{"id":"https://openalex.org/W2063306578","doi":"https://doi.org/10.1109/dft.2014.6962065","title":"Exploiting dynamic partial reconfiguration for on-line on-demand testing of permanent faults in reconfigurable systems","display_name":"Exploiting dynamic partial reconfiguration for on-line on-demand testing of permanent faults in reconfigurable systems","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2063306578","doi":"https://doi.org/10.1109/dft.2014.6962065","mag":"2063306578"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2014.6962065","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2014.6962065","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085564733","display_name":"Domenico G. Sorrenti","orcid":"https://orcid.org/0000-0002-4734-7330"},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Domenico Sorrenti","raw_affiliation_strings":["Department of Information Engineering, University of Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004516434","display_name":"Dario Cozzi","orcid":null},"institutions":[{"id":"https://openalex.org/I20121455","display_name":"Bielefeld University","ror":"https://ror.org/02hpadn98","country_code":"DE","type":"education","lineage":["https://openalex.org/I20121455"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dario Cozzi","raw_affiliation_strings":["Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany"],"affiliations":[{"raw_affiliation_string":"Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany","institution_ids":["https://openalex.org/I20121455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078563943","display_name":"Sebastian Korf","orcid":null},"institutions":[{"id":"https://openalex.org/I20121455","display_name":"Bielefeld University","ror":"https://ror.org/02hpadn98","country_code":"DE","type":"education","lineage":["https://openalex.org/I20121455"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sebastian Korf","raw_affiliation_strings":["Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany"],"affiliations":[{"raw_affiliation_string":"Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany","institution_ids":["https://openalex.org/I20121455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007108808","display_name":"Luca Cassano","orcid":"https://orcid.org/0000-0003-3824-7714"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]},{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Cassano","raw_affiliation_strings":["Department of Information Engineering, University of Pisa, Italy","Dipartimento di Elettronica, Politecnico di Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019600837","display_name":"Jens Hagemeyer","orcid":"https://orcid.org/0009-0005-9943-8081"},"institutions":[{"id":"https://openalex.org/I20121455","display_name":"Bielefeld University","ror":"https://ror.org/02hpadn98","country_code":"DE","type":"education","lineage":["https://openalex.org/I20121455"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jens Hagemeyer","raw_affiliation_strings":["Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany"],"affiliations":[{"raw_affiliation_string":"Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany","institution_ids":["https://openalex.org/I20121455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028498307","display_name":"Mario Porrmann","orcid":"https://orcid.org/0000-0003-1005-5753"},"institutions":[{"id":"https://openalex.org/I20121455","display_name":"Bielefeld University","ror":"https://ror.org/02hpadn98","country_code":"DE","type":"education","lineage":["https://openalex.org/I20121455"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mario Porrmann","raw_affiliation_strings":["Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany"],"affiliations":[{"raw_affiliation_string":"Center of Excellence Cognitive Interaction Technology, Bielefeld University, Germany","institution_ids":["https://openalex.org/I20121455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065265267","display_name":"Cinzia Bernardeschi","orcid":"https://orcid.org/0000-0003-1604-4465"},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Cinzia Bernardeschi","raw_affiliation_strings":["Department of Information Engineering, University of Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5085564733"],"corresponding_institution_ids":["https://openalex.org/I108290504"],"apc_list":null,"apc_paid":null,"fwci":0.6372,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.74144149,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"53","issue":null,"first_page":"203","last_page":"208"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.878201961517334},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7859635353088379},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.6991178393363953},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6678334474563599},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.635866105556488},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6069769859313965},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5924333333969116},{"id":"https://openalex.org/keywords/reconfigurable-computing","display_name":"Reconfigurable