{"id":"https://openalex.org/W2075188672","doi":"https://doi.org/10.1109/dft.2014.6962074","title":"A probabilistic analysis of resilient reconfigurable designs","display_name":"A probabilistic analysis of resilient reconfigurable designs","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2075188672","doi":"https://doi.org/10.1109/dft.2014.6962074","mag":"2075188672"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2014.6962074","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2014.6962074","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026569099","display_name":"Alirad Malek","orcid":null},"institutions":[{"id":"https://openalex.org/I66862912","display_name":"Chalmers University of Technology","ror":"https://ror.org/040wg7k59","country_code":"SE","type":"education","lineage":["https://openalex.org/I66862912"]}],"countries":["SE"],"is_corresponding":true,"raw_author_name":"A. Malek","raw_affiliation_strings":["Computer Science and Engineering Department, Chalmers University of Technology, Sweden","[Computer Science and Engineering dept., Chalmers University of Technology, Sweden]"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering Department, Chalmers University of Technology, Sweden","institution_ids":["https://openalex.org/I66862912"]},{"raw_affiliation_string":"[Computer Science and Engineering dept., Chalmers University of Technology, Sweden]","institution_ids":["https://openalex.org/I66862912"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027883998","display_name":"Stavros Tzilis","orcid":null},"institutions":[{"id":"https://openalex.org/I66862912","display_name":"Chalmers University of Technology","ror":"https://ror.org/040wg7k59","country_code":"SE","type":"education","lineage":["https://openalex.org/I66862912"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"S. Tzilis","raw_affiliation_strings":["Computer Science and Engineering Department, Chalmers University of Technology, Sweden","[Computer Science and Engineering dept., Chalmers University of Technology, Sweden]"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering Department, Chalmers University of Technology, Sweden","institution_ids":["https://openalex.org/I66862912"]},{"raw_affiliation_string":"[Computer Science and Engineering dept., Chalmers University of Technology, Sweden]","institution_ids":["https://openalex.org/I66862912"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013703406","display_name":"Danish Anis Khan","orcid":null},"institutions":[{"id":"https://openalex.org/I66862912","display_name":"Chalmers University of Technology","ror":"https://ror.org/040wg7k59","country_code":"SE","type":"education","lineage":["https://openalex.org/I66862912"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"D. A. Khan","raw_affiliation_strings":["Computer Science and Engineering Department, Chalmers University of Technology, Sweden","[Computer Science and Engineering dept., Chalmers University of Technology, Sweden]"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering Department, Chalmers University of Technology, Sweden","institution_ids":["https://openalex.org/I66862912"]},{"raw_affiliation_string":"[Computer Science and Engineering dept., Chalmers University of Technology, Sweden]","institution_ids":["https://openalex.org/I66862912"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087174287","display_name":"Ioannis Sourdis","orcid":"https://orcid.org/0000-0002-0452-3664"},"institutions":[{"id":"https://openalex.org/I66862912","display_name":"Chalmers University of Technology","ror":"https://ror.org/040wg7k59","country_code":"SE","type":"education","lineage":["https://openalex.org/I66862912"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"I. Sourdis","raw_affiliation_strings":["Computer Science and Engineering Department, Chalmers University of Technology, Sweden","[Computer Science and Engineering dept., Chalmers University of Technology, Sweden]"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering Department, Chalmers University of Technology, Sweden","institution_ids":["https://openalex.org/I66862912"]},{"raw_affiliation_string":"[Computer Science and Engineering dept., Chalmers University of Technology, Sweden]","institution_ids":["https://openalex.org/I66862912"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030588527","display_name":"Georgios Smaragdos","orcid":"https://orcid.org/0000-0001-7969-9827"},"institutions":[{"id":"https://openalex.org/I2801952686","display_name":"Erasmus MC","ror":"https://ror.org/018906e22","country_code":"NL","type":"funder","lineage":["https://openalex.org/I2801952686"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"G. Smaragdos","raw_affiliation_strings":["Neuroscience Department, Erasmus Medical Center, The Netherlands","Neuroscience dept., Erasmus Medical Center, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Neuroscience Department, Erasmus Medical Center, The Netherlands","institution_ids":["https://openalex.org/I2801952686"]},{"raw_affiliation_string":"Neuroscience dept., Erasmus Medical Center, The Netherlands","institution_ids":["https://openalex.org/I2801952686"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077785373","display_name":"Christos Strydis","orcid":"https://orcid.org/0000-0002-0935-9322"},"institutions":[{"id":"https://openalex.org/I2801952686","display_name":"Erasmus MC","ror":"https://ror.org/018906e22","country_code":"NL","type":"funder","lineage":["https://openalex.org/I2801952686"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"C. Strydis","raw_affiliation_strings":["Neuroscience Department, Erasmus Medical Center, The Netherlands","Neuroscience dept., Erasmus Medical Center, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Neuroscience Department, Erasmus Medical Center, The Netherlands","institution_ids":["https://openalex.org/I2801952686"]},{"raw_affiliation_string":"Neuroscience dept., Erasmus Medical Center, The Netherlands","institution_ids":["https://openalex.org/I2801952686"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5026569099"],"corresponding_institution_ids":["https://openalex.org/I66862912"],"apc_list":null,"apc_paid":null,"fwci":0.6372,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.74375105,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"141","last_page":"146"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reconfigurability","display_name":"Reconfigurability","score":0.9509010314941406},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8114402890205383},{"id":"https://openalex.org/keywords/granularity","display_name":"Granularity","score":0.7932672500610352},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.6768418550491333},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6077781915664673},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5974975824356079},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.49886655807495117},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.45331621170043945},{"id":"https://openalex.org/keywords/reconfigurable-computing","display_name":"Reconfigurable