https://openalex.org/W2099971661","https://openalex.org/W2123424800","https://openalex.org/W2132540527","https://openalex.org/W2158612529","https://openalex.org/W2295862081","https://openalex.org/W4240741347","https://openalex.org/W4250981202","https://openalex.org/W4256566234"],"related_works":["https://openalex.org/W2505380084","https://openalex.org/W2086739451","https://openalex.org/W3183233360","https://openalex.org/W1906576859","https://openalex.org/W1862835629","https://openalex.org/W2099111379","https://openalex.org/W2136799148","https://openalex.org/W2897533804","https://openalex.org/W1980160788","https://openalex.org/W2890506991"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"we":[3],"assess":[4],"and":[5,9,30,41,46,87,95],"discuss":[6],"the":[7,12,34,55,59,75,78,84],"efficiency":[8],"overhead":[10],"of":[11,61],"Error-Correcting":[13],"Code":[14],"(ECC)":[15],"mechanism":[16],"available":[17],"on":[18],"modern":[19],"GPGPUs,":[20],"which":[21],"are":[22,44,89],"increasingly":[23],"used":[24],"for":[25],"both":[26],"High":[27],"Performance":[28],"Computing":[29],"safety-critical":[31],"applications.":[32],"Both":[33],"resilience":[35],"to":[36,70,91],"radiation-induced":[37],"silent":[38,62],"data":[39,63],"corruption":[40,64],"functional":[42,80],"interruption":[43,81],"experimentally":[45],"analytically":[47],"addressed.":[48],"The":[49],"provided":[50],"experimental":[51],"analysis":[52],"demonstrates":[53],"that":[54],"ECC":[56,76,85],"significantly":[57],"reduces":[58],"occurrence":[60],"but":[65],"may":[66],"not":[67],"be":[68],"sufficient":[69],"guarantee":[71],"high":[72],"reliability.":[73],"Moreover,":[74],"increases":[77],"GPGPU":[79],"rate.":[82],"Finally,":[83],"performances":[86],"reliability":[88],"compared":[90],"Algorithm-Based":[92],"Fault":[93],"Tolerance":[94],"Duplication":[96],"With":[97],"Comparison":[98],"strategies.":[99]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}