computing","score":0.5056700706481934},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.48124954104423523},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4577343761920929},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.45008838176727295},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3808106780052185},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3150288760662079},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.20062175393104553},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13151538372039795}],"concepts":[{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.878201961517334},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7859635353088379},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.6991178393363953},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6678334474563599},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.635866105556488},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6069769859313965},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5924333333969116},{"id":"https://openalex.org/C142962650","wikidata":"https://www.wikidata.org/wiki/Q240838","display_name":"Reconfigurable computing","level":3,"score":0.5056700706481934},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.48124954104423523},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4577343761920929},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.45008838176727295},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3808106780052185},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3150288760662079},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.20062175393104553},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13151538372039795},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/dft.2014.6962065","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2014.6962065","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},{"id":"pmh:oai:pub.librecat.org:2698999","is_oa":false,"landing_page_url":"https://pub.uni-bielefeld.de/record/2698999","pdf_url":null,"source":{"id":"https://openalex.org/S4306401671","display_name":"PUB \u2013 Publications at Bielefeld University (Bielefeld University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I20121455","host_organization_name":"Bielefeld University","host_organization_lineage":["https://openalex.org/I20121455"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sorrenti D, Cozzi D, Korf S, et al. Exploiting Dynamic Partial Reconfiguration for On-Line On-Demand Testing of Permanent Faults in Reconfigurable Systems. Presented at the 17th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Amsterdam, The Netherlands.","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:re.public.polimi.it:11311/1043204","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/1043204","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.4399999976158142,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1544788538","https://openalex.org/W1889269054","https://openalex.org/W2062487815","https://openalex.org/W2073513347","https://openalex.org/W2079526935","https://openalex.org/W2084741576","https://openalex.org/W2085698784","https://openalex.org/W2085733052","https://openalex.org/W2099329957","https://openalex.org/W2099569658","https://openalex.org/W2112630077","https://openalex.org/W2140584589","https://openalex.org/W2143912286","https://openalex.org/W2152577665","https://openalex.org/W2154999116","https://openalex.org/W2158724905","https://openalex.org/W2163865290","https://openalex.org/W2274357560","https://openalex.org/W2474556993","https://openalex.org/W3149410719","https://openalex.org/W4255763336","https://openalex.org/W6683477341","https://openalex.org/W6684360715","https://openalex.org/W6694255898","https://openalex.org/W6721001011"],"related_works":["https://openalex.org/W2810427553","https://openalex.org/W2135053878","https://openalex.org/W2941434274","https://openalex.org/W4249632163","https://openalex.org/W1760305469","https://openalex.org/W2797161794","https://openalex.org/W2073075351","https://openalex.org/W2340647897","https://openalex.org/W2808484818","https://openalex.org/W1574948540"],"abstract_inverted_index":{"Reconfigurable":[0],"systems":[1],"are":[2,56,76],"increasingly":[3],"employed":[4,57],"in":[5,48,58,126],"many":[6],"application":[7],"fields,":[8],"including":[9],"aerospace.":[10],"The":[11,61,100],"long":[12],"term":[13],"exposure":[14],"to":[15,27,65,81,97],"radiation":[16],"of":[17,30,45,52,72,92],"space":[18],"electronics":[19],"can":[20,132],"cause":[21],"permanent":[22,46],"faults,":[23],"that":[24,55,122],"may":[25],"lead":[26],"the":[28,31,49,70,73,79,93,107,124,127],"failure":[29],"mission.":[32],"In":[33],"this":[34],"paper":[35],"we":[36],"present":[37],"a":[38,89,115],"novel":[39],"technique":[40,102],"for":[41],"on-line":[42],"on-demand":[43],"testing":[44,67],"faults":[47,125],"routing":[50,128],"structure":[51],"SRAM-based":[53],"FPGAs,":[54],"reconfigurable":[59,94,117],"systems.":[60],"basic":[62],"idea":[63],"is":[64],"place":[66],"circuits":[68],"on":[69,114],"resources":[71,87,129],"FPGA":[74],"which":[75],"unused":[77],"at":[78],"moment":[80],"test":[82,131],"them":[83],"before":[84],"using":[85],"those":[86],"when":[88],"functional":[90],"module":[91],"system":[95],"has":[96,103,111],"be":[98,133],"placed.":[99],"proposed":[101],"been":[104,112],"implemented":[105],"and":[106],"achieved":[108],"fault":[109],"coverage":[110],"assessed":[113],"real-world":[116],"system.":[118],"This":[119],"experiment":[120],"demonstrated":[121],"all":[123],"under":[130],"detected.":[134]},"counts_by_year":[{"year":2016,"cited_by_count":3}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}