computing","score":0.45181185007095337},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.4127129912376404},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39358100295066833},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.32058221101760864},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.29432570934295654},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18182051181793213},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.0759231448173523}],"concepts":[{"id":"https://openalex.org/C2780149590","wikidata":"https://www.wikidata.org/wiki/Q7302742","display_name":"Reconfigurability","level":2,"score":0.9509010314941406},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8114402890205383},{"id":"https://openalex.org/C177774035","wikidata":"https://www.wikidata.org/wiki/Q1246948","display_name":"Granularity","level":2,"score":0.7932672500610352},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.6768418550491333},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6077781915664673},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5974975824356079},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.49886655807495117},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.45331621170043945},{"id":"https://openalex.org/C142962650","wikidata":"https://www.wikidata.org/wiki/Q240838","display_name":"Reconfigurable computing","level":3,"score":0.45181185007095337},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4127129912376404},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39358100295066833},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.32058221101760864},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.29432570934295654},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18182051181793213},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0759231448173523},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/dft.2014.6962074","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2014.6962074","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:eur:oai:pure.eur.nl:publications/a21ef0b3-f9e4-4ad6-bcc7-7042bd463cd8","is_oa":false,"landing_page_url":"https://pure.eur.nl/en/publications/a21ef0b3-f9e4-4ad6-bcc7-7042bd463cd8","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 141 - 146","raw_type":"info:eu-repo/semantics/conferencepaper"},{"id":"pmh:oai:publications.lib.chalmers.se:208107","is_oa":false,"landing_page_url":"http://publications.lib.chalmers.se/publication/208107-a-probabilistic-analysis-of-resilient-reconfigurable-designs","pdf_url":null,"source":{"id":"https://openalex.org/S4377196470","display_name":"Chalmers Publication Library (Chalmers University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66862912","host_organization_name":"Chalmers University of Technology","host_organization_lineage":["https://openalex.org/I66862912"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text.Article.Conference.PeerReviewed"},{"id":"pmh:oai:research.chalmers.se:208107","is_oa":false,"landing_page_url":"https://research.chalmers.se/en/publication/208107","pdf_url":null,"source":{"id":"https://openalex.org/S4306402469","display_name":"Chalmers Research (Chalmers University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66862912","host_organization_name":"Chalmers University of Technology","host_organization_lineage":["https://openalex.org/I66862912"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1579215414","https://openalex.org/W1757537413","https://openalex.org/W1970296212","https://openalex.org/W1973551931","https://openalex.org/W1991406672","https://openalex.org/W1996937823","https://openalex.org/W2048775552","https://openalex.org/W2060321942","https://openalex.org/W2065439108","https://openalex.org/W2098695358","https://openalex.org/W2099708835","https://openalex.org/W2099828501","https://openalex.org/W2110834192","https://openalex.org/W2113957173","https://openalex.org/W2125169487","https://openalex.org/W2144382742","https://openalex.org/W2155581886","https://openalex.org/W2159869022","https://openalex.org/W2164128976"],"related_works":["https://openalex.org/W2986699608","https://openalex.org/W2016305817","https://openalex.org/W2077520673","https://openalex.org/W2396658032","https://openalex.org/W3103981520","https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W2102525122","https://openalex.org/W4245282135","https://openalex.org/W4306316843"],"abstract_inverted_index":{"Reconfigurable":[0],"hardware":[1],"can":[2,14,56],"be":[3,15,57],"employed":[4],"to":[5,27,64,98,124],"tolerate":[6],"permanent":[7,127],"faults.":[8],"Hardware":[9],"components":[10,54],"comprising":[11],"a":[12,18,38,66,94,108,118],"System-on-Chip":[13],"partitioned":[16],"into":[17],"handful":[19],"of":[20,32,41,52,69,75,81,107],"substitutable":[21],"units":[22],"interconnected":[23],"with":[24,85,117],"reconfigurable":[25,42,83],"wires":[26],"allow":[28],"isolation":[29],"and":[30,132,151,158],"replacement":[31],"faulty":[33],"parts.":[34],"This":[35],"paper":[36],"offers":[37],"probabilistic":[39],"analysis":[40],"designs":[43,84],"estimating":[44],"for":[45],"different":[46,86],"fault":[47,147,160],"densities":[48],"the":[49,62,72,79,100,105],"average":[50],"number":[51],"fault-free":[53],"that":[55,103,113],"constructed":[58],"as":[59,61],"well":[60],"probability":[63],"guarantee":[65],"particular":[67],"availability":[68,155],"components.":[70],"Considering":[71],"area":[73],"overheads":[74],"reconfigurability,":[76],"we":[77,92],"evaluate":[78],"resilience":[80],"various":[82],"granularities.":[87],"Based":[88],"on":[89],"this":[90],"analysis,":[91],"conduct":[93],"comprehensive":[95],"design-space":[96],"exploration":[97],"identify":[99],"granularity":[101],"mixes":[102],"maximize":[104,154],"fault-tolerance":[106],"system.":[109],"Our":[110],"findings":[111],"reveal":[112],"mixing":[114],"fine-grain":[115],"logic":[116],"coarse-grain":[119,139,150],"sparing":[120],"approach":[121],"tolerates":[122],"up":[123],"3\u00d7":[125],"more":[126,134],"faults":[128],"than":[129,135],"component":[130],"redundancy":[131,142],"2\u00d7":[133],"any":[136],"other":[137],"purely":[138],"solution.":[140],"Component":[141],"is":[143],"preferable":[144],"at":[145,156],"low":[146],"densities,":[148,161],"while":[149],"mixed-grain":[152],"reconfigurability":[153],"medium":[157],"high":[159],"respectively.":[162]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}